Features
- This Circuit is Processed in Accordance to MIL-STD-883 and is Fully Conformant Under the Provisions of Paragraph 1.2.1.
- Low Noise Voltage @ 1kHz 4.5nV/√Hz Max
- Low Noise Current @ 1kHz 3pA/√Hz Max
- Wide Unity Gain Bandwidth 10MHz Min
- High Gain (Full Temp) 100kV/V Min (Room Temp) 1MV/V Typ
- Slew Rate 6V/µs Min
- High CMRR/PSRR (Full Temp) 80dB Min
- High Output Drive Capability (Full Temp) 25mA
Description
Support is limited to customers who have already adopted these products.
The HA-5101/883 is a dielectrically isolated operational amplifier featuring low noise and high performance. This amplifier has an excellent noise voltage density of 4. 5nV/√Hz (max) at 1kHz. The unity gain stable HA-5101/883 yields a 10MHz unity gain bandwidth and a 6V/µs slew rate. DC characteristics of the HA-5101/883 assure accurate performance. The 3mV (max) offset voltage is externally adjustable and offset voltage drift is just 3µV/°C. Low bias currents (200nA max) reduce input current errors and the high open loop voltage gain of 100kV/V, over temperature, increases the loop gain for low distortion amplification. The HA-5101/883 is ideal for audio applications, especially low-level signal amplifiers such as microphone, tape head and preamplifiers. Additionally, it is well suited for low distortion oscillators, low noise function generators and high Q filters.
Applications
- High Quality Audio Preamplifiers
- High Q Active Filters
- Low Noise Function Generators
- Low Distortion Oscillators
- Low Noise Comparators
| Part Number | Status | Samples | Stock | Package | Lead Count (#) | Carrier Type | Moisture Sensitivity Level (MSL) | Pitch (mm) | Pkg. Dimensions (mm) | Pb (Lead) Free | Pb Free Category | MOQ | Temp. Range (°C) | CAGE code |
|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|
| 5962-89635012A | Obsolete | N/A | Out of Stock | CLCC | 20# | Tube | Not Applicable | 1.3mm | 8.9 x 8.9 x 0.00 | No | Hot Solder Dip | 112 | -55 to +125°C | 34371 |
| 5962-8963501PA | Obsolete | N/A | Out of Stock | CERDIP | 8# | Tube | Not Applicable | 2.5mm | 9.7 x 6.3 x 0.00 | No | Hot Solder Dip | 192 | -55 to +125°C | 34371 |
| HA7-5101/883 | Obsolete | N/A | In Stock | CERDIP | 8# | Tube | Not Applicable | 2.5mm | 9.7 x 6.3 x 0.00 | No | Hot Solder Dip | 240 | -55 to +125°C | 34371 |
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- Application NotePDF 263 KB r13an0003eu0100-biasing-op-amps Dec 06, 2019AI-generated Summary: Proper biasing of operational amplifiers is essential to avoid malfunction in AC-coupled circuits. A missing DC bias path causes long stabilization times and potential failures. Adding input resistors to ground provides a DC path for bias currents, minimizing offset errors. For single-supply AC-coupled amplifiers, biasing uses a reference voltage, ideally from a high-PSRR voltage reference or buffered voltage divider, to maintain signal symmetry and reduce noise. Understanding frequency responses of input and feedback components is crucial for setting bandwidth and gain characteristics.
- Product Change NoticePDF 260 KB PCN16087 Sep 30, 2016
- Product Change NoticePDF 323 KB PCN15064 Dec 22, 2015
- Product Change NoticePDF 174 KB PCN14017 Apr 21, 2014
- Product Change NoticePDF 138 KB PCN11042 Apr 07, 2011
- Product Change NoticePDF 151 KB PCN11040 Apr 07, 2011
- Application NotePDF 357 KB an1694 Jan 19, 2004AI-generated Summary: The document outlines the four fundamental internal blocks of an operational amplifier and presents a simple 2:1 stage circuit diagram. It includes important legal notices from Renesas Electronics regarding the use, liability, and intellectual property rights of their semiconductor products. The document clarifies product quality grades, intended applications, and restrictions on use in life-critical or hazardous systems. It emphasizes compliance with applicable laws and safety responsibilities when using Renesas products. Contact information for Renesas sales offices worldwide is also provided.
