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Features

  • 240mOhm, 700V GaN Device in PQFN 8x8 industry package
  • JEDEC-qualified GaN technology
  • Dynamic RDS(on)eff production tested
  • Robust design, defined by:
    • 800V transient over-voltage capability
    • Operation with E-mode Gate drivers without the need for Zener protection
    • 2kV HBM ESD rating
  • Low QRR
  • Reduced crossover loss
  • Achieves increased efficiency in both hard-switched and soft-switched circuits, enabling:
    • Increased power density
    • Reduced system size and weight
    • Overall reduction in system cost

Description

The TP70H300G4LSGB 700V 240mΩ Gallium Nitride (GaN) FET, housed in an 8x8 PQFN industry-standard package, is a normally-off device built on Renesas' Gen IV SuperGaN® platform. It integrates a high-voltage GaN HEMT with an optimized low-voltage silicon MOSFET, achieving over 2kV HBM ESD rating. This device delivers superior performance, standard drive compatibility, easy adoption, and enhanced reliability.

Parameters

Attributes Value
Qualification Level Standard
Vds min (V) 700
V(TR)DSS max (V) 800
RDSON (Typ) (mΩ) 240
RDSON (max) (mΩ) 312
Vth typ (V) 2
Id max @ 25°C (A) 8
Qrr typ (nC) 0
Qg typ (nC) 5.4
Qoss (nC) 17
Ron * Qoss (FOM) 4080
Ciss (Typical) (pF) 487
Coss (Typical) (pF) 16.3
trr (Typical) (nS) 29
Mounting Type Surface Mount
Temp. Range (°C) -55 to +150°C

Package Options

Pkg. Type
PQFN88

Applications

  • Consumer
  • Power adapters
  • Low power SMPS
  • Lighting
  • POE Power

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