Features
- This Circuit is Processed in Accordance to MIL-STD- 883 and is Fully Conformant Under the Provisions of Paragraph 1.2.1.
- High Slew Rate 7V/µs (Min)
- Unity Gain Bandwidth 5MHz (Min)
- Low Noise Voltage (at 1kHz) 4.5nV/√Hz (Max)
- Low Offset Voltage 100µV (Max)
- Low Offset DriftWith Temperature 1.8µV/oC (Max)
- High CMRR 100dB (Min)
- High Voltage Gain 700kV/V (Min)
Description
Support is limited to customers who have already adopted these products.
The HA-5127/883 monolithic operational amplifier features an excellent combination of precision DC and wideband high speed characteristics. Utilizing the Intersil D. I. technology and advanced processing techniques, this unique design unites low noise precision instrumentation performance with high speed, wideband capability. This amplifier's impressive list of features include low VOS, wide gain-bandwidth, high open loop gain, and high CMRR. Additionally, this flexible device operates over a wide supply range while consuming only 120mW of power. Using the HA-5127/883 allows designers to minimize errors while maximizing speed and bandwidth. This device is ideally suited for low level transducer signal amplifier circuits. Other applications which can utilize the HA-5127/883's qualities include instrumentation amplifiers, pulse or RF amplifiers, audio preamplifiers, and signal conditioning circuits.
Applications
- High Speed Signal Conditioners
- Wide Bandwidth Instrumentation Amplifiers
- Low Level Transducer Amplifiers
- Fast, Low Level Voltage Comparators
- Highest Quality Audio Preamplifiers
- Pulse/RF Amplifiers
| Part Number | Status | Samples | Stock | Package | Lead Count (#) | Carrier Type | Moisture Sensitivity Level (MSL) | Pb (Lead) Free | Pb Free Category | MOQ | Temp. Range (°C) | CAGE code |
|---|---|---|---|---|---|---|---|---|---|---|---|---|
| HA2-5127/883 | Obsolete | N/A | Out of Stock | CAN | 8# | Tray | Not Applicable | Exempt | Gold Plate-e4 | 70 | -55 to +125°C | 34371 |
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- Application NotePDF 263 KB r13an0003eu0100-biasing-op-amps Dec 06, 2019AI-generated Summary: Proper biasing of operational amplifiers is essential to avoid malfunction in AC-coupled circuits. A missing DC bias path causes long stabilization times and potential failures. Adding input resistors to ground provides a DC path for bias currents, minimizing offset errors. For single-supply AC-coupled amplifiers, biasing uses a reference voltage, ideally from a high-PSRR voltage reference or buffered voltage divider, to maintain signal symmetry and reduce noise. Understanding frequency responses of input and feedback components is crucial for setting bandwidth and gain characteristics.
- End Of Life NoticePDF 200 KB PLC15033 Jun 11, 2015
- Product AdvisoryPDF 499 KB PA11003 Jan 05, 2011
- Product AdvisoryPDF 67 KB PA10098 Oct 21, 2010
- Application NotePDF 357 KB an1694 Jan 19, 2004AI-generated Summary: The document outlines the four fundamental internal blocks of an operational amplifier and presents a simple 2:1 stage circuit diagram. It includes important legal notices from Renesas Electronics regarding the use, liability, and intellectual property rights of their semiconductor products. The document clarifies product quality grades, intended applications, and restrictions on use in life-critical or hazardous systems. It emphasizes compliance with applicable laws and safety responsibilities when using Renesas products. Contact information for Renesas sales offices worldwide is also provided.
- Application NotePDF 224 KB an9654 May 05, 1999AI-generated Summary: The document explains the reliability and failure mechanisms of semiconductor parts, focusing on life testing and wearout. It discusses how switching states cause transient current pulses and hot carrier injection, which only occur briefly during switching. Life testing at elevated temperatures accelerates aging to remove infant mortality failures, improving reliability. The failure rate follows a bathtub curve with infant mortality, useful life, and wearout phases, modeled by lognormal and exponential distributions. The Arrhenius equation relates failure rates at different temperatures. Burn-in and life tests reduce early failures without harming intrinsic reliability.
- Application NotePDF 564 KB an553 Aug 12, 1998AI-generated Summary: The document details the noise characteristics and offset voltage nulling of ultra low noise amplifiers HA-5127, HA-5137, and HA-5147. It explains methods to boost output current and reduce DC bias errors using specific circuit configurations. Noise prediction formulas consider amplifier noise voltage, current noise, and thermal noise from feedback resistors. Low resistor values and bandwidth limiting improve noise performance. Graphs illustrate noise behavior across frequency ranges, emphasizing the importance of resistor choice and filtering for optimal low noise design.
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Datasheets (1)
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- Application NotePDF 263 KB r13an0003eu0100-biasing-op-amps Dec 06, 2019AI-generated Summary: Proper biasing of operational amplifiers is essential to avoid malfunction in AC-coupled circuits. A missing DC bias path causes long stabilization times and potential failures. Adding input resistors to ground provides a DC path for bias currents, minimizing offset errors. For single-supply AC-coupled amplifiers, biasing uses a reference voltage, ideally from a high-PSRR voltage reference or buffered voltage divider, to maintain signal symmetry and reduce noise. Understanding frequency responses of input and feedback components is crucial for setting bandwidth and gain characteristics.
- Application NotePDF 357 KB an1694 Jan 19, 2004AI-generated Summary: The document outlines the four fundamental internal blocks of an operational amplifier and presents a simple 2:1 stage circuit diagram. It includes important legal notices from Renesas Electronics regarding the use, liability, and intellectual property rights of their semiconductor products. The document clarifies product quality grades, intended applications, and restrictions on use in life-critical or hazardous systems. It emphasizes compliance with applicable laws and safety responsibilities when using Renesas products. Contact information for Renesas sales offices worldwide is also provided.
- Application NotePDF 224 KB an9654 May 05, 1999AI-generated Summary: The document explains the reliability and failure mechanisms of semiconductor parts, focusing on life testing and wearout. It discusses how switching states cause transient current pulses and hot carrier injection, which only occur briefly during switching. Life testing at elevated temperatures accelerates aging to remove infant mortality failures, improving reliability. The failure rate follows a bathtub curve with infant mortality, useful life, and wearout phases, modeled by lognormal and exponential distributions. The Arrhenius equation relates failure rates at different temperatures. Burn-in and life tests reduce early failures without harming intrinsic reliability.
- Application NotePDF 564 KB an553 Aug 12, 1998AI-generated Summary: The document details the noise characteristics and offset voltage nulling of ultra low noise amplifiers HA-5127, HA-5137, and HA-5147. It explains methods to boost output current and reduce DC bias errors using specific circuit configurations. Noise prediction formulas consider amplifier noise voltage, current noise, and thermal noise from feedback resistors. Low resistor values and bandwidth limiting improve noise performance. Graphs illustrate noise behavior across frequency ranges, emphasizing the importance of resistor choice and filtering for optimal low noise design.
Application Notes & White Papers (4)
- End Of Life NoticePDF 200 KB PLC15033 Jun 11, 2015
- Product AdvisoryPDF 499 KB PA11003 Jan 05, 2011
- Product AdvisoryPDF 67 KB PA10098 Oct 21, 2010
Product Notices (PCN, EOL, etc) (4)
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