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ISL70591SEH

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Radiation Hardened 100µA Precision Current Source

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Features

  • Electrically screened to DLA SMD 5962-18217
  • Wide operating voltage range: 3V to 40V
  • High initial accuracy (+V = 20V at +25°C): ±0.34%
  • High output impedance: 189MΩ (typical)
  • Completely floating: No ground connection
  • Radiation acceptance testing
    • High dose rate (50-300rad(Si)/s): 100krad(Si)
    • Low dose rate (0.01rad(Si)/s): 75krad(Si)
  • SEE hardness
    • No SEB/SEL LETTH, +V = 35V: 86MeV•cm2/mg
    • SET duration (time recovery) ≤ 125µs
Find Other Products in Hi-Rel Current Sources

Description

The ISL70591SEH is a radiation hardened precision 100µA current source IC. The device has excellent accuracy of ±1% over a wide operating voltage range of 3V to 40V and over a temperature range of -55°C to +125°C. Fabricated with the Renesas proprietary PR40 Silicon-on-Insulator (SOI) process, the device is immune to single-event latch-up. The high output impedance of the device makes it insensitive to voltage drops across long lines. It can withstand a forward operating voltage of 40V and a reverse voltage of -0.5V. The ISL7x591SEH and ISL7x592SEH are two-terminal floating current sources allowing them to be used in high-side, low-side, and dual-side load applications such as sensor excitation, biasing networks, low-voltage references, floating voltage references, and ramp generators. The current sources were primarily designed for thermistor and other sensor excitation applications widely used in spacecraft. The device is available in a 4 Ld ceramic flatpack and die forms. The temperature range is -55°C to +125°C.

Parameters

AttributesValue
RatingSpace
Accuracy±0.34%
Continuous Output Current (mA)0.1
Output Impedance (MΩ)189
Supply Voltage (min) (V)3 - 3
Supply Voltage (max) (V)40 - 40
Temp. Range (°C)-40 to +125°C, -55 to +125°C
TID HDR (krad(Si))100
TID LDR (krad(Si))75
DSEE (MeV·cm2/mg)86
FlowRH Hermetic
Qualification LevelClass V, EM
Die Sale Availability?Yes
PROTO Availability?Yes

Package Options

Pkg. TypePkg. Dimensions (mm)Lead Count (#)Pitch (mm)
—0.0 x 0.0 x 0.00——
CFP4.2 x 6.5 x 0.0042.5
DIE———

Applications

  • Sensor excitation
  • Biasing network
  • Low-voltage references
  • Ramp generators
Part NumberStatusSamplesStockPackageLead Count (#)Carrier TypeMoisture Sensitivity Level (MSL)Pitch (mm)Pkg. Dimensions (mm)DLA SMDPb (Lead) FreePb Free CategoryMOQCAGE code
ISL70591SEHF/PROTOActiveAvailableIn StockCFP4#TrayNot Applicable2.5mm4.2 x 6.5 x 0.00ExemptGold Plate over compliant Undercoat-e4134371
ISL70591SEHVFActiveN/AIn StockCFP4#TrayNot Applicable2.5mm4.2 x 6.5 x 0.005962R1821701VXCExemptGold Plate over compliant Undercoat-e42534371
ISL70591SEHVXActiveN/AOut of StockDIE5962R1821701VXCNo10034371
ISL70591SEHX/SAMPLEActiveN/AOut of StockPackageDie Waffle PackNot Applicable0.0 x 0.0 x 0.00YesNot Applicable134371
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    Recommended Documents (2)

  1. Datasheet
    ISL70591SEH, ISL70592SEH, ISL73591SEH, ISL73592SEH Datasheet
    RECOMMENDED
    PDF 780 KB isl70591seh-0592seh-3591seh-3592seh Aug 06, 2018
  2. Document
    Standard Microcircuit Drawing 5962-18217 (ISL70591SEH, ISL73591SEH, ISL70592SEH, ISL73592SEH)
    RECOMMENDED
    Aug 28, 2018

    Datasheets (1)

  1. Datasheet
    ISL70591SEH, ISL70592SEH, ISL73591SEH, ISL73592SEH Datasheet
    RECOMMENDED
    PDF 780 KB isl70591seh-0592seh-3591seh-3592seh Aug 06, 2018

