Features
- This Circuit is Processed in Accordance to MIL-STD-883 and is Fully Conformant Under the Provisions of Paragraph 1.2.1.
- ON-Resistance <35ΩMax
- Low Power Consumption (PD <35mW)
- Fast Switching Action
- tON <175ns
- tOFF <145ns
- Low Charge Injection
- Upgrade from DG211/DG212
- TTL, CMOS Compatible
- Single or Split Supply Operation
Description
The DG411/883 series monolithic CMOS analog switches are drop-in replacements for the popular DG211 and DG212 series devices. They include four independent single pole throw (SPST) analog switches, and TTL and CMOS compatible digital inputs. These switches feature lower analog ON-resistance (35Ω) and faster switch time (tON 175ns) compared to the DG211 or DG212. Charge injection has been reduced, simplifying sample and hold applications. The improvements in the DG411/883 series are made possible by using a high voltage silicon-gate process. An epitaxial layer prevents the latch-up associated with older CMOS technologies. The 44V maximum voltage range permits controlling 40VP-P signals. The power supplies may be single-ended from +5V to +34V, or split from ±5V to ±20V. The four switches are bilateral, equally matched for AC or bidirectional signals. The ON-resistance variation with analog signals is quite low over a ±15V analog input range. This permits independent control of turn-on and turn-off times for SPDT configurations, permitting “break-before-make” or “make-before-break” operation with a minimum of external logic.
Parameters
| Attributes | Value |
|---|---|
| Rating | MIL-STD-883 |
| Switches (#) | 4 |
| RON (max) (ohms) | 25 |
| Supply Voltage (min) (V) | -20 - -20 |
| Supply Voltage (max) (V) | 20 - 20 |
| Turn-Off Time (max) (ns) | 160 |
| Turn-On Time (max) (ns) | 400 |
| Temp. Range (°C) | -55 to +125°C |
| Flow | Harsh Environment & MIL-STD-883 |
| Qualification Level | Class Q |
| Die Sale Availability? | No |
Package Options
| Pkg. Type | Pkg. Dimensions (mm) | Lead Count (#) | Pitch (mm) |
|---|---|---|---|
| CERDIP | 19.3 x 7.3 x 0.00 | 16 | 2.5 |
Applications
- Audio Switching
- Battery Operated Systems
- Data Acquisition
- Hi-Rel Systems
- Sample and Hold Circuits
- Communication Systems
- Automatic Test Equipment
| Part Number | Status | Samples | Stock | Package | Lead Count (#) | Carrier Type | Moisture Sensitivity Level (MSL) | Pb (Lead) Free | Pb Free Category | MOQ | Temp. Range (°C) | CAGE code |
|---|---|---|---|---|---|---|---|---|---|---|---|---|
| 5962-9073101MEA | Active | Available | In Stock | CERDIP | 16# | Tube | Not Applicable | No | Hot Solder Dip | 1000 | -55 to +125°C | 34371 |
| DG411AK/883 | Active | Available | Out of Stock | CERDIP | 16# | Tube | Not Applicable | No | Hot Solder Dip | 500 | -55 to +125°C | 34371 |
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- Product Change NoticePDF 214 KB PCN16001 Jan 08, 2016
- Product Change NoticePDF 323 KB PCN15064 Dec 22, 2015
- Product Change NoticePDF 174 KB PCN14017 Apr 21, 2014
- Product Change NoticePDF 77 KB PCN12045 Jun 13, 2012
- Product Change NoticePDF 127 KB PCN12005 Jan 13, 2012
- Product Change NoticePDF 151 KB PCN11040 Apr 07, 2011
- Application NotePDF 843 KB an535 Jun 05, 2002AI-generated Summary: A Data Acquisition System (DAS) requires careful design of signal conditioning, transducer selection, and signal transmission to ensure high accuracy. Signal conditioning includes multiplexing, amplification, filtering, and calibration, ideally performed near the transducer. Transducers convert physical variables to electrical signals, often voltage, with low source resistance preferred. Signal paths can be single-ended or differential; differential paths better reject common mode noise, especially for low-level signals. Shielded twisted pairs and balanced lines reduce interference. Filters, typically Butterworth low-pass, prevent aliasing and maintain signal integrity.
- Application NotePDF 468 KB an557 May 24, 2002AI-generated Summary: The document details recommended test procedures for analog switches, focusing on key parameters such as crosstalk, break-before-make delay, and settling time. It explains how to measure crosstalk using decibel ratios and outlines the importance of break-before-make delay to prevent simultaneous switch closure. Settling time is measured to ensure output stability after input changes. It also covers input thresholds, leakage currents, power dissipation, and various switch capacitances, providing test circuit examples and conditions for accurate measurement.
