Features
- This circuit is processed in accordance to MIL-STD-883 and is fully conformant under the provisions of Paragraph 1.2.1
- Fast Response Time (+25°C)
- Maximum . . . . . . . . . . . . . . . . . . . . . . . . . 215ns
- Typical . . . . . . . . . . . . . . . . . . . . . . . . . . .180ns
- Low Offset Voltage (+25°C)
- Maximum . . . . . . . . . . . . . . . . . . . . . . . . . 5.0mV
- Typical . . . . . . . . . . . . . . . . . . . . . . . . . . . 2.0mV
- Low Input Sensitivity
- Maximum . . . . . . . . . . . . . . . . . . . . . . . . . 0.5mV
- Typical . . . . . . . . . . . . . . . . . . . . . . . . . . 0.05mV
- Low Offset Current (+25°C)
- Maximum . . . . . . . . . . . . . . . . . . . . . . . . . .35nA
- Typical . . . . . . . . . . . . . . . . . . . . . . . . . . . 10nA
- Single or Dual Voltage Supply Operation
- Selectable Output Logic Levels
- Active Pull-Up/Pull-Down Output Circuit. No External Resistors Required
Description
The HA-4902/883 is a monolithic, quad, precision comparator offering fast response time, low offset voltage, low offset current and virtually no channel-to-channel crosstalk for applications requiring accurate, High-Speed, signal level detection. This comparator can sense signals at ground level while being operated from either a single +5V supply (digital systems) or from dual supplies (analog networks) up to ±15V. The HA-4902/883 contains a unique current driven output stage which can be connected to logic system supplies (VLOGIC+ and VLOGIC-) to make the output levels directly compatible (no external components needed) with any standard logic or special system logic levels. In combination analog/digital systems, the design employed in the HA-4902/883 input and output stages prevents troublesome ground coupling of signals between analog and digital portions of the system. This comparators’ combination of features make it an ideal component for signal detection and processing in data acquisition systems, test equipment and microprocessor/analog signal interface networks.
Parameters
| Attributes | Value |
|---|---|
| Rating | MIL-STD-883 |
| Comparator Type | Quad |
| Input Offset Voltage Vio (Max) (mV (±)) | 5 |
| Response Time (max) (ns) | 200 |
| Supply Voltage (min) (V) | -15 - -15 |
| Supply Voltage (max) (V) | 15 - 15 |
| Temp. Range (°C) | -55 to +125°C |
| Flow | Harsh Environment & MIL-STD-883 |
| Qualification Level | Class Q |
| Die Sale Availability? | No |
| PROTO Availability? | No |
Package Options
| Pkg. Type | Pkg. Dimensions (mm) | Lead Count (#) | Pitch (mm) |
|---|---|---|---|
| CERDIP | 19.3 x 7.3 x 0.00 | 16 | 2.5 |
Applications
- Threshold Detector
- Zero Crossing Detector
- Window Detector
- Analog Interfaces for Microprocessors
- High Stability Oscillators
- Logic System Interfaces
| Part Number | Status | Samples | Stock | Package | Lead Count (#) | Carrier Type | Moisture Sensitivity Level (MSL) | Pitch (mm) | Pkg. Dimensions (mm) | Pb (Lead) Free | Pb Free Category | MOQ | Temp. Range (°C) | CAGE code |
|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|
| HA1-4902/883 | Active | Available | In Stock | CERDIP | 16# | Tube | Not Applicable | 2.5mm | 19.3 x 7.3 x 0.00 | No | Hot Solder Dip | 100 | -55 to +125°C | 34371 |
| 5962-86860012A | Obsolete | N/A | Out of Stock | CLCC | 20# | Tube | Not Applicable | 1.3mm | 8.9 x 8.9 x 0.00 | No | Hot Solder Dip | 112 | -55 to +125°C | 34371 |
| 5962-8686001EA | Obsolete | N/A | Out of Stock | CERDIP | 16# | Tube | Not Applicable | 2.5mm | 19.3 x 7.3 x 0.00 | No | Hot Solder Dip | 100 | -55 to +125°C | 34371 |
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- Product Change NoticePDF 260 KB PCN16087 Sep 30, 2016
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- Application NotePDF 357 KB an1694 Jan 19, 2004AI-generated Summary: The document outlines the four fundamental internal blocks of an operational amplifier and presents a simple 2:1 stage circuit diagram. It includes important legal notices from Renesas Electronics regarding the use, liability, and intellectual property rights of their semiconductor products. The document clarifies product quality grades, intended applications, and restrictions on use in life-critical or hazardous systems. It emphasizes compliance with applicable laws and safety responsibilities when using Renesas products. Contact information for Renesas sales offices worldwide is also provided.
