Overview
Description
The ISL71090SEH12EV1Z evaluation board is designed to measure the performance of the radiation hardened, ultra-low noise, high-precision ISL71090SEH12 voltage reference. The reference has a wide input voltage range from 4V to 30V and an initial accuracy of 0.05%. Its ultra-low voltage noise (1μVP-P in the 0.1Hz to 10Hz range), a maximum output voltage temperature coefficient of 10ppm/°C, and excellent radiation performance make the ISL71090SEH ideal for space applications.
Features
- Reference output voltage: 1.25V ± 0.05%
- Accuracy over temperature and radiation: ±0.15%
- Output voltage noise: 1µVP-P Typ. (0.1Hz to 10Hz)
- Supply current: 930µA (Typ.)
- Temperature coefficient (box method): 10ppm/°C Max
- Output current capability: 20mA
- Line regulation: 8ppm/V
- Operating temperature range: -55°C to +125°C
- Radiation environment
- High dose rate: (50-300rad(Si)/s): 100krad(Si)
- Low dose rate: (0.01rad(Si)/s): 100krad(Si)
- Product capability established by initial characterization. The "EH" version is acceptance tested on a wafer-by-wafer basis to 50krad(Si) at low dose rate
- SET/SEL/SEB: 86MeV•cm2/mg
Applications
Videos & Training
The low dose rate ionizing dose response of semiconductors has become a key issue in space applications. We are addressing this changed market by introducing wafer by wafer low dose rate acceptance testing as a complement to current high dose rate acceptance testing.
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