The ISL72814SEH and ISL73814SEH are radiation hardened high-voltage, high-current, driver circuit ICs fabricated using the Renesas proprietary PR40 Silicon-on-Insulator (SOI) process technology to mitigate single-event effects. The devices integrate 16 driver channels that feature a high-voltage (42V), high-current (700mA) open-emitter PNP output stage. To further reduce solution size, the ISL72814SEH and ISL73814SEH integrate a 4-bit, 16-channel decoder with Enable. This conveniently allows you to select 1 of 16 available driver channels or disable all channels. The inputs to the decoder are TTL and CMOS compatible, allowing an easy interface to FPGAs and microprocessors. The ISL7x814SEH devices operate across the military temperature range from -55 °C to +125 °C and are available in a 28 lead hermetically sealed Ceramic Dual Flatpack (CDFP) package or die.

Features

  • Electrically screened to DLA SMD 5962-18221
  • Integrated 4-bit to 16-channel decoder
  • High current outputs: 700mA
  • High voltage outputs: 42V
  • Ultra-low saturation voltage: 1.35V maximum at 500mA
  • Internal clamping diodes for inductive loads
  • Wide operating VCC supply range 3V to 13.2V
  • Full military temperature range operation
    • TA = -55 °C to +125 °C
    • TJ = -55 °C to +150 °C
  • Radiation acceptance testing - ISL72814SEH
    • HDR (50-300rad(Si)/s): 100krad(Si)
    • LDR (0.01rad(Si)/s): 75krad(Si)
  • Radiation acceptance testing - ISL73814SEH: LDR (0.01rad(Si)/s): 75krad(Si)
  • SEE hardness (see SEE report for details): No SEB/SEL LETTH, VCH = 34V: 86MeV•cm2/mg

tuneProduct Options

Part Number Part Status Pkg. Type Carrier Type DLA SMD Buy Sample
Active CFP Tray
Availability
Active CFP Tray 5962L1822102VXC
Availability
Active DIE 5962L1822102VXC
Availability

descriptionDocumentation

Title language Type Format File Size Date
Datasheets & Errata
star ISL72814SEH, ISL73814SEH Datasheet Datasheet PDF 787 KB
Application Notes & White Papers
Wafer by Wafer Low Dose Rate Acceptance White Paper White Paper PDF 533 KB
AN9867: End of Life Derating: A Necessity or Overkill Application Note PDF 338 KB
Other
Intersil Space Products Brochure Brochure PDF 3.14 MB
Standard Microcircuit Drawing 5962-18221 (ISL72814SEH, ISL73814SEH) Other 0 KB
ISL72814SEH, ISL73814SEH Total Dose Test Report Report PDF 357 KB
ISL7x814SEH SEE Test Report Report PDF 574 KB

file_downloadDownloads

Title language Type Format File Size Date
Models
ISL72814SEH PSPICE Model Model - Other ZIP 86 KB

printNews & Additional Resources

Type Date Sort ascending
Low Dose Rate Acceptance Testing Page Mar 25, 2020
Standard Data Package Page Mar 19, 2020
Rad Hard SMD Test Flow Page Mar 19, 2020
Rad Hard Test Reports Page Mar 19, 2020