Pitch (mm) | 1.27 |
Lead Count (#) | 18 |
Pkg. Dimensions (mm) | 11.18 x 8.38 x 0.00 |
Pkg. Code | KCU |
Pkg. Type | CFP |
Moisture Sensitivity Level (MSL) | Not Applicable |
Pb (Lead) Free | Exempt |
ECCN (US) | EAR99 |
HTS (US) |
Lead Count (#) | 18 |
Carrier Type | Tray |
Moisture Sensitivity Level (MSL) | Not Applicable |
Pitch (mm) | 1.3 |
Pkg. Dimensions (mm) | 11.2 x 8.4 x 0.00 |
Qualification Level | EM |
Pb (Lead) Free | Exempt |
Pb Free Category | Gold Plate over compliant Undercoat-e4 |
MOQ | 1 |
Temp. Range | -55 to +125°C |
CAGE code | 34371 |
Cascadable? | Yes |
Die Sale Availability? | Yes |
Flow | RH Hermetic |
Length (mm) | 11.2 |
Number of Controlled Supplies (#) | 4 |
Output Type | Enable Open Drain |
PGOOD Timer | Yes |
PROTO Availability? | Yes |
Pkg. Type | CFP |
Programmable Delay | Yes |
Rating | Space |
Supply Voltage (V) | 3 - 13.2 |
Supply Voltage (max) (V) | 13.2 - 13.2 |
Supply Voltage (min) (V) | 3 - 3 |
TID LDR (krad(Si)) | 75 |
Thickness (mm) | 0 |
Width (mm) | 8.4 |
The ISL70321SEH and ISL73321SEH are radiation hardened and SEE mitigated power supply sequencers designed to drive Point-of-Load (POL) regulators with enable pins. Up to four power supplies can be fully sequenced by a single device or multiple devices can be easily cascaded to sequence an unlimited number of power supplies for dense RF applications. This power supply sequencer requires only two feedback resistors per power supply and a single resistor to set the rising and falling delay. The device features precision input comparators with an input threshold voltage of 600mV ±1.5% for the highest possible accuracy when monitoring the power supply voltages. The ISL70321SEH and ISL73321SEH are offered in an 18 Ld 10mm x 12mm CDFP package or die form and are fully specified across the military ambient temperature range of -55 °C to +125 °C. With minimal external component count, precision voltage monitoring, and SET mitigation, the ISL70321SEH and ISL73321SEH are the ideal choice to control many of today’s highly dense power systems in high-reliability applications.