The radiation hardened HS-117RH and HS-117EH are adjustable positive voltage linear regulators capable of operating with input voltages up to 40VDC. The HS-117EH encompasses all of the production testing of the HS-117RH and additionally is tested in the Enhanced Low Dose Rate Sensitivity (ELDRS) product manufacturing flow. The output voltage is adjustable from 1.25V to 37V with two external resistors. The device is capable of sourcing from 5mA to 1.25A max (0.5A max for the TO-39 package). Current protection is provided by the on-chip thermal shutdown and output current limiting circuitry. The HS-117xH's advantage over other industry types is its incorporated circuitry that minimizes the effects of radiation and temperature on device stability. The HS-117RH and HS-117EH are constructed in the dielectrically isolated Rad Hard Silicon Gate (RSG) process and are immune to single event latch-up and are specifically designed to provide highly reliable performance in harsh radiation environments.


  • Electrically screened to DLA SMD # 5962-99547
  • Superior temperature stability
  • Overcurrent and over-temperature protection
  • Wide input voltage range 4.25V to 40V
  • Operating temperature range -55°C to +125°C
  • QML qualified per MIL-PRF-38535 requirements
  • Radiation environment
  • SEL/SEB LETTH (VS = 40V) 87.4 MeV•cm2/mg
  • Total Dose, High Dose Rate 300krad(Si)
  • Total Dose, Low Dose Rate 100krad(Si)*
    * Product capability established by initial characterization. The EH version is acceptance tested on a wafer-by-wafer basis to 50krad(Si) at low dose rate.


  • Adjustable Linear Voltage Regulators
  • Adjustable Linear Current Regulators

tuneProduct Options

Part Number Part Status Pkg. Type Carrier Type MOQ DLA SMD Buy Sample
Active 100 5962F9954702V9A
Active CAN Tray 1 5962F9954702VUC
Active CAN Tray 1 5962F9954702VXC
Active CLCC Tube 1 5962F9954702VYC


Title language Type Format File Size Date
Datasheets & Errata
star HS-117RH, HS-117EH Datasheet Datasheet PDF 834 KB
Application Notes & White Papers
Wafer by Wafer Low Dose Rate Acceptance White Paper White Paper PDF 533 KB
AN9867: End of Life Derating: A Necessity or Overkill Application Note PDF 338 KB
PA17015 - Label correction for the listed Intersil HSYE-117* / DLA Standard Microcircuit Drawing (SMD) 5962-99547 products Product Advisory PDF 255 KB
Intersil Space Products Brochure Brochure PDF 3.12 MB
PIN19011 - Price Increase for the Listed Renesas Electronics America (REA) Radiation Hardened Space Products Price Increase Notice PDF 360 KB
Standard Microcircuit Drawing 5962-99547 (HS-117EH, HS-117RH) Other 0 KB
HS-117RH Neutron Test Report Report PDF 270 KB
Intersil Commercial Lab Services Brochure PDF 364 KB
HS-117RH Total Dose Test Report Report PDF 378 KB
HS9S-117RH Total Dose Test Report Report PDF 175 KB
HS-117RH SEE Test Report Report PDF 406 KB

printNews & Additional Resources

Type Date Sort ascending
Low Dose Rate Acceptance Testing Page Mar 25, 2020
Standard Data Package Page Mar 19, 2020
Rad Hard SMD Test Flow Page Mar 19, 2020
Rad Hard Test Reports Page Mar 19, 2020