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Renesas Electronics Corporation
Radiation Hardened Low Dropout Adjustable Negative Voltage Regulator

Package Information

CAD Model:View CAD Model
Pkg. Type:CFP
Pkg. Code:KDC
Lead Count (#):28
Pkg. Dimensions (mm):17.8 x 12.7 x 0.00
Pitch (mm):1.3

Environmental & Export Classifications

Moisture Sensitivity Level (MSL)Not Applicable
Pb (Lead) Free_none
ECCN (US)9A515.e.1
HTS (US)8542.39.0090

Product Attributes

Lead Count (#)28
Carrier TypeTray
Moisture Sensitivity Level (MSL)Not Applicable
Qualification LevelClass Q
DLA SMD5962F0250301QXC
Pb (Lead) Free_none
Pb Free CategoryGold Plate over compliant Undercoat-e4
MOQ100
Temp. Range (°C)-55 to +125°C
CAGE code34371
DSEE (MeV·cm2/mg)86.4
Die Sale Availability?Yes
FlowRH Hermetic
IOUT (A)1
IOUT (Max) (mA)1000
Length (mm)17.8
Models AvailablePSPICE
Output OptionsAdjustable
Output Voltage (Max) (V)-26
Output Voltage (Min) (V)-2.25
PROTO Availability?Yes
Pitch (mm)1.3
Pkg. Dimensions (mm)17.8 x 12.7 x 0.00
Pkg. TypeCFP
RatingSpace
SMD URL5962-02503
Supply Voltage (max) (V)-3 - -3
Supply Voltage (min) (V)-30 - -30
TID HDR (krad(Si))300
TID LDR (krad(Si))Report Available
VDO @ IOUTMAX (Typ) (mV)1000
VOUT (max) (V)-2.25
VOUT (min) (V)-26
Width (mm)12.7

Description

Radiation Hardened Low Dropout Adjustable Negative Voltage Regulator The radiation hardened ISL72991RH is a low dropout adjustable negative regulator with an output voltage range of -2.25V to -26V. The device features a 1A output current capability, an adjustable current limit pin (ILIM), and a shutdown pin (SD) for easy on/off control. The device incorporates unique circuitry that enables precision performance across the -55 °C to +125 °C temperature range and post-irradiation. Specifications across the full temperature range include an internal reference voltage of -1.25V +40mV/- 50mV (maximum), line regulation of ±25mV (maximum), and load regulation of ±15mV (maximum). The reference voltage is the ADJ to GND voltage. Constructed with the Intersil dielectrically isolated Rad Hard Silicon Gate (RSG) BiCMOS process, these devices are immune to single event latch-up and have been specifically designed to provide highly reliable performance in harsh radiation environments.