The Star*Power Radiation Hardened IS-2981RH, IS-2981EH are monolithic devices designed for use in high-side switching applications that benefit from separate grounds for the logic and loads. The devices have a 5V to 80V operating supply voltage range and is capable of sourcing -200mA continuously from each output. The outputs are controlled by active-high inputs and may be paralleled to increase the drive current. The output clamp diodes prevent device damage, when switching inductive loads. Constructed with the Intersil bonded wafer, dielectrically isolated HVTDLM process, these single event latch-up immune devices have been specifically designed to provide highly reliable performance in harsh radiation environments. They are fully guaranteed for 100krad(Si) high dose rate and 50krad(Si) low dose rate total dose performance through wafer-by-wafer radiation testing, and are production tested over the full military temperature range. Specifications for Rad Hard QML devices are controlled by the Defense Logistics Agency Land and Maritime (DLA). The SMD numbers listed below must be used when ordering. Detailed Electrical Specifications for these devices are contained in SMD 5962-00520.

Features

  • Electrically screened to SMD 5962-00520
  • QML qualified per MIL-PRF-38535 requirements
  • Radiation environment
  • Single event latch-up immune DI process
  • High dose rate: 100krad(Si)
  • Low dose rate: 50krad(Si)
  • Input voltage range: 0.0V to VCC (20V max)
  • Supply voltage range: 5V to 80V
  • Turn-on delay time: 2µs (max)
  • Turn-off delay time: 11µs (max)
  • Output clamp diode, VF: -1.75V (max)

Applications

  • Drivers for various loads
  • Relays, solenoids and motors
  • Reliable replacement of discrete solutions
  • Interfacing between low-level logic and high-current loads

tuneProduct Options

Part Number Part Status Pkg. Type Carrier Type MOQ DLA SMD Buy Sample
Active 100 5962R0052001V9A
Availability
Active SBDIP Tube 1
Availability
Active SBDIP Tube 1 5962R0052001QVC
Availability
Active SBDIP Tube 1 5962R0052001VVC
Availability

descriptionDocumentation

Title language Type Format File Size Date
Datasheets & Errata
star IS-2981RH, IS-2981EH Datasheet Datasheet PDF 218 KB
Application Notes & White Papers
Wafer by Wafer Low Dose Rate Acceptance White Paper White Paper PDF 533 KB
AN9867: End of Life Derating: A Necessity or Overkill Application Note PDF 338 KB
PCNs & PDNs
PCN14055 - Electrical Specification Change to Standard Microcircuit Drawing 5962-00520 for Intersil Products IS-2981RH and IS-2981EH Product Change Notice PDF 114 KB
PCN10123 - Alternate Die Attach Material for Assembly of Intersil Hermetic Packaged Products - Intersil Palm Bay, FL. (ISP) Product Change Notice PDF 230 KB
Other
Intersil Space Products Brochure Brochure PDF 3.14 MB
PIN19011 - Price Increase for the Listed Renesas Electronics America (REA) Radiation Hardened Space Products Price Increase Notice PDF 360 KB
Standard Microcircuit Drawing 5962-00520 (IS-2981EH, IS-2981RH) Other 0 KB
IS-2981EH Total Dose Test Report Report PDF 321 KB
Intersil Commercial Lab Services Brochure PDF 364 KB

printNews & Additional Resources

Type Date Sort ascending
Low Dose Rate Acceptance Testing Page Mar 25, 2020
Standard Data Package Page Mar 19, 2020
Rad Hard SMD Test Flow Page Mar 19, 2020
Rad Hard Test Reports Page Mar 19, 2020