The HS-303CEH is an analog switch and a monolithic device that is fabricated using the Renesas dielectrically isolated Radiation Hardened Silicon Gate (RSG) process technology to ensure latch-up free operation. The HS-303CEH is pinout compatible and functionally equivalent to the HS-303RH. The HS-303CEH offers low-resistance switching performance for analog voltages up to the supply rails. ON-resistance is low and stays reasonably constant across the full range of operating voltage and current. ON-resistance also stays reasonably constant when exposed to radiation. Break-before-make switching is controlled by 5V digital inputs. The HS-303CEH can operate with ±15V rails. Specifications See SMD 5962-95813 for detailed electrical specifications.

特長

  • Electrically screened to DLA SMD# 5962-95813
  • QML, per MIL-PRF-38535
  • No latch-up, dielectrically isolated device islands
  • Pinout and functionally compatible with the HS-303RH series of analog switches
  • Analog signal range equal to the supply voltage range
  • Low leakage : 150nA (max, post-rad)
  • Low rON : 60Ω (max, post-rad)
  • Low standby supply current : ±150µA (max, post-rad)
  • Radiation assurance
    • High dose rate (50 to 300rad(Si)/s) : 100krad(Si)
    • Low dose rate (0.01rad(Si)/s) : 50krad(Si) (Note 1)
  • Single event effects
    • For LET = 60MeV·cm2/mg at 60° incident angle, <150pC charge transferred to the output of an off switch (based on SOI design calculations)

tune製品選択

製品名 Part Status Pkg. Type Carrier Type MOQ DLA SMD 購入/サンプル
Active 100 5962R9581308V9A
Availability
Active CFP Tray 1
Availability
Active CFP Tray 1 5962R9581308VXC
Availability
Active DIE 5 5962R9581308V9A
Availability

descriptionドキュメント

タイトル language 分類 形式 サイズ 日付
データシート
star HS-303CEH Datasheet データシート PDF 511 KB
アプリケーションノート、ホワイトペーパー
Wafer by Wafer Low Dose Rate Acceptance White Paper ホワイトペーパー PDF 533 KB
AN9867: End of Life Derating: A Necessity or Overkill アプリケーションノート PDF 338 KB
その他資料
Intersil Space Products Brochure カタログ PDF 3.12 MB
R34ZZ0002EU0100: HS303xxH, HS-302AEH Design for Single Event Transients その他資料 PDF 115 KB
PIN19011 - Price Increase for the Listed Renesas Electronics America (REA) Radiation Hardened Space Products Price Increase Notice PDF 360 KB
Standard Microcircuit Drawing 5962-95813 (HS-307RH, HS-303AEH, HS-303ARH, HS-303BEH, HS-303BRH, HS-303CEH, HS-303RH, HS-390RH) その他資料 0 KB
HS-303CEH Neutron Test Report レポート PDF 305 KB
Intersil Commercial Lab Services カタログ PDF 364 KB

printニュース&各種リソース

分類 日付 昇順で並び替え
Low Dose Rate Acceptance Testing 基本ページ 2020年3月25日
Standard Data Package 基本ページ 2020年3月19日
Rad Hard SMD Test Flow 基本ページ 2020年3月19日
Rad Hard Test Reports 基本ページ 2020年3月19日