Features
- Electrically screened to SMD 5962-00523
- QML qualified per MIL-PRF-38535 requirements
- EH version acceptance tested to 50krad(Si) (LDR)
- Radiation environment
- High dose rate (50-300rad(Si)/s): 300 krad(Si)
- Low dose rate (0.01rad(Si)/s): 50krad(Si)
- Latch-up immune: dielectrically isolated
- Reverse breakdown voltage (VZ): 2.5V
- Change in VZ vs current (400µA to 10mA): 6mV
- Change in VZ vs temperature (-55°C to +125°C): 15mV
- Maximum reverse breakdown current: 20mA
- Stability Criteria
- Optimum stability is achieved with CL = 10µF between V+ and V- for heavy loads
- Instability region with self-sustaining oscillations is from CL = 1nF to 3µF
- Interchangeable with 1009 and 136 industry types
Description
Support is limited to customers who have already adopted these products.
The Star*Power™ Radiation Hardened IS-1009RH, IS-1009EH are a 2.5V shunt regulator diode is designed to provide a stable 2. 5V reference over a wide current range. These devices are designed to maintain stability over the full military temperature range and over time. The 0.2% reference tolerance is achieved by on-chip trimming. An adjustment terminal is provided to allow for the calibration of system errors. The use of this terminal to adjust the reference voltage does not effect the temperature coefficient. Constructed with the Intersil dielectrically isolated EBHF process, these devices are immune to single event latch-up and have been specifically designed to provide highly reliable performance in harsh radiation environments. The IS-1009EH replaces the obsoleted IS-1009RH. Specifications for Rad Hard QML devices are controlled by the Defense Logistics Agency Land and Maritime (DLA). The SMD numbers listed here must be used when ordering. Detailed Electrical Specifications for these devices are contained in SMD 5962-00523.
Applications
- Power supply monitoring
- Reference for 5V systems
- A/D and D/A reference
| Part Number | Status | Samples | Stock | Package | Lead Count (#) | Carrier Type | Pitch (mm) | Pkg. Dimensions (mm) | DLA SMD | Pb (Lead) Free | MOQ | Temp. Range (°C) |
|---|---|---|---|---|---|---|---|---|---|---|---|---|
| IS2-1009RH-8 | Obsolete | N/A | Out of Stock | CAN | 3# | Tray | 2.5mm | 5.4 x 5.4 x 0.00 | 5962-00523 | No | 15 | -55 to +125°C |
| ISYE-1009RH-8 | Obsolete | N/A | Out of Stock | CLCC | 3# | Tube | 3.8mm | 10.2 x 7.5 x 2.97 | 5962-00523 | No | 25 | -55 to +125°C |
| ISYE-1009RH-Q | Obsolete | N/A | Out of Stock | CLCC | 3# | Tube | 3.8mm | 10.2 x 7.5 x 2.97 | 5962-00523 | No | 25 | -55 to +125°C |
Filters
Applied Filters
- End Of Life NoticePDF 270 KB PLC14054 Nov 26, 2014
- Product AdvisoryPDF 93 KB PA11085 Aug 25, 2011
- Product AdvisoryPDF 499 KB PA11003 Jan 05, 2011
- Product AdvisoryPDF 67 KB PA10098 Oct 21, 2010
- Application NotePDF 338 KB an9867 Nov 10, 1999AI-generated Summary: Electrical parameters are monitored during life testing to detect drift and failures, defined by exceeding datasheet limits. New products require less than 1% failure during burn-in, with failure analysis and corrective actions if exceeded. Sampling plans ensure defect rates below 3%. Life tests last 1000-3000 hours at 125°C depending on process maturity. Failure mechanisms include electromigration, ionic contamination, hot carrier injection, and dielectric rupture. Product sign-off requires all parties' approval after reliability confirmation. Space products undergo burn-in and quality conformance inspections with strict failure limits. Derating is unnecessary as datasheet limits are set at 6-sigma from characterization data, ensuring reliability.
- Application NotePDF 224 KB an9654 May 05, 1999AI-generated Summary: The document explains the reliability and failure mechanisms of semiconductor parts, focusing on life testing and wearout. It discusses how switching states cause transient current pulses and hot carrier injection, which only occur briefly during switching. Life testing at elevated temperatures accelerates aging to remove infant mortality failures, improving reliability. The failure rate follows a bathtub curve with infant mortality, useful life, and wearout phases, modeled by lognormal and exponential distributions. The Arrhenius equation relates failure rates at different temperatures. Burn-in and life tests reduce early failures without harming intrinsic reliability.
