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Radiation Hardened Dual, Inverting Power MOSFET Drivers

パッケージ情報

CADモデル:View CAD Model
Pkg. Type:CFP
Pkg. Code:KBT
Lead Count (#):16
Pkg. Dimensions (mm):10.4 x 6.9 x 0.00
Pitch (mm):1.3

環境及び輸出分類情報

Moisture Sensitivity Level (MSL)Not Applicable
Pb (Lead) FreeExempt
ECCN (US)9A515.e.1
HTS (US)8542.39.0090

製品スペック

Pkg. TypeCFP
Lead Count (#)16
Carrier TypeTray
Moisture Sensitivity Level (MSL)Not Applicable
DLA SMD5962F9951104VXC
Pb (Lead) FreeExempt
Pb Free CategoryGold Plate over compliant Undercoat-e4
MOQ25
Temp. Range (°C)-55 to +125°C
CAGE code34371
DSEE (MeV·cm2/mg)60
Die Sale Availability?No
Driver TypeLow Side
Drivers (#)2
FET TypeMOSFET
Fall Time75
FlowRH Hermetic
Input VCC (Max) (V)18
Input VCC (Min) (V)12
Length (mm)10.4
Low Side Fall Time (max) (ns)95
Low Side Rise Time (max) (ns)95
Output TypeInverting
PROTO Availability?Yes
Peak Output Current IPK (A)2
Peak Output Sink Current (A)2
Peak Output Source Current (A)2
Pitch (mm)1.3
Pkg. Dimensions (mm)10.4 x 6.9 x 0.00
Qualification LevelClass V
RatingSpace
Rise Time (Max)75
SMD URL5962-99511
TID HDR (krad(Si))300
TID LDR (krad(Si))50
Width (mm)6.9

説明

The Radiation Hardened HS-4423RH, HS-4423EH, HS-4423BRH, HS-4423BEH are inverting, dual, monolithic high-speed MOSFET drivers designed to convert TTL level signals into high current outputs at voltages up to 18V. The inputs of these devices are TTL compatible and can be directly driven by our HS-1825ARH PWM device or by our ACS/ACTS and HCS/HCTS type logic devices. The fast rise times and high current outputs allow very quick control of high gate capacitance power MOSFETs in high-frequency applications. The high current outputs minimize power losses in MOSFETs by rapidly charging and discharging the gate capacitance. The output stage incorporates a low voltage lock-out circuit that puts the outputs into a three-state mode when the supply voltage drops below 10V for the HS-4423RH, HS-4423EH and 7.5V for the HS-4423BRH and HS-4423BEH. Constructed with the Intersil dielectrically isolated Rad Hard Silicon Gate (RSG) BiCMOS process, these devices are immune to Single Event Latch-up and have been specifically designed to provide highly reliable performance in harsh radiation environments.