Features
- Electrically screened to DLA SMD # 5962-07249
- QML qualified per MIL-PRF-38535 requirements
- 1A MOSFET gate driver
- 90μA typical start-up current, 125μA maximum
- 35ns propagation delay current sense to output
- Fast transient response with peak current-mode control
- 9V to 13.2V operation
- Adjustable switching frequency to 1MHz
- 50ns rise and fall times with 1nF output load
- Trimmed timing capacitor discharge current for accurate dead time/maximum duty cycle control
- 1.5MHz bandwidth error amplifier
- Tight tolerance voltage reference over line, load, and temperature
- ±3% current limit threshold
- Pb-free available (RoHS compliant)
- Radiation environment:
- High dose rate (50 - 300rad(Si)/s): 100krad(Si)
- Low dose rate (0.01rad(Si)/s): 100krad(Si)*
* Product capability established by initial characterization. The "EH" version is acceptance tested on a wafer-by-wafer basis to 50krad(Si) at low dose rate. (Applies to ISL7884xASEH only)
ISL7884xASRH Functional Diagram
Description
The ISL78840ASEH, ISL78841ASEH, ISL78843ASEH, ISL78845ASEH, ISL78840ASRH, ISL78841ASRH, ISL78843ASRH, ISL78845ASRH are high-performance, radiation hardened drop-in replacements for the popular 28C4x and 18C4x PWM controllers suitable for a wide range of power conversion applications including boost, flyback and isolated output configurations. Fast signal propagation and output switching characteristics make these ideal products for existing and new designs. Features include up to 13.2V operation, low operating current, 90μA typical start-up current, adjustable operating frequency to 1MHz, and high peak current drive capability with 50ns rise and fall times.
Parameters
| Attributes | Value |
|---|---|
| Rating | Space |
| Control Mode | Voltage, Peak Current Mode |
| Phases (Max) | 1 |
| No-Load Operating Current | 2.9 mA |
| Quiescent Current | 90µA |
| Supply Voltage (min) (V) | 9 - 9 |
| Supply Voltage (max) (V) | 13.2 - 13.2 |
| Switching Frequency (min) (kHz) | 2 |
| Switching Frequency (max) (kHz) | 1000 |
| Topology | Buck, Boost, Flyback, Forward |
| VREF (V) | 5 |
| Temp. Range (°C) | -55 to +125°C |
| TID HDR (krad(Si)) | 100 |
| DSEE (MeV·cm2/mg) | 43, 86 |
| Flow | RH Hermetic |
| Qualification Level | Class Q, Class V, EM |
| Die Sale Availability? | Yes |
| PROTO Availability? | Yes |
Applications
- Current mode switching power supplies
- Isolated buck and flyback regulators
- Boost regulators
- Direction and speed control in motors
- Control of high current FET drivers
| Part Number | Status | Samples | Stock | RoHS | Package | Lead Count (#) | Carrier Type | Moisture Sensitivity Level (MSL) | Pitch (mm) | Pkg. Dimensions (mm) | DLA SMD | Pb (Lead) Free | Pb Free Category | MOQ | Temp. Range (°C) | CAGE code |
|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|
| ISL78841ASRHD/PROTO | Active | Available | Out of Stock | Contact | SBDIP | 8# | Tray | Not Applicable | 2.5mm | 9.9 x 7.4 x 2.41 | Exempt | Gold Plate over compliant Undercoat-e4 | 1 | -55 to +125°C | 34371 | |
| ISL78841ASRHF/PROTO | Active | Available | In Stock | Contact | CFP | 8# | Tray | Not Applicable | 1.3mm | 6.5 x 6.5 x 0.00 | Exempt | Gold Plate over compliant Undercoat-e4 | 1 | -55 to +125°C | 34371 | |
| ISL78841ASRHQD | Active | N/A | Out of Stock | Contact | SBDIP | 8# | Tray | Not Applicable | 2.5mm | 9.9 x 7.4 x 2.41 | 5962R0724902QPC | Exempt | Gold Plate over compliant Undercoat-e4 | 25 | -55 to +125°C | 34371 |
| ISL78841ASRHQF | Active | N/A | In Stock | Contact | CFP | 8# | Tray | Not Applicable | 1.3mm | 6.5 x 6.5 x 0.00 | 5962R0724902QXC | Exempt | Gold Plate over compliant Undercoat-e4 | 25 | -55 to +125°C | 34371 |
| ISL78841ASRHVD | Active | N/A | In Stock | Contact | SBDIP | 8# | Tray | Not Applicable | 2.5mm | 9.9 x 7.4 x 2.41 | 5962R0724902VPC | Exempt | Gold Plate over compliant Undercoat-e4 | 25 | -55 to +125°C | 34371 |
| ISL78841ASRHVF | Active | N/A | In Stock | Contact | CFP | 8# | Tray | Not Applicable | 1.3mm | 6.5 x 6.5 x 0.00 | 5962R0724902VXC | Exempt | Gold Plate over compliant Undercoat-e4 | 25 | -55 to +125°C | 34371 |
| ISL78841ASRHVX | Active | N/A | Out of Stock | RoHS:EN RoHS:JA | DIE | 5962R0724902V9A | No | 100 | -55 to +125°C | 34371 | ||||||
| ISL78841ASRHX/SAMPLE | Active | N/A | Out of Stock | Contact | DIE | No | 5 | -55 to +125°C | 34371 |
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- Model - SPICEThis file includes test benches to simulate the performance of the ISL71041M, ISL71043M, ISL7884x, and ISL73884x family of PWM controllers. Premade test benches are included for startup and transient simulation.
