Features
- 3 micron radiation hardened SOS CMOS
- Total dose 200K RAD (Si)
- SEP effective LET no upsets: >100 MEV-cm2/mg
- Single Event Upset (SEU) immunity < 2 x 10-9 errors/bit-day (Typ)
- Dose rate survivability: >1 x 1012 RAD (Si)/s
- Dose rate upset >1010 RAD (Si)/s 20ns pulse
- Cosmic ray upset immunity < 2 x 10-9 errors/gate day (Typ)
- Latch-up free under any conditions
- Military temperature range: -55 °C to +125 °C
- Significant power reduction compared to LSTTL ICs
- DC operating voltage range: 4.5V to 5.5V
- Input logic levels
- VIL = 30% of VCC Max
- VIH = 70% of VCC Min
- Input current levels Ii ≤ 5µA at VOL, VOH
HCS00MS Functional Diagram
Description
The Intersil HCS00MS is a radiation hardened quad 2-input NAND gate. A high on both inputs forces the output to a low state. The HCS00MS utilizes advanced CMOS/SOS technology to achieve high-speed operation. This device is a member of the radiation hardened, high-speed, CMOS/SOS logic family. The HCS00MS is supplied in a 14-lead Ceramic Flatpack (K suffix) or an SBDIP package (D suffix).
| Part Number | Status | Samples | Stock | RoHS | Package | Lead Count (#) | Carrier Type | Moisture Sensitivity Level (MSL) | Pitch (mm) | Pkg. Dimensions (mm) | DLA SMD | Pb (Lead) Free | Pb Free Category | MOQ | Temp. Range (°C) |
|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|
| HCS00DMSR | Obsolete | N/A | Out of Stock | Contact | SBDIP | 14# | Tube | Not Applicable | 2.5mm | 19.0 x 7.4 x 2.41 | 5962R9572401VCC | Exempt | Gold Plate over compliant Undercoat-e4 | 25 | -55 to +125°C |
| HCS00HMSR | Last Time Buy | Available | Out of Stock | RoHS:EN RoHS:JA | DIE | Die Waffle Pack | Not Applicable | 0.0 x 0.0 x 0.00 | 5962R9572401V9A | Yes | None | 100 | -55 to +125°C | ||
| HCS00KMSR | Obsolete | N/A | Out of Stock | Contact | CFP | 14# | Tray | Not Applicable | 1.3mm | 9.8 x 6.5 x 0.00 | 5962R9572401VXC | Exempt | Gold Plate over compliant Undercoat-e4 | 25 | -55 to +125°C |
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- Price Increase NoticePDF 360 KB PIN19011 Apr 10, 2019
- Product AdvisoryPDF 499 KB PA11003 Jan 05, 2011
- Product Change NoticePDF 230 KB PCN10123 Dec 06, 2010
- Application NotePDF 338 KB an9867 Nov 10, 1999AI-generated Summary: Electrical parameters are monitored during life testing to detect drift and failures, defined by exceeding datasheet limits. New products require less than 1% failure during burn-in, with failure analysis and corrective actions if exceeded. Sampling plans ensure defect rates below 3%. Life tests last 1000-3000 hours at 125°C depending on process maturity. Failure mechanisms include electromigration, ionic contamination, hot carrier injection, and dielectric rupture. Product sign-off requires all parties' approval after reliability confirmation. Space products undergo burn-in and quality conformance inspections with strict failure limits. Derating is unnecessary as datasheet limits are set at 6-sigma from characterization data, ensuring reliability.
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- Application NotePDF 338 KB an9867 Nov 10, 1999AI-generated Summary: Electrical parameters are monitored during life testing to detect drift and failures, defined by exceeding datasheet limits. New products require less than 1% failure during burn-in, with failure analysis and corrective actions if exceeded. Sampling plans ensure defect rates below 3%. Life tests last 1000-3000 hours at 125°C depending on process maturity. Failure mechanisms include electromigration, ionic contamination, hot carrier injection, and dielectric rupture. Product sign-off requires all parties' approval after reliability confirmation. Space products undergo burn-in and quality conformance inspections with strict failure limits. Derating is unnecessary as datasheet limits are set at 6-sigma from characterization data, ensuring reliability.
Application Notes & White Papers (1)
- Price Increase NoticePDF 360 KB PIN19011 Apr 10, 2019
- Product AdvisoryPDF 499 KB PA11003 Jan 05, 2011
- Product Change NoticePDF 230 KB PCN10123 Dec 06, 2010
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