The ISL70419SEH contains four very high precision amplifiers featuring the perfect combination of low noise vs power consumption. Low offset voltage, low IBIAS current, and low temperature drift make it the ideal choice for applications requiring both high DC accuracy and AC performance. The combination of high precision, low noise, low power, and small footprint provides the user with outstanding value and flexibility relative to similar competitive parts. Applications for these amplifiers include precision active filters, medical and analytical instrumentation, precision power supply controls, and industrial controls. The ISL70419SEH is offered in a 14 Ld hermetic ceramic flatpack package. The device is offered in an industry standard pin configuration and operates across the extended temperature range from -55°C to +125°C.


  • Electrically screened to DLA SMD# 5962-14226
  • Low input offset voltage: ±110µV, Max.
  • Superb offset temperature coefficient: 1µV/°C, Max.
  • Input bias current: ±15nA, Max.
  • Input bias current TC: ±5pA/°C, Max.
  • Low current consumption: 440µAV to 36V
  • Voltage noise: 8nV/√Hz
  • Wide supply range: 4.5V to 36V
  • Operating temperature range: -55°C to +125°C
  • Radiation environment
  • SEB LETTH (VS = ±18V): 86.4 MeV•cm2/mg
  • SET recovery time: ≤ 10µs at 60 MeV•cm2/mg
  • SEL immune (SOI process)
  • Total dose HDR (50-300rad(Si)/s): 300krad(Si)
  • Total dose LDR (10mrad(Si)/s): 100krad(Si)
    *Product capability established by initial characterization. The EH version is acceptance tested on a wafer-by-wafer basis to 50krad(Si) at low dose rate.


  • Precision instrumentation
  • Spectral analysis equipment
  • Active filter blocks
  • Thermocouples and RTD reference buffers
  • Data acquisition
  • Power supply control


タイトル language 分類 形式 サイズ 日付
star ISL70419SEH, ISL73419SEH Datasheet データシート PDF 1.35 MB
ISL70419SEHEV1Z User Guide ガイド PDF 641 KB
How to Bias Op-Amps Correctly アプリケーションノート PDF 263 KB
AN9867: End of Life Derating: A Necessity or Overkill アプリケーションノート PDF 338 KB
Wafer by Wafer Low Dose Rate Acceptance White Paper ホワイトペーパー PDF 533 KB
Intersil Space Products Brochure カタログ PDF 3.16 MB
Intersil Commercial Lab Services カタログ PDF 364 KB
Standard Microcircuit Drawing 5962-14226 (ISL70219ASEH, ISL70419SEH, ISL73419SEH) その他資料 0 KB
ISL70419SEH Neutron Test Report レポート PDF 387 KB
ISL70419SEH Total Dose Test Report レポート PDF 529 KB
ISL70419SEH SEE Test Report レポート PDF 1.26 MB


タイトル language 分類 形式 サイズ 日付
isl70419seh-design-model-lib Model - Other LIB 6 KB
isl70419seh-design-model-olb Model - Other OLB 7 KB


分類 日付 昇順で並び替え
Low Dose Rate Acceptance Testing 基本ページ 2020年3月26日
Standard Data Package 基本ページ 2020年3月20日
Rad Hard SMD Test Flow 基本ページ 2020年3月20日
Rad Hard Test Reports 基本ページ 2020年3月20日