Features
- This Circuit is Processed in Accordance to MIL-STD-883 and is Fully Conformant Under the Provisions of Paragraph 1. 2. 1.
- HD-4702/883 Provides 13 Commonly Used Bit Rates
- Uses a 2.4576MHz Crystal/Input for Standard Frequency Output (16 Times Bit Rate)
- Low Power Dissipation
- Conforms to ElA RS-404
- One HD-4702/883 Controls up to Eight Transmission Channels
- Initialization Circuit Facilitates Diagnostic Fault Isolation
- On-Chip Input Pull-Up Circuit
Description
Support is limited to customers who have already adopted these products.
The HD-4702/883 Bit Rate Generator provides the necessary clock signals for digital data transmission systems, such as a UART. It generates 13 commonly used bit rates using an on-chip crystal oscillator or an external input. For conventional operation generating 16 output clock pulses per bit period, the input clock frequency must be 2. 4576MHz (i. e. , 9600 Baud x 16 x 16, since there is an internal ÷ 16 prescaler). A lower input frequency will result in a proportionally lower output frequency. The HD-4702/883 can provide multi-channel operation with a minimum of external logic by having the clock frequency CO and the ÷ 8 prescaler outputs Q0, Q1, Q2 available externally. All signals have a 50% duty cycle except 1800 Baud, which has less than 0. 39% distortion. The four rate select inputs (S0-S3) select which bit rate is at the output (Z). See Truth Table for Rate Select Inputs for select code and output bit rate. Two of the 16 select codes for the HD-4702/883 do not select an internally generated frequency, but select an input into which the user can feed either a different frequency, or a static level (High or Low) to generate ZERO BAUD. The bit rates most commonly used in modern data terminals (110, 150, 300, 1200, 2400 Baud) require that no more than one input be grounded for the HD-4702/883, which is easily achieved with a single 5-position switch. The HD-4702/883 has an initialization circuit which generates a master reset for the scan counter. This signal is derived from a digital differentiator that senses the first high level on the CP input after the ECP input goes low. When ECP is high, selecting the crystal input, CP must be low. A high level on CP would apply a continuous reset. See Clock Modes and Initialization below.
| Part Number | Status | Samples | Stock | Package | Lead Count (#) | Carrier Type | Pb (Lead) Free | MOQ | Temp. Range (°C) |
|---|---|---|---|---|---|---|---|---|---|
| HD1-4702/883 | Obsolete | N/A | Out of Stock | CERDIP | 16# | Tube | No | 200 | -55 to +125°C |
Filters
Applied Filters
- End Of Life NoticePDF 200 KB PLC15033 Jun 11, 2015
- Product Change NoticePDF 174 KB PCN14017 Apr 21, 2014
- Product Change NoticePDF 151 KB PCN11040 Apr 07, 2011
- Application NotePDF 224 KB an9654 May 05, 1999AI-generated Summary: The document explains the reliability and failure mechanisms of semiconductor parts, focusing on life testing and wearout. It discusses how switching states cause transient current pulses and hot carrier injection, which only occur briefly during switching. Life testing at elevated temperatures accelerates aging to remove infant mortality failures, improving reliability. The failure rate follows a bathtub curve with infant mortality, useful life, and wearout phases, modeled by lognormal and exponential distributions. The Arrhenius equation relates failure rates at different temperatures. Burn-in and life tests reduce early failures without harming intrinsic reliability.
Recommended Documents (1)
Datasheets (1)
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- Application NotePDF 224 KB an9654 May 05, 1999AI-generated Summary: The document explains the reliability and failure mechanisms of semiconductor parts, focusing on life testing and wearout. It discusses how switching states cause transient current pulses and hot carrier injection, which only occur briefly during switching. Life testing at elevated temperatures accelerates aging to remove infant mortality failures, improving reliability. The failure rate follows a bathtub curve with infant mortality, useful life, and wearout phases, modeled by lognormal and exponential distributions. The Arrhenius equation relates failure rates at different temperatures. Burn-in and life tests reduce early failures without harming intrinsic reliability.
Application Notes & White Papers (1)
- End Of Life NoticePDF 200 KB PLC15033 Jun 11, 2015
- Product Change NoticePDF 174 KB PCN14017 Apr 21, 2014
- Product Change NoticePDF 151 KB PCN11040 Apr 07, 2011
Product Notices (PCN, EOL, etc) (4)
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