The HS-303ARH, HS-303AEH, HS-303BRH, HS-303BEH analog switches are monolithic devices fabricated using the Renesas dielectrically isolated Radiation Hardened Silicon Gate (RSG) process technology to ensure latch-up free operation. They are pinout compatible and functionally equivalent to the HS-303RH, but offer improved 300kRAD(Si) total dose capability. These switches offer low-resistance switching performance for analog voltages up to the supply rails. ON-resistance is low and stays reasonably constant over the full range of operating voltage and current. ON-resistance also stays reasonably constant when exposed to radiation. Break-before-make switching is controlled by 5V digital inputs. The HS-303ARH and HS-303AEH should be operated with nominal ±15V supplies, while the HS-303BRH and HS-303BEH should be operated with nominal ±12V supplies.


  • Electrically screened to DLA SMD# 5962-95813
  • QML, per MIL-PRF-38535
  • Radiation performance
    • Total dose: 3x105rad(Si)
    • SEE: For LET = 60MeV•cm2/mg at 60° incident angle, <150pC charge transferred to the output of an off switch (based on SOI design calculations)
  • No latch-up, dielectrically isolated device islands
  • Pinout and functionally compatible with Renesas HS-303RH and HI-303 series analog switches
  • Analog signal range equal to the supply voltage range
  • Low leakage: 100nA (max, post-rad)
  • Low rON: 70Ω (max, post-rad)
  • Low standby supply current: +150μA/-100μA (max, post-rad)


製品名 Part Status Pkg. Type Carrier Type MOQ DLA SMD 購入/サンプル
Active 100 5962F9581306V9A
Active SBDIP Tube 1 5962F9581306VCC
Active CFP Tray 1 5962F9581306VXC


タイトル language 分類 形式 サイズ 日付
star HS-303ARH, HS-303AEH, HS-303BRH, HS-303BEH Datasheet データシート PDF 245 KB
Wafer by Wafer Low Dose Rate Acceptance White Paper ホワイトペーパー PDF 533 KB
AN9867: End of Life Derating: A Necessity or Overkill アプリケーションノート PDF 338 KB
PA20023 - Correction to the Renesas HSx-303AxH-x and HSx-303BxH-x Datasheets Product Advisory PDF 223 KB
Intersil Space Products Brochure カタログ PDF 3.14 MB
R34ZZ0002EU0100: HS303xxH, HS-302AEH Design for Single Event Transients その他資料 PDF 115 KB
PIN19011 - Price Increase for the Listed Renesas Electronics America (REA) Radiation Hardened Space Products Price Increase Notice PDF 360 KB
HS-303AEH Total Dose Test Report レポート PDF 266 KB
Standard Microcircuit Drawing 5962-95813 (HS-307RH, HS-303AEH, HS-303ARH, HS-303BEH, HS-303BRH, HS-303CEH, HS-303RH, HS-390RH) その他資料 0 KB
Intersil Commercial Lab Services カタログ PDF 364 KB
HS-303ARH Neutron Test Report レポート PDF 304 KB


分類 日付 昇順で並び替え
Low Dose Rate Acceptance Testing 基本ページ 2020年3月25日
Standard Data Package 基本ページ 2020年3月19日
Rad Hard SMD Test Flow 基本ページ 2020年3月19日
Rad Hard Test Reports 基本ページ 2020年3月19日