    Application Notes & White Papers (2)

  1. Application Note
    AN9867: End of Life Derating: A Necessity or Overkill
    PDF 338 KB an9867 Nov 10, 1999
    AI-generated Summary: Electrical parameters are monitored during life testing to detect drift and failures, defined by exceeding datasheet limits. New products require less than 1% failure during burn-in, with failure analysis and corrective actions if exceeded. Sampling plans ensure defect rates below 3%. Life tests last 1000-3000 hours at 125°C depending on process maturity. Failure mechanisms include electromigration, ionic contamination, hot carrier injection, and dielectric rupture. Product sign-off requires all parties' approval after reliability confirmation. Space products undergo burn-in and quality conformance inspections with strict failure limits. Derating is unnecessary as datasheet limits are set at 6-sigma from characterization data, ensuring reliability.
  2. Application Note
    AN9654: Use of Life Tested Parts
    PDF 224 KB an9654 May 05, 1999
    AI-generated Summary: The document explains the reliability and failure mechanisms of semiconductor parts, focusing on life testing and wearout. It discusses how switching states cause transient current pulses and hot carrier injection, which only occur briefly during switching. Life testing at elevated temperatures accelerates aging to remove infant mortality failures, improving reliability. The failure rate follows a bathtub curve with infant mortality, useful life, and wearout phases, modeled by lognormal and exponential distributions. The Arrhenius equation relates failure rates at different temperatures. Burn-in and life tests reduce early failures without harming intrinsic reliability.

    Other (4)

  1. Report
    ISL70591SEH/ ISL73591SEH Neutron Test Report
    PDF 874 KB R34NT0004EU0101 Rev.1.01 Jun 05, 2026
  2. Document
    Standard Microcircuit Drawing 5962-18217 (ISL70591SEH, ISL73591SEH, ISL70592SEH, ISL73592SEH)
    RECOMMENDED
    Aug 28, 2018
  3. Report
    ISL70591SEH & ISL73591SEH Total Dose Test Report
    PDF 347 KB isl70591seh-total-dose-test-report Aug 15, 2018
  4. Report
    ISL7x591SEH, ISL7x592SEH SEE Test Report
    PDF 716 KB isl7059xseh-359xseh-see-test-report May 17, 2018

Renesas Boards & Kits

ISL70591SEHEVAL1Z Radiation Hardened Precision Current Source Evaluation Board
ISL70591SEHEVAL1Z Active

Radiation Hardened 100µA Precision Constant Current Source Evaluation Board

The ISL70591SEHEVAL1Z evaluation board provides a quick and easy method for evaluating the ISL70591SEH radiation hardened 100µA precision constant current source designed for thermistor and other resistive sensor excitation applications. Its two-terminal floating type topology allows the load to... Read More

Recommended Documents:
ISL70591SEHEVAL1Z User Guide
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Simulation Models

    Simulation Models (1)

  1. Model - SPICE
    ISL70591SEH and ISL73591SEH Spice Model
    ZIP 30 KB isl70591seh-spice-model Oct 11, 2018
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Knowledge Base

  1. How many ISL7x591SEH or ISL7x592SEH current sources can I connect for higher current drive?

    Question: How many current sources can I connect for higher current drive?   Answer: The number of current sources you can connect in parallel is theoretically unlimited as long as the circuit loading maintains at least 3V across the V+ and V- terminals of the ISL70591SEH, ISL70592SEH, ISL73591SEH or ISL73592SEH current ...

  2. Why did Renesas provide output current limits at various supply voltages for the ISL7x591SEH and ISL7x592SEH current sources?

    Question: The ISL70591SEH, ISL70592SEH, ISL73591SEH, ISL73592SEH data sheet has specifications for output current at various supply voltages. Why did Renesas provide output current limits at various supply voltages?   Answer: The output current accuracy varies at different V+ voltages and temperature level. Limits are provided at V+ voltages of 3V, 12V ...

  3. DNC Pins on ISL7x591SEH or ISL7x592SEH Current Sources

    Question: For these current sources, can the DNC pins (pin 2 and pin 3) be connected externally to V+ or ground?   Answer: No, the DNC pins for the ISL70591SEH, ISL70592SEH, ISL73591SEH, and ISL73592SEH should not be externally connected to V+ or ground. They need to be left floating. Connecting them ...

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