- Application NotePDF 224 KB an9654 May 05, 1999AI-generated Summary: The document explains the reliability and failure mechanisms of semiconductor parts, focusing on life testing and wearout. It discusses how switching states cause transient current pulses and hot carrier injection, which only occur briefly during switching. Life testing at elevated temperatures accelerates aging to remove infant mortality failures, improving reliability. The failure rate follows a bathtub curve with infant mortality, useful life, and wearout phases, modeled by lognormal and exponential distributions. The Arrhenius equation relates failure rates at different temperatures. Burn-in and life tests reduce early failures without harming intrinsic reliability.
- Application NotePDF 300 KB an1034 Nov 20, 1998AI-generated Summary: The document discusses the use of analog switches and multiplexers in wideband applications, highlighting the HI-524 monolithic wideband CMOS multiplexer and the HA-2541 amplifier. It emphasizes the importance of unity gain stability, fast settling time, and output swing for driving coaxial cables. The HI-524 includes feedback resistance to minimize offset voltage. Proper layout is crucial to avoid feedthrough and excessive capacitance. The document also outlines Renesas Electronics' disclaimers on product use, quality grades, safety responsibilities, environmental compliance, and legal restrictions.
- Application NotePDF 270 KB an520 Nov 20, 1998AI-generated Summary: Adding a pull-up resistor from CMOS inputs to +5V is essential when interfacing TTL outputs with CMOS inputs to improve interchangeability, noise immunity, compatibility, and reliability. A 2kΩ resistor is generally sufficient. CMOS inputs are compatible with CMOS logic at 5V to 15V without pull-ups. Mechanical switches require pull-up or pull-down resistors to prevent noise and contact issues. Renesas disclaims liability for misuse and emphasizes adherence to product specifications and legal regulations.
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- Application NotePDF 843 KB an535 Jun 05, 2002AI-generated Summary: A Data Acquisition System (DAS) requires careful design of signal conditioning, transducer selection, and signal transmission to ensure high accuracy. Signal conditioning includes multiplexing, amplification, filtering, and calibration, ideally performed near the transducer. Transducers convert physical variables to electrical signals, often voltage, with low source resistance preferred. Signal paths can be single-ended or differential; differential paths better reject common mode noise, especially for low-level signals. Shielded twisted pairs and balanced lines reduce interference. Filters, typically Butterworth low-pass, prevent aliasing and maintain signal integrity.
- Application NotePDF 468 KB an557 May 24, 2002AI-generated Summary: The document details recommended test procedures for analog switches, focusing on key parameters such as crosstalk, break-before-make delay, and settling time. It explains how to measure crosstalk using decibel ratios and outlines the importance of break-before-make delay to prevent simultaneous switch closure. Settling time is measured to ensure output stability after input changes. It also covers input thresholds, leakage currents, power dissipation, and various switch capacitances, providing test circuit examples and conditions for accurate measurement.
- Application NotePDF 224 KB an9654 May 05, 1999AI-generated Summary: The document explains the reliability and failure mechanisms of semiconductor parts, focusing on life testing and wearout. It discusses how switching states cause transient current pulses and hot carrier injection, which only occur briefly during switching. Life testing at elevated temperatures accelerates aging to remove infant mortality failures, improving reliability. The failure rate follows a bathtub curve with infant mortality, useful life, and wearout phases, modeled by lognormal and exponential distributions. The Arrhenius equation relates failure rates at different temperatures. Burn-in and life tests reduce early failures without harming intrinsic reliability.
- Application NotePDF 300 KB an1034 Nov 20, 1998AI-generated Summary: The document discusses the use of analog switches and multiplexers in wideband applications, highlighting the HI-524 monolithic wideband CMOS multiplexer and the HA-2541 amplifier. It emphasizes the importance of unity gain stability, fast settling time, and output swing for driving coaxial cables. The HI-524 includes feedback resistance to minimize offset voltage. Proper layout is crucial to avoid feedthrough and excessive capacitance. The document also outlines Renesas Electronics' disclaimers on product use, quality grades, safety responsibilities, environmental compliance, and legal restrictions.
- Application NotePDF 270 KB an520 Nov 20, 1998AI-generated Summary: Adding a pull-up resistor from CMOS inputs to +5V is essential when interfacing TTL outputs with CMOS inputs to improve interchangeability, noise immunity, compatibility, and reliability. A 2kΩ resistor is generally sufficient. CMOS inputs are compatible with CMOS logic at 5V to 15V without pull-ups. Mechanical switches require pull-up or pull-down resistors to prevent noise and contact issues. Renesas disclaims liability for misuse and emphasizes adherence to product specifications and legal regulations.
Application Notes & White Papers (5)
- Product Change NoticePDF 214 KB PCN16001 Jan 08, 2016
- Product Change NoticePDF 323 KB PCN15064 Dec 22, 2015
- Product Change NoticePDF 174 KB PCN14017 Apr 21, 2014View More (8)
Product Notices (PCN, EOL, etc) (8)
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