Features
- Gain bandwidth product (AV ≥ 5): 100MHz
- High input impedance: 500MΩ
- Low input bias current: 1nA
- Low input offset current: 1nA
- Low input offset voltage: 3mV
- High gain: 150kV/V
- Slew rate: 35V/µs
- Output short-circuit protection
- Compensation pin for unity gain capability
HA-2620 Functional Diagram
Description
The HA-2620 is a bipolar operational amplifier (op amp) that features very high input impedance (500MΩ) coupled with wideband AC performance. The high resistance of the input stage is complemented by low offset voltage (0. 5mV) and low bias and offset current (1nA) to facilitate accurate signal processing. Input offset can be reduced further by means of an external nulling potentiometer. The 100MHz gain bandwidth product (HA‑2620 is stable for closed loop gains greater than 5), 35V/µs slew rate, and 150kV/V open loop gain enable the HA‑2620 to perform high-gain amplification of very fast, wideband signals. These dynamic characteristics, coupled with fast settling times, make this amplifier ideally suited to pulse amplification designs and high frequency (such as video) applications. The frequency response of the amplifier can be tailored to exact design requirements by means of an external bandwidth control capacitor connected from the COMP pin to GND. In addition to its application in pulse and video amplifier designs, HA-2620 is suited to other high performance designs such as high-gain low distortion audio amplifiers, high-Q and wideband active filters, and high-speed comparators. For more information, see Application Note AN519.
Parameters
| Attributes | Value |
|---|---|
| Rating | Harsh Environment |
| Bandwidth (MHz) | 100 |
| Channels (#) | 1 |
| CMRR (dB) | 100 |
| IOUT (mA) | 22 |
| IS per Amp (mA) | 3 |
| Noise VN (nV/√Hz) | 11 |
| Offset Voltage (max) | 500µV |
| PSRR (db) | 90 |
| Rail-to-Rail Input/Output | No |
| Slew Rate (V/µs) | 35 |
| Supply Voltage (min) (V) | 10 - 10 |
| Supply Voltage (max) (V) | 40 - 40 |
| Temp. Range (°C) | -55 to +125°C |
| Flow | Harsh Environment & MIL-STD-883 |
| Qualification Level | Standard |
| Die Sale Availability? | No |
| PROTO Availability? | No |
Package Options
| Pkg. Type | Pkg. Dimensions (mm) | Lead Count (#) | Pitch (mm) |
|---|---|---|---|
| CAN | 9.1 x 9.1 x 0.00 | 8 | 5.1 |
Applications
- Video and RF Amplifier
- Pulse Amplifier
- Audio Amplifiers and Filters
- High-Q Active Filters
- High Speed Comparators
- Low Distortion Oscillator
| Part Number | Status | Samples | Stock | Package | Lead Count (#) | Carrier Type | Moisture Sensitivity Level (MSL) | Pb (Lead) Free | Pb Free Category | MOQ | Temp. Range (°C) | CAGE code |
|---|---|---|---|---|---|---|---|---|---|---|---|---|
| HA2-2620-2 | Active | Available | Out of Stock | CAN | 8# | Tray | Not Applicable | No | Hot Solder Dip | 144 | -55 to +125°C | 34371 |
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- Application NotePDF 263 KB r13an0003eu0100-biasing-op-amps Dec 06, 2019AI-generated Summary: Proper biasing of operational amplifiers is essential to avoid malfunction in AC-coupled circuits. A missing DC bias path causes long stabilization times and potential failures. Adding input resistors to ground provides a DC path for bias currents, minimizing offset errors. For single-supply AC-coupled amplifiers, biasing uses a reference voltage, ideally from a high-PSRR voltage reference or buffered voltage divider, to maintain signal symmetry and reduce noise. Understanding frequency responses of input and feedback components is crucial for setting bandwidth and gain characteristics.
- Application NotePDF 564 KB an1993 May 22, 2018AI-generated Summary: Voltage feedback (VFB) amplifiers use a differential input pair, a high-impedance stage, and an output buffer to convert input voltage differences into output voltage. The VFB amplifier's gain decreases at a dominant pole frequency due to compensation capacitors. Current feedback (CFB) amplifiers include a class AB input amplifier, current mirror, high-impedance stage, and output buffer. CFB amplifiers provide faster switching and higher slew rates by drawing charge/discharge currents directly from supply rails, unlike VFB amplifiers which are limited by biasing current sources.
- Product AdvisoryPDF 499 KB PA11003 Jan 05, 2011
- Product AdvisoryPDF 67 KB PA10098 Oct 21, 2010
- Application NotePDF 357 KB an1694 Jan 19, 2004AI-generated Summary: The document outlines the four fundamental internal blocks of an operational amplifier and presents a simple 2:1 stage circuit diagram. It includes important legal notices from Renesas Electronics regarding the use, liability, and intellectual property rights of their semiconductor products. The document clarifies product quality grades, intended applications, and restrictions on use in life-critical or hazardous systems. It emphasizes compliance with applicable laws and safety responsibilities when using Renesas products. Contact information for Renesas sales offices worldwide is also provided.
- Application NotePDF 843 KB an535 Jun 05, 2002AI-generated Summary: A Data Acquisition System (DAS) requires careful design of signal conditioning, transducer selection, and signal transmission to ensure high accuracy. Signal conditioning includes multiplexing, amplification, filtering, and calibration, ideally performed near the transducer. Transducers convert physical variables to electrical signals, often voltage, with low source resistance preferred. Signal paths can be single-ended or differential; differential paths better reject common mode noise, especially for low-level signals. Shielded twisted pairs and balanced lines reduce interference. Filters, typically Butterworth low-pass, prevent aliasing and maintain signal integrity.
