Features
- Gain, DC: 2 x 106 V/V
- Acquisition Time: 1.0µs (0.01%)
- Droop Rate: 0.08µV/µs (+25°C) 17µV/µs (Full Temperature)
- Aperture Time: 25ns
- Hold Step Error (See Glossary): 5mV
- Internal Hold Capacitor
- Fully Differential Input
- TTL Compatible
- Pb-Free Available (RoHS Compliant)
Description
The HA-5320 was designed for use in precision, High-Speed data acquisition systems. The circuit consists of an input transconductance amplifier capable of providing large amounts of charging current, a low leakage analog switch, and an output integrating amplifier. The analog switch sees virtual ground as its load; therefore, charge injection on the hold capacitor is constant over the entire input/output voltage range. The pedestal voltage resulting from this charge injection can be adjusted to zero by use of the offset adjust inputs. The device includes a hold capacitor. However, if improved droop rate is required at the expense of acquisition time, additional hold capacitance may be added externally. This monolithic device is manufactured using the Intersil Dielectric Isolation Process, minimizing stray capacitance and eliminating SCRs. This allows higher speed and latchfree operation. For further information, please see Application Note AN538.
Parameters
| Attributes | Value |
|---|---|
| Rating | Harsh Environment |
| Max Acquisition Time (10V Step to 0.1%) (μs) | 1.2 |
| Max Acquisition Time (10V Step to 0.01%) (μs) | 1.5 |
| Maximum Drift Current Over Temperature (nA) | 10 |
| Temp. Range (°C) | -55 to +125°C, 0 to +70°C |
| Flow | Harsh Environment & MIL-STD-883 |
| Qualification Level | Standard |
| Die Sale Availability? | No |
| PROTO Availability? | No |
Applications
- Precision Data Acquisition Systems
- Digital to Analog Converter Deglitcher
- Auto Zero Circuits
- Peak Detector
| Part Number | Status | Samples | Stock | RoHS | Package | Budgetary Price (USD) | Lead Count (#) | Carrier Type | Moisture Sensitivity Level (MSL) | Pitch (mm) | Pkg. Dimensions (mm) | Pb (Lead) Free | Pb Free Category | MOQ | Temp. Range (°C) | Country of Assembly | Country of Wafer Fabrication |
|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|
| HA1-5320-2 | Active | Available | In Stock | Contact | CERDIP | 14# | Tube | Not Applicable | 2.5mm | 19.3 x 7.3 x 0.00 | No | Hot Solder Dip | 250 | -55 to +125°C | |||
| HA9P5320-5Z | Active | N/A | In Stock | RoHS:EN | SOICW | 1u | $34.58 | 16# | Tube | 3 | 1.3mm | 10.3 x 7.5 x 0.20 | Yes | Pb-Free 100% Matte Tin Plate w/Anneal-e3 | 480 | 0 to +70°C | CHINA, MALAYSIA, PHILIPPINES | USA |
| HA9P5320-5ZX96 | Active | N/A | Out of Stock | RoHS:EN | SOICW | 1u | $34.58 | 16# | Reel | 3 | 1.3mm | 10.3 x 7.5 x 0.20 | Yes | Pb-Free 100% Matte Tin Plate w/Anneal-e3 | 1000 | 0 to +70°C | CHINA, MALAYSIA, PHILIPPINES | USA |
Filters
Applied Filters
- Price Increase NoticePDF 257 KB PIN19006 Mar 01, 2019
- Product Change NoticePDF 98 KB PCN12094 Dec 19, 2012
- End Of Life NoticePDF 153 KB PLC11027 Apr 13, 2011
- Product Change NoticePDF 147 KB PCN11039 Apr 07, 2011
- Application NotePDF 357 KB an1694 Jan 19, 2004AI-generated Summary: The document outlines the four fundamental internal blocks of an operational amplifier and presents a simple 2:1 stage circuit diagram. It includes important legal notices from Renesas Electronics regarding the use, liability, and intellectual property rights of their semiconductor products. The document clarifies product quality grades, intended applications, and restrictions on use in life-critical or hazardous systems. It emphasizes compliance with applicable laws and safety responsibilities when using Renesas products. Contact information for Renesas sales offices worldwide is also provided.
- Application NotePDF 1.06 MB an517 Jan 19, 2004AI-generated Summary: Monolithic sample-and-hold amplifiers perform various functions including unity gain buffering, gain scaling, inverting amplification, and filtered sampling. They enable long hold times with short sample intervals by cascading circuits. Applications include glitch removal in D/A converters, signal demultiplexing, automatic offset zeroing, peak detection with comparator reset, and slowing fast waveforms for analysis. These versatile circuits reduce the need for separate modules and improve signal accuracy and stability.
