The ISL72813SEH is a radiation hardened, high-voltage, high-current, driver circuit fabricated using the Renesas proprietary PR40 Silicon-on-Insulator (SOI) process technology to mitigate single-event effects. This device integrates 32 driver circuits that feature high-voltage, common emitter, and open-collector outputs with a 42V breakdown voltage and a peak current rating of 600mA. To further reduce solution size and increase system power density, the ISL72813SEH integrates a 5-bit to 32-channel decoder (plus enable pin) as well as level shifting circuitry to reference the output of the decoder to a negative voltage. This conveniently allows the user to select 1 of 32 available driver channels. The inputs to the decoder are TTL/CMOS compatible, allowing easy interface to CPUs, FPGAs or microprocessors. The ISL72813SEH operates across the military temperature range from -55 °C to +125 °C and is available in a 44 Ld hermetically sealed Ceramic Lead-Less Chip Carrier (CLCC) package.

Features

  • Electrically screened to SMD 5962-17208
  • Acceptance tested to 100krad(Si) (HDR) and to 50krad(Si) (LDR) wafer-by-wafer
  • Integrated 5-bit to 32-channel decoder
  • Integrated level shifting circuit
  • High collector current outputs
  • High voltage outputs
  • Grounded metal lid
  • Full military temperature range operation
  • TA = -55 °C to +125 °C
  • TJ = -55 °C to +150 °C
  • Radiation tolerance
  • HDR (50rad(Si)/s to 300rad(Si)/s): 100krad(Si)
  • LDR (0.01rad(Si)/s): 50krad(Si)
  • SEE hardness
  • No SEB/SEL LETTH, VCE = 33V: 86.4MeV•cm2/mg

tuneProduct Options

Part Number Part Status Pkg. Type Carrier Type MOQ DLA SMD Buy Sample
Active CLCC Tube 1
Availability
Active CLCC Tube 1 5962R1720801VXA
Availability
Active 100 5962R1720801V9A
Availability
Active Die Waffle Pack 1 5962R1720801V9A
Availability

descriptionDocumentation

Title language Type Format File Size Date
Datasheets & Errata
star ISL72813SEH Datasheet Datasheet PDF 645 KB
User Guides & Manuals
ISL72813SEHEV1Z User Guide Manual - Development Tools PDF 925 KB
Application Notes & White Papers
How to Reduce SWaP of Satellite Command and Telemetry Subsystems White Paper PDF 352 KB
Wafer by Wafer Low Dose Rate Acceptance White Paper White Paper PDF 533 KB
AN9867: End of Life Derating: A Necessity or Overkill Application Note PDF 338 KB
PCNs & PDNs
PCN18008 - Part Marking Change for the Listed QML Products Product Change Notice PDF 846 KB
Other
Intersil Space Products Brochure Brochure PDF 3.14 MB
ISL72813SEH Neutron Test Report Report PDF 278 KB
Standard Microcircuit Drawing 5962-17208 (ISL72813SEH) Other 0 KB
ISL72813SEH Total Dose Test Report Report PDF 593 KB
Intersil Commercial Lab Services Brochure PDF 364 KB
ISL72813SEH SEE Test Report Report PDF 546 KB

file_downloadDownloads

Title language Type Format File Size Date
Models
isl72813seh_pspice_model Model - Other ZIP 113 KB
Hardware
ISL72813SEHEV1Z Design Files PCB Design Files ZIP 1.27 MB

memoryBoards & Kits

Part Number Title Type Company
ISL72813SEHEV1Z Radiation Hardened 32-Channel Driver with Integrated Decoder Evaluation Board Evaluation Renesas

printNews & Additional Resources

Type Date Sort ascending
Low Dose Rate Acceptance Testing Page Mar 25, 2020
Standard Data Package Page Mar 19, 2020
Rad Hard SMD Test Flow Page Mar 19, 2020
Rad Hard Test Reports Page Mar 19, 2020