- Model - iSimThis file includes test benches to simulate the performance of the ISL71041M, ISL71043M, ISL7884x, and ISL73884x family of PWM controllers. Premade test benches are included for AC and transient simulation.
- DatasheetPDF 945 KB FN7952 Feb 13, 2025
- ReportPDF 322 KB r34et0004eu-isl78845asrh-total-dose-test-report Jul 23, 2019
- Price Increase NoticePDF 360 KB PIN19011 Apr 10, 2019
- ReportPDF 370 KB isl78845aseh-neutron-test-report Apr 29, 2015
- ReportPDF 1.83 MB isl7884xasrh-see-test-report Apr 09, 2015
- Product AdvisoryPDF 176 KB PA11095 Sep 16, 2011
- Product Change NoticePDF 194 KB PCN11004 Jan 24, 2011
- Product AdvisoryPDF 499 KB PA11003 Jan 05, 2011
- Product Change NoticePDF 230 KB PCN10123 Dec 06, 2010
- Application NotePDF 338 KB an9867 Nov 10, 1999AI-generated Summary: Electrical parameters are monitored during life testing to detect drift and failures, defined by exceeding datasheet limits. New products require less than 1% failure during burn-in, with failure analysis and corrective actions if exceeded. Sampling plans ensure defect rates below 3%. Life tests last 1000-3000 hours at 125°C depending on process maturity. Failure mechanisms include electromigration, ionic contamination, hot carrier injection, and dielectric rupture. Product sign-off requires all parties' approval after reliability confirmation. Space products undergo burn-in and quality conformance inspections with strict failure limits. Derating is unnecessary as datasheet limits are set at 6-sigma from characterization data, ensuring reliability.
- Application NotePDF 224 KB an9654 May 05, 1999AI-generated Summary: The document explains the reliability and failure mechanisms of semiconductor parts, focusing on life testing and wearout. It discusses how switching states cause transient current pulses and hot carrier injection, which only occur briefly during switching. Life testing at elevated temperatures accelerates aging to remove infant mortality failures, improving reliability. The failure rate follows a bathtub curve with infant mortality, useful life, and wearout phases, modeled by lognormal and exponential distributions. The Arrhenius equation relates failure rates at different temperatures. Burn-in and life tests reduce early failures without harming intrinsic reliability.
- DatasheetPDF 945 KB FN7952 Feb 13, 2025
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- DatasheetPDF 945 KB FN7952 Feb 13, 2025
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- Application NotePDF 338 KB an9867 Nov 10, 1999AI-generated Summary: Electrical parameters are monitored during life testing to detect drift and failures, defined by exceeding datasheet limits. New products require less than 1% failure during burn-in, with failure analysis and corrective actions if exceeded. Sampling plans ensure defect rates below 3%. Life tests last 1000-3000 hours at 125°C depending on process maturity. Failure mechanisms include electromigration, ionic contamination, hot carrier injection, and dielectric rupture. Product sign-off requires all parties' approval after reliability confirmation. Space products undergo burn-in and quality conformance inspections with strict failure limits. Derating is unnecessary as datasheet limits are set at 6-sigma from characterization data, ensuring reliability.
- Application NotePDF 224 KB an9654 May 05, 1999AI-generated Summary: The document explains the reliability and failure mechanisms of semiconductor parts, focusing on life testing and wearout. It discusses how switching states cause transient current pulses and hot carrier injection, which only occur briefly during switching. Life testing at elevated temperatures accelerates aging to remove infant mortality failures, improving reliability. The failure rate follows a bathtub curve with infant mortality, useful life, and wearout phases, modeled by lognormal and exponential distributions. The Arrhenius equation relates failure rates at different temperatures. Burn-in and life tests reduce early failures without harming intrinsic reliability.
Application Notes & White Papers (2)
- Price Increase NoticePDF 360 KB PIN19011 Apr 10, 2019
- Product AdvisoryPDF 176 KB PA11095 Sep 16, 2011
- Product Change NoticePDF 194 KB PCN11004 Jan 24, 2011
- Product AdvisoryPDF 499 KB PA11003 Jan 05, 2011
- Product Change NoticePDF 230 KB PCN10123 Dec 06, 2010
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Marketing Collateral (1)
- ReportPDF 322 KB r34et0004eu-isl78845asrh-total-dose-test-report Jul 23, 2019
- ReportPDF 370 KB isl78845aseh-neutron-test-report Apr 29, 2015
- ReportPDF 1.83 MB isl7884xasrh-see-test-report Apr 09, 2015
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- Software & Tools - OtherXLSX 56 KB ISL7884x 71041 71043 RTCT calculator Jun 10, 2025
- SimulatoriSim Personal Edition (iSim:PE) speeds the design cycle and reduces risk early in any project, identifying parts that can be used in current as well as next-generation designs.
- Model - SPICEThis file includes test benches to simulate the performance of the ISL71041M, ISL71043M, ISL7884x, and ISL73884x family of PWM controllers. Premade test benches are included for startup and transient simulation.
- Model - iSimThis file includes test benches to simulate the performance of the ISL71041M, ISL71043M, ISL7884x, and ISL73884x family of PWM controllers. Premade test benches are included for AC and transient simulation.
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- Software & Tools - OtherXLSX 56 KB ISL7884x 71041 71043 RTCT calculator Jun 10, 2025
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- Model - SPICEThis file includes test benches to simulate the performance of the ISL71041M, ISL71043M, ISL7884x, and ISL73884x family of PWM controllers. Premade test benches are included for startup and transient simulation.
- Model - iSimThis file includes test benches to simulate the performance of the ISL71041M, ISL71043M, ISL7884x, and ISL73884x family of PWM controllers. Premade test benches are included for AC and transient simulation.
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