- Application NotePDF 338 KB an9867 Nov 10, 1999AI-generated Summary: Electrical parameters are monitored during life testing to detect drift and failures, defined by exceeding datasheet limits. New products require less than 1% failure during burn-in, with failure analysis and corrective actions if exceeded. Sampling plans ensure defect rates below 3%. Life tests last 1000-3000 hours at 125°C depending on process maturity. Failure mechanisms include electromigration, ionic contamination, hot carrier injection, and dielectric rupture. Product sign-off requires all parties' approval after reliability confirmation. Space products undergo burn-in and quality conformance inspections with strict failure limits. Derating is unnecessary as datasheet limits are set at 6-sigma from characterization data, ensuring reliability.
- Application NotePDF 224 KB an9654 May 05, 1999AI-generated Summary: The document explains the reliability and failure mechanisms of semiconductor parts, focusing on life testing and wearout. It discusses how switching states cause transient current pulses and hot carrier injection, which only occur briefly during switching. Life testing at elevated temperatures accelerates aging to remove infant mortality failures, improving reliability. The failure rate follows a bathtub curve with infant mortality, useful life, and wearout phases, modeled by lognormal and exponential distributions. The Arrhenius equation relates failure rates at different temperatures. Burn-in and life tests reduce early failures without harming intrinsic reliability.
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- Application NotePDF 357 KB an1694 Jan 19, 2004AI-generated Summary: The document outlines the four fundamental internal blocks of an operational amplifier and presents a simple 2:1 stage circuit diagram. It includes important legal notices from Renesas Electronics regarding the use, liability, and intellectual property rights of their semiconductor products. The document clarifies product quality grades, intended applications, and restrictions on use in life-critical or hazardous systems. It emphasizes compliance with applicable laws and safety responsibilities when using Renesas products. Contact information for Renesas sales offices worldwide is also provided.
- Application NotePDF 338 KB an9867 Nov 10, 1999AI-generated Summary: Electrical parameters are monitored during life testing to detect drift and failures, defined by exceeding datasheet limits. New products require less than 1% failure during burn-in, with failure analysis and corrective actions if exceeded. Sampling plans ensure defect rates below 3%. Life tests last 1000-3000 hours at 125°C depending on process maturity. Failure mechanisms include electromigration, ionic contamination, hot carrier injection, and dielectric rupture. Product sign-off requires all parties' approval after reliability confirmation. Space products undergo burn-in and quality conformance inspections with strict failure limits. Derating is unnecessary as datasheet limits are set at 6-sigma from characterization data, ensuring reliability.
- Application NotePDF 224 KB an9654 May 05, 1999AI-generated Summary: The document explains the reliability and failure mechanisms of semiconductor parts, focusing on life testing and wearout. It discusses how switching states cause transient current pulses and hot carrier injection, which only occur briefly during switching. Life testing at elevated temperatures accelerates aging to remove infant mortality failures, improving reliability. The failure rate follows a bathtub curve with infant mortality, useful life, and wearout phases, modeled by lognormal and exponential distributions. The Arrhenius equation relates failure rates at different temperatures. Burn-in and life tests reduce early failures without harming intrinsic reliability.
Application Notes & White Papers (3)
- Product Change NoticePDF 260 KB PCN16087 Sep 30, 2016
- Product Change NoticePDF 323 KB PCN15064 Dec 22, 2015
- Product Change NoticePDF 174 KB PCN14017 Apr 21, 2014
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