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Features

  • Gen IV technology
  • JEDEC-qualified GaN technology
  • Dynamic RDS(on)eff production tested
  • Robust design, defined by
    • Wide gate safety margin
    • Transient over-voltage capability
  • Very low QRR
  • Reduced crossover loss
  • RoHS-compliant and Halogen-free packaging
  • Achieves increased efficiency in both hard-switched and soft-switched circuits
    • Increased power density
    • Reduced system size and weight
    • Overall lower system cost
  • Easy to drive with commonly-used gate drivers
  • GSD pin layout improves high speed design

Description

The TP65H480G4JSGB 650V 480mΩ Gallium Nitride (GaN) FET is a normally-off device built using Renesas' Gen IV platform. It combines state-of-the-art high-voltage GaN HEMT and low-voltage silicon MOSFET technologies—offering superior reliability and performance.

Renesas GaN offers improved efficiency over silicon, through lower gate charge, lower crossover loss, and smaller reverse recovery charge.

The TP65H480G4JSGB is offered in an industry-standard PQFN56 with a common source package configuration.

Parameters

AttributesValue
Qualification LevelStandard
Vds min (V)650
V(TR)DSS max (V)800
RDSON (Typ) (mΩ)480
RDSON (max) (mΩ)560
Vth typ (V)2.4
Id max @ 25°C (A)3.6
Qrr typ (nC)15.2
Qg typ (nC)5
Qoss (nC)11.6
Ron * Qoss (FOM)5568
Ciss (Typical) (pF)414
Coss (Typical) (pF)7.93
trr (Typical) (nS)17.6
Mounting TypeSurface Mount
Temp. Range (°C)-55 to +150°C

Package Options

Pkg. TypePkg. Dimensions (mm)
PQFN565 x 6

Applications

  • Consumer
  • Power adapters
  • Low-power SMPS
  • Lighting

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