Overview
Description
Renesas Electronics Corporation
Category: Safety
This library consists of self-test software functions and guidelines to assist compliance with the IEC 61508 safety standard for industrial systems.
Industrial systems require specific testing to ensure functional safety and fail-safe operation compliance.
The diagnostics software library contains software tests for the CPU, volatile memory (user RAM), non-volatile memory (Flash ROM for code and data storage), Clock Frequency Accuracy Measurement Circuit (CAC), Independent Watchdog (IWDT), and Low Voltage Detection (LVD) module. The software routines can be implemented in any system for self-testing of Synergy S3A7 MCUs.
The routines are to be used after reset and during program execution, but can be integrated into the overall system design as desired.
Release Information
S3A7 IEC 61508 Self-Test Library 1.1
Current Public Release
Release Date: 2019-04-19
MD5: 587384c7f537fd36db6f3bf70900a9fb
Target Devices
Downloads
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| Type | Title | Date |
| Software & Tools - Software | S3A7 IEC 61508 Self-test Library v1.1
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1 item
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Documentation
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| Type | Title | Date |
| Manual - Software | PDF 560 KB | |
| Guide | PDF 1.60 MB | |
| Application Note |
PDF
3.67 MB
AI-generated Summary:
IEC 61508 defines Safety Integrity Levels (SIL) to ensure safety in electrical and electronic systems. The Renesas S3A7 MCU supports safety applications by providing hardware and software mechanisms to verify correct MCU operation. It covers external protections, hardware module settings, fault protections, communication interfaces, internal modules, and safety mechanisms at chip, module, software, and system levels. The document includes terminology, acronyms, and detailed descriptions of MCU features to meet SIL requirements.
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3 items
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