Features
- Power Supply 1.8 V for core (VDD), 1.4 V to VDD for I/O (VDDQ)
- Clock Fast clock cycle time for high bandwidth Two input clocks (K and /K) for precise DDR timing at clock rising edges only Two input clocks for output data (C and /C) to minimize clock skew and flight time mismatches Two output echo clocks (CQ and /CQ) simplify data capture in high-speed systems Clock-stop capability with μs restart
- I/O Separate independent read and write data ports with concurrent transactions 100% bus utilization DDR read and write operation HSTL I/O User programmable output impedance PLL circuitry for wide output data valid window and future frequency scaling
- Function Four-tick burst for reduced address frequency Internally self-timed write control Simple control logic for easy depth expansion JTAG 1149.1 compatible test access port
- Package 165 FBGA package (13 x 15 x 1.4 mm)
Description
The RMQS3A3636DGBA is a 1, 048, 576-word by 36-bit and the RMQS3A3618DGBA is a 2, 097, 152-word by 18-bit synchronous quad data rate static RAM fabricated with advanced CMOS technology using full CMOS six-transistor memory cell. It integrates unique synchronous peripheral circuitry and a burst counter. All input registers are controlled by an input clock pair (K and /K) and are latched on the positive edge of K and /K. These products are suitable for applications which require synchronous operation, High-Speed, low voltage, high density and wide bit configuration. These products are packaged in 165-pin plastic FBGA package.
| Part Number | Status | Samples | Stock | RoHS | Package | Carrier Type | Moisture Sensitivity Level (MSL) |
|---|---|---|---|---|---|---|---|
| RMQS3A3618DGBA-302#AC0 | Obsolete | N/A | Out of Stock | RoHS:EN RoHS:JA | LBGA | Tray | 3 |
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- Application NoteThis application note describes parameter tuning methods using QE for Capacitive Touch for microcontrollers that incorporate a Capacitive Touch Sensing Unit (CTSU). In addition to the default auto-tuning process, it provides an overview of the Advanced mode and adjustable CTSU parameters for optimizing touch performance.
- Application NoteAI-generated Summary: Capacitive touch sensors measure capacitance changes caused by finger contact using a sensor drive pulse and current measurement. Ripple noise from the power supply or peripheral circuits distorts these measurements by adding noise currents, causing inaccurate touch detection. To ensure high accuracy and reliability, power supply design must minimize ripple noise. The document explains measurement principles, ripple noise effects, and countermeasures including power supply circuit selection, switching circuits, board layout, and touch parameter tuning. It covers RX, RL78, and RA family MCUs embedding CTSU1 and CTSU2 types of capacitive touch sensing units.
- Model - IBIS
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- Product Change Notice
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- Application NoteThis application note describes parameter tuning methods using QE for Capacitive Touch for microcontrollers that incorporate a Capacitive Touch Sensing Unit (CTSU). In addition to the default auto-tuning process, it provides an overview of the Advanced mode and adjustable CTSU parameters for optimizing touch performance.
- Application NoteAI-generated Summary: Capacitive touch sensors measure capacitance changes caused by finger contact using a sensor drive pulse and current measurement. Ripple noise from the power supply or peripheral circuits distorts these measurements by adding noise currents, causing inaccurate touch detection. To ensure high accuracy and reliability, power supply design must minimize ripple noise. The document explains measurement principles, ripple noise effects, and countermeasures including power supply circuit selection, switching circuits, board layout, and touch parameter tuning. It covers RX, RL78, and RA family MCUs embedding CTSU1 and CTSU2 types of capacitive touch sensing units.
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- Product Change Notice
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Product Notices (PCN, EOL, etc) (4)
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