- Application NotePDF 224 KB an9654 May 05, 1999AI-generated Summary: The document explains the reliability and failure mechanisms of semiconductor parts, focusing on life testing and wearout. It discusses how switching states cause transient current pulses and hot carrier injection, which only occur briefly during switching. Life testing at elevated temperatures accelerates aging to remove infant mortality failures, improving reliability. The failure rate follows a bathtub curve with infant mortality, useful life, and wearout phases, modeled by lognormal and exponential distributions. The Arrhenius equation relates failure rates at different temperatures. Burn-in and life tests reduce early failures without harming intrinsic reliability.
- Application NotePDF 520 KB an9523 Aug 19, 1998AI-generated Summary: The document details SPICE evaluation programs for operational amplifier models, focusing on AC and DC transfer functions for non-inverting op amps. It explains how to simulate AC transfer functions with three different gains using user-supplied feedback resistors, load resistance, capacitance, and power supply voltage. The DC parameters program analyzes input offset voltage, input currents, and power supply currents using DC sweep inputs. The programs assume dual power supplies but can adapt to single supply configurations.
- Application NotePDF 508 KB an9510 Aug 19, 1998AI-generated Summary: The document explains fundamental analog circuit concepts for digital designers, focusing on superposition, Thevenin equivalent circuits, and feedback principles. It details the operation and assumptions of inverting and non-inverting op amps, differential amplifiers, and the use of T networks in feedback paths. The text highlights the importance of feedback in controlling closed-loop gain and stability, and distinguishes between voltage and current feedback op amps, especially in high-frequency applications like video amplifiers.
- Application NotePDF 854 KB an9415 Aug 19, 1998AI-generated Summary: The document explains feedback in operational amplifiers, comparing non-inverting and inverting configurations. It highlights how feedback improves stability, reduces gain errors, noise, and distortion by relying on passive components. The text discusses frequency-dependent feedback, noise reduction via filtering, and impedance control. It introduces Bode plots for analyzing frequency response and phase shifts in circuits with poles and zeros, emphasizing their importance in stability and oscillation criteria.
- Application NotePDF 415 KB an551 Aug 12, 1998AI-generated Summary: The document details recommended test procedures for operational amplifiers, focusing on measurements such as settling time, gain bandwidth product, phase margin, input noise voltage and current, and channel separation. It specifies test circuits and step-by-step methods for accurate parameter evaluation. Table 1 lists parameters and component values for various amplifier models. The procedures ensure precise characterization of amplifier performance using specific test setups and measurement techniques.
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- Application NotePDF 263 KB r13an0003eu0100-biasing-op-amps Dec 06, 2019AI-generated Summary: Proper biasing of operational amplifiers is essential to avoid malfunction in AC-coupled circuits. A missing DC bias path causes long stabilization times and potential failures. Adding input resistors to ground provides a DC path for bias currents, minimizing offset errors. For single-supply AC-coupled amplifiers, biasing uses a reference voltage, ideally from a high-PSRR voltage reference or buffered voltage divider, to maintain signal symmetry and reduce noise. Understanding frequency responses of input and feedback components is crucial for setting bandwidth and gain characteristics.
- Application NotePDF 564 KB an1993 May 22, 2018AI-generated Summary: Voltage feedback (VFB) amplifiers use a differential input pair, a high-impedance stage, and an output buffer to convert input voltage differences into output voltage. The VFB amplifier's gain decreases at a dominant pole frequency due to compensation capacitors. Current feedback (CFB) amplifiers include a class AB input amplifier, current mirror, high-impedance stage, and output buffer. CFB amplifiers provide faster switching and higher slew rates by drawing charge/discharge currents directly from supply rails, unlike VFB amplifiers which are limited by biasing current sources.
- Application NotePDF 357 KB an1694 Jan 19, 2004AI-generated Summary: The document outlines the four fundamental internal blocks of an operational amplifier and presents a simple 2:1 stage circuit diagram. It includes important legal notices from Renesas Electronics regarding the use, liability, and intellectual property rights of their semiconductor products. The document clarifies product quality grades, intended applications, and restrictions on use in life-critical or hazardous systems. It emphasizes compliance with applicable laws and safety responsibilities when using Renesas products. Contact information for Renesas sales offices worldwide is also provided.
- Application NotePDF 843 KB an535 Jun 05, 2002AI-generated Summary: A Data Acquisition System (DAS) requires careful design of signal conditioning, transducer selection, and signal transmission to ensure high accuracy. Signal conditioning includes multiplexing, amplification, filtering, and calibration, ideally performed near the transducer. Transducers convert physical variables to electrical signals, often voltage, with low source resistance preferred. Signal paths can be single-ended or differential; differential paths better reject common mode noise, especially for low-level signals. Shielded twisted pairs and balanced lines reduce interference. Filters, typically Butterworth low-pass, prevent aliasing and maintain signal integrity.
- Application NotePDF 224 KB an9654 May 05, 1999AI-generated Summary: The document explains the reliability and failure mechanisms of semiconductor parts, focusing on life testing and wearout. It discusses how switching states cause transient current pulses and hot carrier injection, which only occur briefly during switching. Life testing at elevated temperatures accelerates aging to remove infant mortality failures, improving reliability. The failure rate follows a bathtub curve with infant mortality, useful life, and wearout phases, modeled by lognormal and exponential distributions. The Arrhenius equation relates failure rates at different temperatures. Burn-in and life tests reduce early failures without harming intrinsic reliability.View More (10)
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- Product AdvisoryPDF 499 KB PA11003 Jan 05, 2011
- Product AdvisoryPDF 67 KB PA10098 Oct 21, 2010
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