Features
- This Circuit is Processed in Accordance to MIL-STD- 883 and is Fully Conformant Under the Provisions of Paragraph 1.2.1.
- Low Power Standby 125µW Max
- Low Power Operation 35mW/MHz Max
- Data Retention at 2.0V Min
- TTL Compatible Input/Output
- Common Data Input/Output
- Three-State Output
- Standard JEDEC Pinout
- Fast Access Time 120/200ns Max
- 18 Pin Package for High Density
- Gated Inputs - No Pull Up or Pull Down Resistors Required
- On-Chip Address Register
Description
The HM-6514/883 is a 1024 x 4 static CMOS RAM fabricated using self-aligned silicon gate technology. The device utilizes synchronous circuitry to achieve high performance and low power operation. On chip latches are provided for addresses allowing efficient interfacing with microprocessor systems. The data output can be forced to a high impedance state for use in expanded memory arrays. Gated inputs allow lower operating current and also eliminates the need for pull up or pull down resistors. The HM-6514/883 is fully static RAM and may be maintained in any state for an indefinite period of time. Data retention supply voltage and supply current are guaranteed over temperature.
Parameters
| Attributes | Value |
|---|---|
| Rating | MIL-STD-883 |
| Temp. Range (°C) | -55 to +125°C |
| Flow | Harsh Environment & MIL-STD-883 |
| Qualification Level | Class Q |
| Die Sale Availability? | No |
| PROTO Availability? | No |
Package Options
| Pkg. Type | Pkg. Dimensions (mm) | Lead Count (#) | Pitch (mm) |
|---|---|---|---|
| CERDIP | 22.6 x 7.3 x 0.00 | 18 | 2.5 |
| Part Number | Status | Samples | Stock | Package | Lead Count (#) | Carrier Type | Moisture Sensitivity Level (MSL) | Pb (Lead) Free | Pb Free Category | MOQ | Temp. Range (°C) | CAGE code |
|---|---|---|---|---|---|---|---|---|---|---|---|---|
| HM1-6514/883 | Active | N/A | In Stock | CERDIP | 18# | Tube | Not Applicable | No | Hot Solder Dip | 200 | -55 to +125°C | 34371 |
| HM1-6514B/883 | Active | N/A | In Stock | CERDIP | 18# | Tube | Not Applicable | No | Hot Solder Dip | 120 | -55 to +125°C | 34371 |
| 24502BVA | Obsolete | N/A | Out of Stock | CERDIP | 18# | Tube | No | 40 | -55 to +125°C | 34371 |
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- Product Change NoticePDF 323 KB PCN15064 Dec 22, 2015
- End Of Life NoticePDF 200 KB PLC15033 Jun 11, 2015
- Product Change NoticePDF 174 KB PCN14017 Apr 21, 2014
- Product Change NoticePDF 151 KB PCN11040 Apr 07, 2011
- Application NotePDF 224 KB an9654 May 05, 1999AI-generated Summary: The document explains the reliability and failure mechanisms of semiconductor parts, focusing on life testing and wearout. It discusses how switching states cause transient current pulses and hot carrier injection, which only occur briefly during switching. Life testing at elevated temperatures accelerates aging to remove infant mortality failures, improving reliability. The failure rate follows a bathtub curve with infant mortality, useful life, and wearout phases, modeled by lognormal and exponential distributions. The Arrhenius equation relates failure rates at different temperatures. Burn-in and life tests reduce early failures without harming intrinsic reliability.
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- Application NotePDF 224 KB an9654 May 05, 1999AI-generated Summary: The document explains the reliability and failure mechanisms of semiconductor parts, focusing on life testing and wearout. It discusses how switching states cause transient current pulses and hot carrier injection, which only occur briefly during switching. Life testing at elevated temperatures accelerates aging to remove infant mortality failures, improving reliability. The failure rate follows a bathtub curve with infant mortality, useful life, and wearout phases, modeled by lognormal and exponential distributions. The Arrhenius equation relates failure rates at different temperatures. Burn-in and life tests reduce early failures without harming intrinsic reliability.
Application Notes & White Papers (1)
- Product Change NoticePDF 323 KB PCN15064 Dec 22, 2015
- End Of Life NoticePDF 200 KB PLC15033 Jun 11, 2015
- Product Change NoticePDF 174 KB PCN14017 Apr 21, 2014
- Product Change NoticePDF 151 KB PCN11040 Apr 07, 2011
Product Notices (PCN, EOL, etc) (5)
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