The ISL70444SEH features four low-power amplifiers optimized to provide maximum dynamic range. This operational amplifier (op amps) features a unique combination of rail-to-rail operation on the input and output as well as a slew enhanced front-end that provides ultra fast slew rates positively proportional to a given step size, thereby increasing accuracy under transient conditions, whether it's periodic or momentary. The ISL70444SEH also offers low power, low offset voltage, and low-temperature drift, making it ideal for applications requiring both high DC accuracy and AC performance. With <5µs recovery for Single Event Transients (SET) (LETTH = 86. 4MeV•cm2/mg), the number of filtering components needed is drastically reduced. The ISL70444SEH is also immune to single event latch-up because it is fabricated using the Renesas proprietary PR40 Silicon On Insulator (SOI) process. The amplifier is designed to operate over a single supply range of 2. 7V to 40V or a split supply voltage range of ±1. 35V to ±20V. Applications for this amplifier include precision instrumentation, data acquisition, precision power supply controls, and process controls. The ISL70444SEH are available in a 14 Ld hermetic ceramic flatpack and die forms that operate across the temperature range of -55°C to +125°C.


  • Electrically screened to DLA SMD# 5962-13214
  • Acceptance tested to 50krad(Si) (LDR) wafer-by-wafer
  • <5µs recovery from SEE (LETTH = 86.4MeV•cm2/mg)
  • Unity gain stable
  • Rail-to-rail input and output
  • Wide gain·bandwidth product: 19MHz
  • Wide single and dual supply range: 2.7V to 40V max
  • Low input offset voltage: 400µV
  • Low current consumption (per amplifier): 1.1mA, typ
  • No phase reversal with input overdrive
  • Slew rate - Large signal: 60V/µs
  • Operating temperature range: -55°C to +125°C
  • Radiation acceptance (see TID report)
    • High dose rate (50-300rad(Si)/s): 300krad(Si) (ISL70444SEH only)
    • Low dose rate (0.01rad(Si)/s): 50krad(Si)
  • SEE hardness (see SEE report for details)
    • SEB LETTH (VS = ±21V): 86.4MeV•cm2/mg
    • SEL immune (SOI Process)


  • Precision instruments
  • Active filter blocks
  • Data acquisition
  • Power supply control
  • Process control

tuneProduct Options

Part Number Part Status Pkg. Type Carrier Type MOQ DLA SMD Buy Sample
Active CFP Tray 1
Active CFP Tray 1 5962F1321401VXC
Active 100 5962F1321401V9A
Active DIE 5 5962F1321401V9A


Title language Type Format File Size Date
Datasheets & Errata
star ISL70444SEH, ISL73444SEH Datasheet Datasheet PDF 1.85 MB
User Guides & Manuals
ISL70444SEHEVAL1Z User Guide Guide PDF 794 KB
Application Notes & White Papers
How to Bias Op-Amps Correctly Application Note PDF 263 KB
AN1920: Reducing Power Dissipation with Saturated Outputs Application Note PDF 433 KB
Wafer by Wafer Low Dose Rate Acceptance White Paper White Paper PDF 533 KB
AN1867: ISL70444SEH SPICE Macro-Model Application Note PDF 428 KB
AN9867: End of Life Derating: A Necessity or Overkill Application Note PDF 338 KB
PA18014 - Product Advisory for ISL70x44 Products - Overconsumption Product Advisory PDF 263 KB
PCN17028 - Electrical Specification Change to Standard Microcircuit Drawing 5962-13214 for Intersil Product ISL70444SEH* Product Change Notice PDF 398 KB
Intersil Space Products Brochure Brochure PDF 3.14 MB
Standard Microcircuit Drawing 5962-13214 (ISL70444SEH, ISL73444SEH) Other 0 KB
TB516: Investigation of HTOL Effects on ISL70444SEH when Biased as a Railed Buffer Technical Brief PDF 291 KB
ISL70444SEH SEE Test Report Report PDF 5.82 MB
ISL70444SEH Neutron Test Report Report PDF 323 KB
ISL70444SEH Total Dose Test Report Report PDF 417 KB
Intersil Commercial Lab Services Brochure PDF 364 KB


Title language Type Format File Size Date
ISL70444SEH Temperature Calculator Library XLSX 170 KB
ISL70444SEH-ISL70244SEH PSPICE Model Model - Other ZIP 2.51 MB
ISL70444SEHEVAL1Z Design Files PCB Design Files ZIP 1.99 MB

memoryBoards & Kits

Part Number Title Type Company
ISL70444SEHEVAL1Z Rad Hard 40V Quad Op Amp Evaluation Board Evaluation Renesas

printNews & Additional Resources

Type Date Sort ascending
Low Dose Rate Acceptance Testing Page Mar 25, 2020
Standard Data Package Page Mar 19, 2020
Rad Hard SMD Test Flow Page Mar 19, 2020
Rad Hard Test Reports Page Mar 19, 2020