The ISL75051ASEH and ISL73051ASEH are radiation hardened low-voltage, high-current, single-output LDOs specified for up to 3.0A of continuous output current. These devices operate across an input voltage range of 2.2V to 6.0V and can provide output voltages of 0.8V to 5.0V adjustable, based on the resistor divider setting. Dropout voltages as low as 65mV can be achieved using the device. The OCP pin allows the short-circuit output current limit threshold to be programmed by a resistor from the OCP pin to GND. The OCP setting range is 0.5A minimum to 8.5A maximum. The resistor sets the constant current threshold for the output under fault conditions. The thermal shutdown disables the output if the device temperature exceeds the specified value. It subsequently enters an ON/OFF cycle until the fault is removed. The ENABLE feature allows the part to be placed into a low current shutdown mode that typically draws about 10µA. These devices are optimized for fast transient response and Single Event Effects (SEE). This reduces the magnitude of Single Event Transients (SET) seen on the output. Additional protection diodes and filters are not needed. These devices are stable with tantalum capacitors as low as 47µF and provide excellent regulation all the way from no load to full load. Programmable soft-start allows the user to program the inrush current by using the decoupling capacitor value on the BYP pin.


  • DLA SMD 5962-11212
  • Output current up to 3.0A at TJ = +150°C
  • Output accuracy ±1.5% over MIL temperature range
  • Ultra low dropout:
    • 65mV (typical) dropout at 1.0A
    • 225mV (typical) dropout at 3.0A
  • SET mitigation with no added filtering/diodes
  • Input supply range: 2.2V to 6.0V
  • Fast load transient response
  • Shutdown current of 10µA (typical)
  • Output adjustable using external resistors
  • PSRR 66dB (typical) at 1kHz
  • Enable and PGood features
  • Programmable soft-start/inrush current limiting
  • Over-temp shutdown and programmable OCP limits
  • Stable with 47µF min tantalum capacitor
  • Radiation hardness (ISL75051ASEH only)
    • High dose rate (50 - 300rad(Si)/s): 100krad(Si)
    • Low dose rate (≤0.01rad(Si)/s): 50krad(Si)
  • Radiation hardness (ISL73051ASEH only)
    • Low dose rate (≤0.01rad(Si)/s): 50krad(Si)


Title language Type Format File Size Date
Datasheets & Errata
star ISL75051ASEH, ISL73051ASEH Datasheet Datasheet PDF 1.18 MB
User Guides & Manuals
ISL75051ASEHEV1Z User Guide Manual - Development Tools PDF 809 KB
Application Notes & White Papers
Wafer by Wafer Low Dose Rate Acceptance White Paper White Paper PDF 533 KB
AN9867: End of Life Derating: A Necessity or Overkill Application Note PDF 338 KB
PCN18008 - Part Marking Change for the Listed QML Products Product Change Notice PDF 846 KB
Intersil Space Products Brochure Brochure PDF 3.16 MB
ISL75051SEH, ISL75051ASEH and ISL73051ASEH Neutron Test Report Report PDF 328 KB
PIN19011 - Price Increase for the Listed Renesas Electronics America (REA) Radiation Hardened Space Products Price Increase Notice PDF 360 KB
Standard Microcircuit Drawing 5962-11212 (ISL75051SEH, ISL75051SRH, ISL75051ASEH, ISL73051ASEH) Other 0 KB
ISL75051ASEH and ISL73051ASEH Total Dose Test Report Report PDF 874 KB
ISL75051ASEH, ISL73051ASEH SEE Test Report Report PDF 790 KB
Intersil Commercial Lab Services Brochure PDF 364 KB
ISL75051SEH, ISL75051ASEH and ISL73051ASEH Neutron Test Report with Boeing Report PDF 308 KB
TB499: PCB Thermal Land Design for Ceramic Packages with Bottom Metal or Heat Sinks Technical Brief PDF 410 KB


Title language Type Format File Size Date
ISL75051ASEH and ISL73051ASEH ROCP Calculator Software & Tools - Other XLSX 97 KB
ISL75051SRH-ISL73051ASEH PSPICE Model Model - Other ZIP 7 KB
ISL75051ASEHEV1Z Design Files PCB Design Files ZIP 1.11 MB

memoryBoards & Kits

Part Number Title Type Company
ISL75051ASEHEV1Z 3A, Radiation Hardened, Positive, Ultra-Low Dropout Regulator Evaluation Board Evaluation Renesas
ISLRTG4DEMO1Z Renesas Radiation Hardened Power Solution for RTG4 FPGA Demonstration Renesas

printNews & Additional Resources

Type Date Sort ascending
Low Dose Rate Acceptance Testing Page Mar 26, 2020
Standard Data Package Page Mar 20, 2020
Rad Hard SMD Test Flow Page Mar 20, 2020
Rad Hard Test Reports Page Mar 20, 2020