Features
- High-Voltage Type (20V Rating)
- Set-Reset Capability
- Static Flip-Flop Operation - Retains State Indefinitely With Clock Level Either "High" Or "Low"
- Medium-Speed Operation - 16 MHz (typ.) Clock Toggle Rate at 10V
- Standardized Symmetrical Output Characteristics
- 100% Tested for Quiescent Current at 20V
- Maximum Input Current of 1µA at 18V Over Full Package Temperature Range; 100nA at 18V and +25°C
- Noise Margin (Over Full Package Temperature Range): 1V at VDD = 5V 2V at VDD = 10V 2.5V at VDD = 15V
- 5V, 10V and 15V Parametric Ratings
- Meets All Requirements of JEDEC Tentative Standard No. 13B, "Standard Specifications for Description of 'B' Series CMOS Devices"
Description
Support is limited to customers who have already adopted these products.
CD4013BMS consists of two identical, independent data type flip-flops. Each flip-flop has independent data, set, reset, and clock inputs and Q and Q outputs. These devices can be used for shift register applications, and, by connecting Q output to the data input, for counter and toggle applications. The logic level present at the D input is transferred to the Q output during the positive going transition of the clock pulse. Setting or resetting is independent of the clock and is accomplished by a high level on the set or reset line, respectively. The CD4013BMS is supplied in these 14 lead outline packages: Braze Seal DIP H4Q Frit Seal DIP H1B Ceramic Flatpack H3W
Applications
- Registers
- Counters
- Control Circuits
| Part Number | Status | Samples | Stock | Package | Lead Count (#) | Carrier Type | DLA SMD | Pb (Lead) Free | MOQ | Temp. Range (°C) |
|---|---|---|---|---|---|---|---|---|---|---|
| CD4013BKMSR | Obsolete | N/A | Out of Stock | CFP | 14# | Tray | 5962-96622 | No | 15 | -55 to +125°C |
| CD4013BKNSR | Obsolete | N/A | Out of Stock | CFP | 14# | Tray | 5962-96622 | No | 15 | -55 to +125°C |
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- Application NotePDF 338 KB an9867 Nov 10, 1999AI-generated Summary: Electrical parameters are monitored during life testing to detect drift and failures, defined by exceeding datasheet limits. New products require less than 1% failure during burn-in, with failure analysis and corrective actions if exceeded. Sampling plans ensure defect rates below 3%. Life tests last 1000-3000 hours at 125°C depending on process maturity. Failure mechanisms include electromigration, ionic contamination, hot carrier injection, and dielectric rupture. Product sign-off requires all parties' approval after reliability confirmation. Space products undergo burn-in and quality conformance inspections with strict failure limits. Derating is unnecessary as datasheet limits are set at 6-sigma from characterization data, ensuring reliability.
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- Application NotePDF 338 KB an9867 Nov 10, 1999AI-generated Summary: Electrical parameters are monitored during life testing to detect drift and failures, defined by exceeding datasheet limits. New products require less than 1% failure during burn-in, with failure analysis and corrective actions if exceeded. Sampling plans ensure defect rates below 3%. Life tests last 1000-3000 hours at 125°C depending on process maturity. Failure mechanisms include electromigration, ionic contamination, hot carrier injection, and dielectric rupture. Product sign-off requires all parties' approval after reliability confirmation. Space products undergo burn-in and quality conformance inspections with strict failure limits. Derating is unnecessary as datasheet limits are set at 6-sigma from characterization data, ensuring reliability.
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