- Application NotePDF 843 KB an535 Jun 05, 2002AI-generated Summary: A Data Acquisition System (DAS) requires careful design of signal conditioning, transducer selection, and signal transmission to ensure high accuracy. Signal conditioning includes multiplexing, amplification, filtering, and calibration, ideally performed near the transducer. Transducers convert physical variables to electrical signals, often voltage, with low source resistance preferred. Signal paths can be single-ended or differential; differential paths better reject common mode noise, especially for low-level signals. Shielded twisted pairs and balanced lines reduce interference. Filters, typically Butterworth low-pass, prevent aliasing and maintain signal integrity.
- Application NotePDF 224 KB an9654 May 05, 1999AI-generated Summary: The document explains the reliability and failure mechanisms of semiconductor parts, focusing on life testing and wearout. It discusses how switching states cause transient current pulses and hot carrier injection, which only occur briefly during switching. Life testing at elevated temperatures accelerates aging to remove infant mortality failures, improving reliability. The failure rate follows a bathtub curve with infant mortality, useful life, and wearout phases, modeled by lognormal and exponential distributions. The Arrhenius equation relates failure rates at different temperatures. Burn-in and life tests reduce early failures without harming intrinsic reliability.
Recommended Documents (1)
Datasheets (1)
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- Application NotePDF 357 KB an1694 Jan 19, 2004AI-generated Summary: The document outlines the four fundamental internal blocks of an operational amplifier and presents a simple 2:1 stage circuit diagram. It includes important legal notices from Renesas Electronics regarding the use, liability, and intellectual property rights of their semiconductor products. The document clarifies product quality grades, intended applications, and restrictions on use in life-critical or hazardous systems. It emphasizes compliance with applicable laws and safety responsibilities when using Renesas products. Contact information for Renesas sales offices worldwide is also provided.
- Application NotePDF 1.06 MB an517 Jan 19, 2004AI-generated Summary: Monolithic sample-and-hold amplifiers perform various functions including unity gain buffering, gain scaling, inverting amplification, and filtered sampling. They enable long hold times with short sample intervals by cascading circuits. Applications include glitch removal in D/A converters, signal demultiplexing, automatic offset zeroing, peak detection with comparator reset, and slowing fast waveforms for analysis. These versatile circuits reduce the need for separate modules and improve signal accuracy and stability.
- Application NotePDF 843 KB an535 Jun 05, 2002AI-generated Summary: A Data Acquisition System (DAS) requires careful design of signal conditioning, transducer selection, and signal transmission to ensure high accuracy. Signal conditioning includes multiplexing, amplification, filtering, and calibration, ideally performed near the transducer. Transducers convert physical variables to electrical signals, often voltage, with low source resistance preferred. Signal paths can be single-ended or differential; differential paths better reject common mode noise, especially for low-level signals. Shielded twisted pairs and balanced lines reduce interference. Filters, typically Butterworth low-pass, prevent aliasing and maintain signal integrity.
- Application NotePDF 224 KB an9654 May 05, 1999AI-generated Summary: The document explains the reliability and failure mechanisms of semiconductor parts, focusing on life testing and wearout. It discusses how switching states cause transient current pulses and hot carrier injection, which only occur briefly during switching. Life testing at elevated temperatures accelerates aging to remove infant mortality failures, improving reliability. The failure rate follows a bathtub curve with infant mortality, useful life, and wearout phases, modeled by lognormal and exponential distributions. The Arrhenius equation relates failure rates at different temperatures. Burn-in and life tests reduce early failures without harming intrinsic reliability.
Application Notes & White Papers (4)
- Price Increase NoticePDF 257 KB PIN19006 Mar 01, 2019
- Product Change NoticePDF 98 KB PCN12094 Dec 19, 2012
- End Of Life NoticePDF 153 KB PLC11027 Apr 13, 2011View More (6)
Product Notices (PCN, EOL, etc) (6)
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Knowledge Base
-
What is the minimum power supply voltage for the HA-5320?
Question:What is the minimum power supply voltage? Will it work with ±12V power supplies? Answer:HA-5320 minimum Vcc is ±13.5V. It definitely will not work at ±12V or less.
-
Where can I find application note AN538 which is referenced on the HA-5320 datasheet?
Question:The data sheet for the HA-5320 references AN538 for further information. I couldn't find it on your website. Can I get a copy of it? Answer:Attached is the application note you are requesting.