Renesas offers a broad portfolio of highly reliable, efficient and accurate radiation hardened (rad hard) products for space applications and other radiation environments.

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Manufacturing & Test Information

Renesas has an unparalleled track record of providing highly reliable, efficient and accurate radiation hardened power products that achieve the stringent voltage accuracy required for harsh environments.

The low dose rate ionizing dose response of semiconductors has become a key issue in space applications. Renesas is addressing this market by wafer-by-wafer low dose rate acceptance testing as a complement to current high dose rate acceptance testing.

Renesas is one of only a few RHA Defense Logistics Agency (Land and Maritime) QML suppliers. All of Renesas' radiation hardened SMD products are MIL-PRF-38535/QML compliant and are 100% burned in.


Rad Hard AND Gates

Radiation hardened AND gates provide direct implementation of the AND function

Rad Hard Buffer/Line Drivers

Radiation hardened buffer/line drivers qualified to QML Class V space standards

Rad Hard Counters

Space qualified CMOS synchronous counters and ripple-carry binary counters

Rad Hard Decoders/DEMUXs

Space qualified CMOS decoder/demultiplexer combinational logic circuits

Rad Hard Flip-Flops

ELDRS free CMOS flip-flop circuits qualified to QML Class V space specifications

Rad Hard Inverters

ELDRS free CMOS hex inverters that are qualified to QML Class V space specifications

Rad Hard Latches

Radiation hardened CMOS latches qualified to QML Class V space specifications

Rad Hard Memory

Rad Hard CMOS PROM achieves high-speed performance with very low power dissipation

Rad Hard NAND Gates

Radiation hardened NAND gates provide direct implementation of the NAND function

Rad Hard NOR Gates

Radiation hardened NOR gates provide direct implementation of the NOR function

Rad Hard OR Gates

Radiation hardened OR gates provide direct implementation of the OR function

Rad Hard OR/NOR Gates

OR/NOR gates provide direct implementation of the Exclusive OR and Exclusive NOR functions

Rad Hard Shift Registers

Radiation hardened CMOS shift registers qualified to QML Class V space specifications

Rad Hard Signal Multiplexers

Radiation hardened 8-input multiplexer (MUX) utilizes advanced CMOS/SOS technology

Rad Hard Timing Circuits

Rad hard CMOS programmable interval timer and CMOS dual monostable multivibrator

Product Selector: Rad Hard Digital

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Type Title Date
Brochure PDF 5.02 MB
White Paper PDF 533 KB
2 items
Are Your ICs Ready for the Real Space Environment?

Over the past 19 years, the space industry has placed a higher value on understanding the effects that long-term, low dose radiation can have on ICs. Intersil's radiation testing specialist Nick van Vonno discusses why this shift has occurred and what we are doing to address this change.


There are many different types of radiation, and indeed Intersil addresses two of these. Intersil addresses total dose testing which is basically gamma rays. Okay, and at both high and low dose rate, as we'll get into later. Intersil also addresses single event effects of a fairly broad range, and those are typically addressed by heavy ion testing.

Low dose rate testing, you have to contrast this really in order to understand this. You have to look historically at how total dose testing which is done with gamma rays, how that's been performed. Historically this has been performed at what we call high dose rate, and typically to put this in some numbers, that would run somewhere in the range of 50rad to 300rad/s.

Low dose rate, on the other hand, is a much, much slower dose rate. The generally accepted number, and the one we perform our work in, is 0.01rad/s. You see how far that's away from 300rad a second. And that can also be expressed as 10mrad/s if you'd like.

Now why are we goofing with that? And the answer is that the low dose rate is what happens in space. Dose rates in space are almost uniformly low to the order of 10mrad/s. Low dose rate radiation testing has been a, let's call it a hot topic in silicon advanced research since about 1992, okay? In 1992, some researchers out at Mich research came up with a very unusual finding which showed that certain parts that looked very good at high dose rate degrade with amazing rapidity, orders and orders of magnitude, worse at low dose rate. And so, that was not a fully intuitive result, and indeed it had to be repeated, and in the intervening 19 years there is a very large amount of work that's been done on low dose rate effects. And, as we've learned about how different parts react in low dose rate, we've, as an industry, we've swung over more towards a low dose rate testing emphasis rather than a high dose rate testing emphasis.