Recommended Documents (1)
Datasheets (1)
No Results Found.
Make sure all keywords are spelled correctly.
Try fewer, different, or more general terms to vary your search.
If you have filters applied, consider deselecting some to broaden your results.
- Search our extensive knowledgebase, designed to help customers with their FAQs.
- Get help from our expert Renesas technical staff and community on our support forums.
- Application NotePDF 338 KB an9867 Nov 10, 1999AI-generated Summary: Electrical parameters are monitored during life testing to detect drift and failures, defined by exceeding datasheet limits. New products require less than 1% failure during burn-in, with failure analysis and corrective actions if exceeded. Sampling plans ensure defect rates below 3%. Life tests last 1000-3000 hours at 125°C depending on process maturity. Failure mechanisms include electromigration, ionic contamination, hot carrier injection, and dielectric rupture. Product sign-off requires all parties' approval after reliability confirmation. Space products undergo burn-in and quality conformance inspections with strict failure limits. Derating is unnecessary as datasheet limits are set at 6-sigma from characterization data, ensuring reliability.
- Application NotePDF 224 KB an9654 May 05, 1999AI-generated Summary: The document explains the reliability and failure mechanisms of semiconductor parts, focusing on life testing and wearout. It discusses how switching states cause transient current pulses and hot carrier injection, which only occur briefly during switching. Life testing at elevated temperatures accelerates aging to remove infant mortality failures, improving reliability. The failure rate follows a bathtub curve with infant mortality, useful life, and wearout phases, modeled by lognormal and exponential distributions. The Arrhenius equation relates failure rates at different temperatures. Burn-in and life tests reduce early failures without harming intrinsic reliability.
Application Notes & White Papers (2)
- End Of Life NoticePDF 270 KB PLC14054 Nov 26, 2014
- Product AdvisoryPDF 93 KB PA11085 Aug 25, 2011
- Product AdvisoryPDF 499 KB PA11003 Jan 05, 2011
- Product AdvisoryPDF 67 KB PA10098 Oct 21, 2010
Product Notices (PCN, EOL, etc) (4)
No Results Found.
Make sure all keywords are spelled correctly.
Try fewer, different, or more general terms to vary your search.
If you have filters applied, consider deselecting some to broaden your results.
- Search our extensive knowledgebase, designed to help customers with their FAQs.
- Get help from our expert Renesas technical staff and community on our support forums.
No Results Found.
Make sure all keywords are spelled correctly.
Try fewer, different, or more general terms to vary your search.
If you have filters applied, consider deselecting some to broaden your results.
- Search our extensive knowledgebase, designed to help customers with their FAQs.
- Get help from our expert Renesas technical staff and community on our support forums.
No Results Found.
Make sure all keywords are spelled correctly.
Try fewer, different, or more general terms to vary your search.
If you have filters applied, consider deselecting some to broaden your results.
- Search our extensive knowledgebase, designed to help customers with their FAQs.
- Get help from our expert Renesas technical staff and community on our support forums.
No Results Found.
Make sure all keywords are spelled correctly.
Try fewer, different, or more general terms to vary your search.
If you have filters applied, consider deselecting some to broaden your results.
- Search our extensive knowledgebase, designed to help customers with their FAQs.
- Get help from our expert Renesas technical staff and community on our support forums.
No Results Found.
Make sure all keywords are spelled correctly.
Try fewer, different, or more general terms to vary your search.
If you have filters applied, consider deselecting some to broaden your results.
- Search our extensive knowledgebase, designed to help customers with their FAQs.
- Get help from our expert Renesas technical staff and community on our support forums.
No Results Found.
Make sure all keywords are spelled correctly.
Try fewer, different, or more general terms to vary your search.
If you have filters applied, consider deselecting some to broaden your results.
- Search our extensive knowledgebase, designed to help customers with their FAQs.
- Get help from our expert Renesas technical staff and community on our support forums.
Marketing Collateral (2)
Other (3)
No Results Found.
Make sure all keywords are spelled correctly.
Try fewer, different, or more general terms to vary your search.
If you have filters applied, consider deselecting some to broaden your results.
- Search our extensive knowledgebase, designed to help customers with their FAQs.
- Get help from our expert Renesas technical staff and community on our support forums.