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Renesas Electronics Corporation

Overview

Description

The ISL70040SEHEV2Z evaluation platform is used to evaluate the ISL70040SEH radiation hardened low-side Gallium Nitride (GaN) FET driver alongside the ISL70023SEH N-channel enhancement mode GaN power transistor. The same board can be used to evaluate the ISL73040SEH radiation hardened low-side GaN FET driver alongside the ISL73023SEH N-channel enhancement mode GaN power transistor, which are the same die offered with different radiation assurance screening.

The ISL70040SEH is designed to drive enhancement-mode GaN FETs in isolated topologies and boost-type configurations. It operates across a 4.5V to 13.2V supply range and supports both non-inverting and inverting gate drive within a single device.

The ISL70040SEH features a regulated 4.5V gate drive voltage (VDRV), undervoltage lockout (UVLO) protection, and 14.7V-tolerant inputs for direct connection to most PWM controllers. Split outputs enable independent adjustment of turn-on and turn-off speeds.

The ISL70023SEH 100V N-channel enhancement-mode GaN power transistor features low rDS(ON), low QG, and zero QRR for efficient high-frequency switching and reduced solution size.

Features

  • Wide VDD range single
    • 4.5V to 13.2V
  • Location provided for load resistors to switch the GaN FET with a load
  • SMA connector on the gate drive voltage to analyze the gate waveforms
  • Drain/Source sense test points to analyze the drain to source waveforms
  • Banana jack connectors for power supplies and drain/source connections

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