The ISL70617SEH is a high performance, differential input, differential output instrumentation amplifier designed for precision analog-to-digital applications. It can operate over a supply range of 8V (±4V) to 36V (±18V) and features a differential input voltage range up to ±30V. The output stage has rail-to-rail output drive capability optimized for differential ADC driver applications. The output stage is powered by separate supplies. This feature enables the output to be driven by the same low voltage supplies powering the ADC, thereby providing protection from high voltage signals and the low voltage digital circuits. Its versatility makes it suitable for a variety of general purpose applications. Additional features not found in other instrumentation amplifiers enable high levels of DC precision and excellent AC performance. The gain of the ISL70617SEH can be programmed from 0. 1 to 10, 000 via two external resistors, RIN and RFB. The gain accuracy is determined by the matching of RIN and RFB. The gain resistors have Kelvin sensing, which removes gain error due to PC trace resistance. The input and output stages have individual power supply pins, which enable input signals riding on a high common-mode voltage to be level shifted to a low voltage device, such as an A/D converter. The rail-to-rail output stage can be powered from the same supplies as the ADC, which preserves the ADC maximum input dynamic range and eliminates ADC input overdrive. The ISL70617SEH is offered in a 24 Ld ceramic flatpack package with an operating temperature range of -55°C to +125°C.


  • Rail-to-rail differential output ADC driver
  • Low input offset: 30μV
  • Input bias current: 0.2nA
  • Excellent CMRR and PSRR: 120dB
  • Wide operating voltage range: ±4V to ±18V
  • Closed loop -3dB BW 0.3MHz (AV = 1k) to 5.5MHz (AV = 0.1)
  • Operating temperature range: -55°C to +125°C
  • Acceptance tested to 75krad(Si) (LDR) wafer-by-wafer
  • Radiation tolerance - Low dose rate (0.01rad(Si)/s): 75krad(Si) - SEB LETTH (VS = ±18V): 60MeV•cm2/mg
  • Electrically screened to DLA 5962-15246

tuneProduct Options

Part Number Part Status Pkg. Type Carrier Type MOQ Buy Sample
Active CFP Tray 1
Active CFP Tray 1
Active 100
Active Die Waffle Pack 1


Title language Type Format File Size Date
Datasheets & Errata
star ISL70617SEH Datasheet Datasheet PDF 1.39 MB
User Guides & Manuals
ISL70617SEHEV1Z User Guide Manual - Development Tools PDF 519 KB
Application Notes & White Papers
Examining a New In-Amp Architecture for Communication Satellites White Paper PDF 684 KB
Wafer by Wafer Low Dose Rate Acceptance White Paper White Paper PDF 533 KB
AN9867: End of Life Derating: A Necessity or Overkill Application Note PDF 338 KB
Intersil Space Products Brochure Brochure PDF 3.12 MB
ISL70517SEH, ISL70617SEH Neutron Test Report Report PDF 432 KB
Standard Microcircuit Drawing 5962-15246 (ISL70517SEH, ISL70617SEH) Other 0 KB
ISL70517SEH Total Dose Test Report Report PDF 523 KB
ISL70617SEH Total Dose Test Report Report PDF 526 KB
Intersil Commercial Lab Services Brochure PDF 364 KB
ISL70617SEH, ISL70517SEH SEE Test Report Report PDF 630 KB


Title language Type Format File Size Date
isl70617seh-spice Model - Other ZIP 6 KB
ISL70617SEHEV1Z Design Files PCB Design Files ZIP 421 KB

memoryBoards & Kits

Part Number Title Type Company
ISL70617SEHEV1Z 36V Radiation Hardened Precision Instrumentation Amplifier Evaluation Board Evaluation Renesas

printNews & Additional Resources

Type Date Sort ascending
Low Dose Rate Acceptance Testing Page Mar 25, 2020
Standard Data Package Page Mar 19, 2020
Rad Hard SMD Test Flow Page Mar 19, 2020
Rad Hard Test Reports Page Mar 19, 2020