Features
- ARlNC Specification 429 Compatible
- Data Rates of 100 Kilobits or 12.5 Kilobits
- Separate Receiver and Transmitter Section
- Dual and Independent Receivers, Connecting Directly to ARINC Bus
- Serial to Parallel Receiver Data Conversion
- Parallel to Serial Transmitter Data Conversion
- Word Lengths of 25 or 32 Bits
- Parity Status of Received Data
- Generate Parity of Transmitter Data
- Automatic Word Gap Timer
- Single 5V Supply
- Low Power Dissipation
- Full Military Temperature Range
Description
The HS-3282 is a high performance CMOS bus interface circuit that is intended to meet the requirements of ARINC Specification 429, and similar encoded, time multiplexed serial data protocols. This device is intended to be used with the HS-3182, a monolithic Dl bipolar differential line driver designed to meet the specifications of ARINC 429. The ARINC 429 bus interface circuit consists of two (2) receivers and a transmitter operating independently as shown in Figure 1. The two receivers operate at a frequency that is ten (10) times the receiver data rate, which can be the same or different from the transmitter data rate. Although the two receivers operate at the same frequency, they are functionally independent and each receives serial data asynchronously. The transmitter section of the ARINC bus interface circuit consists mainly of a First-In First-Out (FIFO) memory and timing circuit. The FIFO memory is used to hold up to eight (8) ARINC data words for transmission serially. The timing circuit is used to correctly separate each ARINC word as required by ARINC Specification 429. Even though ARINC Specification 429 specifies a 32-bit word, including parity, the HS-3282 can be programmed to also operate with a word length of 25 bits. The incoming receiver data word parity is checked, and a parity status is stored in the receiver latch and output on Pin BD08 during the 1st word. [A logic 0 indicates that an odd number of logic 1 s were received and stored; a logic 1 indicates that an even number of logic 1s were received and stored]. In the transmitter the parity generator will generate either odd or even parity depending upon the status of PARCK control signal. A logic 0 on BD12 will cause odd parity to be used in the output data stream. Versatility is provided in both the transmitter and receiver by the external clock input which allows the bus interface circuit to operate at data rates from 0 to 100 kilobits. The external clock must be ten (10) times the data rate to insure no data ambiguity. The ARINC bus interface circuit is fully guaranteed to support the data rates of ARINC specification 429 over both the voltage (±5%) and full military temperature range. It interfaces with UL, CMOS or NMOS support circuitry, and uses the standard 5-volt VCC supply.
Parameters
| Attributes | Value |
|---|---|
| Rating | Harsh Environment |
| Data Frame Length | 25-Bit or 32-Bit Word |
| Temp. Range (°C) | -55 to +125°C |
| Flow | Harsh Environment & MIL-STD-883 |
| Qualification Level | QML Class Q (military) |
| Die Sale Availability? | No |
| PROTO Availability? | No |
| Part Number | Status | Samples | Stock | Package | Lead Count (#) | Carrier Type | Moisture Sensitivity Level (MSL) | Pitch (mm) | Pkg. Dimensions (mm) | Pb (Lead) Free | Pb Free Category | MOQ | Temp. Range (°C) |
|---|---|---|---|---|---|---|---|---|---|---|---|---|---|
| 5962-8688001QA | Active | Available | Out of Stock | CERDIP | 40# | Tube | Not Applicable | 2.5mm | 52.1 x 13.2 x 0.00 | No | Hot Solder Dip | 45 | -55 to +125°C |
| HS1-3282-8 | Active | Available | In Stock | CERDIP | 40# | Tube | Not Applicable | 2.5mm | 52.1 x 13.2 x 0.00 | No | Hot Solder Dip | 135 | -55 to +125°C |
| HS4-3282-8 | Active | Available | In Stock | CLCC | 44# | Tube | Not Applicable | 1.3mm | 16.5 x 16.5 x 0.00 | No | Hot Solder Dip | 60 | -55 to +125°C |
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- Product Change Notice
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- Product Change NoticePDF 323 KB PCN15064 Dec 22, 2015
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- Product Change NoticePDF 174 KB PCN14017 Apr 21, 2014
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- BrochurePDF 5.23 MB R18CS0003EJ0200 Rev.2.00 Jan 18, 2012
- Product Change NoticePDF 134 KB PCN11041 Apr 07, 2011
- Product Change NoticePDF 147 KB PCN11039 Apr 07, 2011
- Product Change NoticePDF 151 KB PCN11040 Apr 07, 2011
- Application NotePDF 279 KB an400 Dec 21, 2001AI-generated Summary: The HS-3282 ARINC bus interface circuit uses specific address decoding for transmitter FIFO and receiver latches, allowing overlapping read/write addresses without conflict. It supports interrupt requests for efficient data transmission and reception. A simple host driver algorithm manages data buffering and FIFO loading. The device adapts to 8-bit data buses using additional latches and logic, enabling 16-bit transfers via two 8-bit operations. The HS-3282 is versatile for high-speed, reliable communications, suitable for scientific and real-time applications. ARINC Specification 429 standardizes digital data transfer in avionics using 32-bit words over a differential bus, ensuring compatibility across systems.
Recommended Documents (1)
Datasheets (1)
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- Application NotePDF 279 KB an400 Dec 21, 2001AI-generated Summary: The HS-3282 ARINC bus interface circuit uses specific address decoding for transmitter FIFO and receiver latches, allowing overlapping read/write addresses without conflict. It supports interrupt requests for efficient data transmission and reception. A simple host driver algorithm manages data buffering and FIFO loading. The device adapts to 8-bit data buses using additional latches and logic, enabling 16-bit transfers via two 8-bit operations. The HS-3282 is versatile for high-speed, reliable communications, suitable for scientific and real-time applications. ARINC Specification 429 standardizes digital data transfer in avionics using 32-bit words over a differential bus, ensuring compatibility across systems.
- Application NotePDF 224 KB an9654 May 05, 1999AI-generated Summary: The document explains the reliability and failure mechanisms of semiconductor parts, focusing on life testing and wearout. It discusses how switching states cause transient current pulses and hot carrier injection, which only occur briefly during switching. Life testing at elevated temperatures accelerates aging to remove infant mortality failures, improving reliability. The failure rate follows a bathtub curve with infant mortality, useful life, and wearout phases, modeled by lognormal and exponential distributions. The Arrhenius equation relates failure rates at different temperatures. Burn-in and life tests reduce early failures without harming intrinsic reliability.
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- Product Change Notice
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- Product Change NoticePDF 323 KB PCN15064 Dec 22, 2015
Product Notices (PCN, EOL, etc) (9)
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Support Communities
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Clock frequency tolerance required
hs-3282.pdf Hi, We used HS4-3282-8 in one of our designs. The clock required for this part is 1MHZ. can you provide the allowed tolerance of this clock frequency? I am currently working on a crystal aging analysis that demonstrates that the crystal frequency drift is acceptable ...
Apr 30, 2024