概要
説明
The ISL7457SRHEVAL2Z evaluation platform is designed for evaluating the ISL7457SRH radiation hardened, SEE hardened, non-inverting, quad CMOS driver.
The ISL7457SRH driver is capable of running at clock rates up to 40MHz and features 2A typical peak drive capability and a nominal ON-resistance of just 3.5Ω. The ISL7457SRH is ideal for driving highly capacitive loads, such as storage and vertical clocks in CCD applications. It is also well suited to level-shifting and clock-driving applications.
特長
- Electrically screened to SMD 5962-08230
- QML qualified per MIL-PRF-38535 requirements
- Full mil-temp range operation: TA = -55 °C to +125 °C
- Radiation hardness
- TID [50-300 rad(Si)/s]: 10krad(Si) minimum
- SEE hardness
- LET (SEL and SEB Immunity): 40MeV/mg/cm2minimum
- LET [SET = ΔVOUT < 15V, Δt< 500ns]: 40MeV/mg/cm2
- 4 channels
- Clocking speeds up to 40MHz
- 11ns/12ns typical tR/tF with 1nF Load (15V bias)
- 1ns typical rise and fall time match (15V bias)
- 1.5ns typical prop delay match (15V bias)
- Low quiescent current - < 1mA Typical
- Fast output enable function - 12ns typical (15V bias)
- Wide output voltage range
- 0V ≤ VL ≤ 8V
- 2.5V ≤ VH ≤ 16.5V
- 2A typical peak drive current (15V Bias)
- 3.5Ω typical ON-resistance (15V bias)
- Input level shifters
- 3.3V/5V CMOS compatible inputs
アプリケーション
設計・開発
サポート
ビデオ&トレーニング
The low dose rate ionizing dose response of semiconductors has become a key issue in space applications. We are addressing this changed market by introducing wafer by wafer low dose rate acceptance testing as a complement to current high dose rate acceptance testing.
Related Resources