- Application NotePDF 338 KB an9867 Nov 10, 1999AI-generated Summary: Electrical parameters are monitored during life testing to detect drift and failures, defined by exceeding datasheet limits. New products require less than 1% failure during burn-in, with failure analysis and corrective actions if exceeded. Sampling plans ensure defect rates below 3%. Life tests last 1000-3000 hours at 125°C depending on process maturity. Failure mechanisms include electromigration, ionic contamination, hot carrier injection, and dielectric rupture. Product sign-off requires all parties' approval after reliability confirmation. Space products undergo burn-in and quality conformance inspections with strict failure limits. Derating is unnecessary as datasheet limits are set at 6-sigma from characterization data, ensuring reliability.
- Application NotePDF 224 KB an9654 May 05, 1999AI-generated Summary: The document explains the reliability and failure mechanisms of semiconductor parts, focusing on life testing and wearout. It discusses how switching states cause transient current pulses and hot carrier injection, which only occur briefly during switching. Life testing at elevated temperatures accelerates aging to remove infant mortality failures, improving reliability. The failure rate follows a bathtub curve with infant mortality, useful life, and wearout phases, modeled by lognormal and exponential distributions. The Arrhenius equation relates failure rates at different temperatures. Burn-in and life tests reduce early failures without harming intrinsic reliability.
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- Application NotePDF 263 KB r13an0003eu0100-biasing-op-amps Dec 06, 2019AI-generated Summary: Proper biasing of operational amplifiers is essential to avoid malfunction in AC-coupled circuits. A missing DC bias path causes long stabilization times and potential failures. Adding input resistors to ground provides a DC path for bias currents, minimizing offset errors. For single-supply AC-coupled amplifiers, biasing uses a reference voltage, ideally from a high-PSRR voltage reference or buffered voltage divider, to maintain signal symmetry and reduce noise. Understanding frequency responses of input and feedback components is crucial for setting bandwidth and gain characteristics.
- Application NotePDF 357 KB an1694 Jan 19, 2004AI-generated Summary: The document outlines the four fundamental internal blocks of an operational amplifier and presents a simple 2:1 stage circuit diagram. It includes important legal notices from Renesas Electronics regarding the use, liability, and intellectual property rights of their semiconductor products. The document clarifies product quality grades, intended applications, and restrictions on use in life-critical or hazardous systems. It emphasizes compliance with applicable laws and safety responsibilities when using Renesas products. Contact information for Renesas sales offices worldwide is also provided.
- Application NotePDF 338 KB an9867 Nov 10, 1999AI-generated Summary: Electrical parameters are monitored during life testing to detect drift and failures, defined by exceeding datasheet limits. New products require less than 1% failure during burn-in, with failure analysis and corrective actions if exceeded. Sampling plans ensure defect rates below 3%. Life tests last 1000-3000 hours at 125°C depending on process maturity. Failure mechanisms include electromigration, ionic contamination, hot carrier injection, and dielectric rupture. Product sign-off requires all parties' approval after reliability confirmation. Space products undergo burn-in and quality conformance inspections with strict failure limits. Derating is unnecessary as datasheet limits are set at 6-sigma from characterization data, ensuring reliability.
- Application NotePDF 224 KB an9654 May 05, 1999AI-generated Summary: The document explains the reliability and failure mechanisms of semiconductor parts, focusing on life testing and wearout. It discusses how switching states cause transient current pulses and hot carrier injection, which only occur briefly during switching. Life testing at elevated temperatures accelerates aging to remove infant mortality failures, improving reliability. The failure rate follows a bathtub curve with infant mortality, useful life, and wearout phases, modeled by lognormal and exponential distributions. The Arrhenius equation relates failure rates at different temperatures. Burn-in and life tests reduce early failures without harming intrinsic reliability.
Application Notes & White Papers (4)
- Product Change NoticePDF 260 KB PCN16087 Sep 30, 2016
- Product Change NoticePDF 323 KB PCN15064 Dec 22, 2015
- Product Change NoticePDF 174 KB PCN14017 Apr 21, 2014View More (7)
Product Notices (PCN, EOL, etc) (7)
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