Features
- Low input offset voltage: ±110µV, maximum
- Superb offset voltage TC: 1µV/°C, maximum
- Input bias current: ±5nA, maximum
- Input bias current TC: ±5pA/°C, maximum
- Low current consumption: 440µA
- Voltage noise: 8nV/Hz
- Wide supply range: 4.5V to 40V
- Operating temperature range: -55°C to +125°C
- Small package offerings in single, dual and quad
- Pb-free (RoHS compliant)
- No phase reversal
Description
The ISL28117, ISL28217, ISL28417, and ISL28417SEH are a family of very high precision amplifiers featuring low noise vs power consumption, low offset voltage, low bias current, and low temperature drift making them the ideal choice for applications requiring both high DC accuracy and AC performance. The combination of precision, low noise, and small footprint provides you with outstanding value and flexibility relative to similar competitive parts. Applications for these amplifiers include precision active filters, medical and analytical instrumentation, precision power supply controls, and industrial controls. The ISL28117 single and ISL28217 dual are offered in 8 Ld SOIC, MSOP and TDFN packages. The ISL28417 is offered in 14 Ld SOIC, 14 Ld TSSOP packages. All devices are offered in standard pin configurations and operate across the extended temperature range from -40°C to +125°C. The ISL28417SEH is offered in a 14 Ld Hermetic Ceramic Flatpack package. The device is offered in an industry standard pin configuration and operates across the extended temperature range from -55°C to +125°C.
Applications
- Precision instruments
- Medical instrumentation
- Power supply control
- Active filter blocks
- Thermocouples and RTD reference buffers
- Data acquisition
| Part Number | Status | Samples | Stock | RoHS | Package | Lead Count (#) | Carrier Type | Moisture Sensitivity Level (MSL) | Pb (Lead) Free | Pb Free Category | MOQ | Temp. Range (°C) | CAGE code |
|---|---|---|---|---|---|---|---|---|---|---|---|---|---|
| ISL28417SEHF/PROTO | Last Time Buy | Available | In Stock | Contact | CFP | 14# | Tray | Not Applicable | Exempt | Gold Plate over compliant Undercoat-e4 | 1 | -55 to +125°C | 34371 |
| ISL28417SEHMF | Last Time Buy | Available | Out of Stock | Contact | CFP | 14# | Tray | Not Applicable | Exempt | Gold Plate over compliant Undercoat-e4 | 25 | -55 to +125°C | 34371 |
| ISL28417SEHMX | Last Time Buy | Available | Out of Stock | RoHS:EN RoHS:JA | Package | Die Waffle Pack | Not Applicable | Yes | Not Applicable | 100 | -55 to +125°C | 34371 | |
| ISL28417SEHX/SAMPLE | Last Time Buy | Available | Out of Stock | Contact | Package | Die Waffle Pack | Not Applicable | Yes | Not Applicable | 5 | -40 to +85°C | 34371 |
- DatasheetPDF 2.86 MB isl28117-217-417-417seh Sep 30, 2024
- Application NotePDF 263 KB r13an0003eu0100-biasing-op-amps Dec 06, 2019AI-generated Summary: Proper biasing of operational amplifiers is essential to avoid malfunction in AC-coupled circuits. A missing DC bias path causes long stabilization times and potential failures. Adding input resistors to ground provides a DC path for bias currents, minimizing offset errors. For single-supply AC-coupled amplifiers, biasing uses a reference voltage, ideally from a high-PSRR voltage reference or buffered voltage divider, to maintain signal symmetry and reduce noise. Understanding frequency responses of input and feedback components is crucial for setting bandwidth and gain characteristics.
- Application NotePDF 224 KB an9654 May 05, 1999AI-generated Summary: The document explains the reliability and failure mechanisms of semiconductor parts, focusing on life testing and wearout. It discusses how switching states cause transient current pulses and hot carrier injection, which only occur briefly during switching. Life testing at elevated temperatures accelerates aging to remove infant mortality failures, improving reliability. The failure rate follows a bathtub curve with infant mortality, useful life, and wearout phases, modeled by lognormal and exponential distributions. The Arrhenius equation relates failure rates at different temperatures. Burn-in and life tests reduce early failures without harming intrinsic reliability.
- DatasheetPDF 2.86 MB isl28117-217-417-417seh Sep 30, 2024
Recommended Documents (1)
- DatasheetPDF 2.86 MB isl28117-217-417-417seh Sep 30, 2024
Datasheets (1)
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- Application NotePDF 263 KB r13an0003eu0100-biasing-op-amps Dec 06, 2019AI-generated Summary: Proper biasing of operational amplifiers is essential to avoid malfunction in AC-coupled circuits. A missing DC bias path causes long stabilization times and potential failures. Adding input resistors to ground provides a DC path for bias currents, minimizing offset errors. For single-supply AC-coupled amplifiers, biasing uses a reference voltage, ideally from a high-PSRR voltage reference or buffered voltage divider, to maintain signal symmetry and reduce noise. Understanding frequency responses of input and feedback components is crucial for setting bandwidth and gain characteristics.
- Application NotePDF 224 KB an9654 May 05, 1999AI-generated Summary: The document explains the reliability and failure mechanisms of semiconductor parts, focusing on life testing and wearout. It discusses how switching states cause transient current pulses and hot carrier injection, which only occur briefly during switching. Life testing at elevated temperatures accelerates aging to remove infant mortality failures, improving reliability. The failure rate follows a bathtub curve with infant mortality, useful life, and wearout phases, modeled by lognormal and exponential distributions. The Arrhenius equation relates failure rates at different temperatures. Burn-in and life tests reduce early failures without harming intrinsic reliability.
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