The ISL70591SEH, ISL73591SEH, ISL70592SEH, and ISL73592SEH are radiation hardened precision 100µA and 1mA current source ICs. The devices have excellent accuracy of ±1% over a wide operating voltage range of 3V to 40V and over a temperature range of -55°C to +125°C. Fabricated with the Renesas proprietary PR40 Silicon On Insulator (SOI) process, the devices are immune to single event latch-up. The high output impedance of the devices make them insensitive to the voltage drops across long lines. They can withstand a forward operating voltage of 40V and a reverse voltage of -0. 5V. The ISL7x591SEH and ISL7x592SEH are two-terminal floating current sources and that allows them to be used in high side, low side, and dual side load applications such as sensor excitation, biasing networks, low voltage references, floating voltage references, and ramp generators. The current sources were primarily designed for thermistor and other sensor excitation applications widely used in space crafts. The ISL7x591SEH and ISL7x592SEH are available in a 4 Ld ceramic flatpack and die forms. The temperature range is -55°C to +125°C.


  • Electrically screened to DLA SMD 5962-18217
  • Wide operating voltage range: 3V to 40V
  • High initial accuracy (+V = 20V at +25°C): ISL7x591SEH: ±0.34%, ISL7x592SEH: ±0.30%
  • High output impedance: ISL7x591SEH: 189MΩ (typical), ISL7x592SEH: 14MΩ (typical)
  • Completely floating: No ground connection
  • Radiation acceptance testing - ISL70591SEH and ISL70592SEH
    • High dose rate (50-300rad(Si)/s): 100krad(Si)
    • Low dose rate (0.01rad(Si)/s): 75krad(Si)
  • Radiation acceptance testing - ISL73591SEH and ISL73592SEH: Low dose rate (0.01rad(Si)/s): 75krad(Si)
  • SEE hardness
    • No SEB/SEL LETTH, +V = 35V: 86MeV•cm2/mg
    • SET duration (time recovery) ≤125µs

tuneProduct Options

Part Number Part Status Pkg. Type Carrier Type Buy Sample
Active CFP Tray
Active CFP Tray
Active DIE
Active Die Waffle Pack


Title language Type Format File Size Date
Datasheets & Errata
star ISL70591SEH, ISL70592SEH, ISL73591SEH, ISL73592SEH Datasheet Datasheet PDF 780 KB
User Guides & Manuals
ISL70591SEHEVAL1Z User Guide Manual - Development Tools PDF 555 KB
Application Notes & White Papers
Wafer by Wafer Low Dose Rate Acceptance White Paper White Paper PDF 533 KB
AN9867: End of Life Derating: A Necessity or Overkill Application Note PDF 338 KB
Intersil Space Products Brochure Brochure PDF 3.14 MB
ISL70591SEH Neutron Test Report Report PDF 230 KB
Standard Microcircuit Drawing 5962-18217 (ISL70591SEH, ISL73591SEH, ISL70592SEH, ISL73592SEH) Other 0 KB
ISL70591SEH Total Dose Test Report Report PDF 347 KB
ISL7x591SEH, ISL7x592SEH SEE Test Report Report PDF 716 KB


Title language Type Format File Size Date
ISL70591SEHEVAL1Z Design Files PCB Design Files ZIP 229 KB

memoryBoards & Kits

Part Number Title Type Company
ISL70591SEHEVAL1Z Radiation Hardened 100µA and 1mA Precision Constant Current Sources Evaluation Board Evaluation Renesas

printNews & Additional Resources

Type Date Sort ascending
Low Dose Rate Acceptance Testing Page Mar 25, 2020
Standard Data Package Page Mar 19, 2020
Rad Hard SMD Test Flow Page Mar 19, 2020
Rad Hard Test Reports Page Mar 19, 2020