The ISL72814SEHEV1Z evaluation board features the ISL72814SEH 16-channel driver circuit IC. The IC is a radiation hardened, high-voltage, high-current, 16-channel driver circuit with an integrated decoder for driving and selecting between a bank of relays, waveguide and coaxial switches in space applications. The ISL72814SEHEV1Z is fabricated using the Renesas proprietary PR40 silicon-on-insulator process (SOI) technology to mitigate single-event effects. It integrates 16 current drivers that feature high-voltage (42V), high-current (700mA) open-emitter positive-negative-positive (PNP) and common collector output stage.

To further reduce solution size, the ISL72814SEH integrates a 4-bit, 16-channel decoder with Enable. This conveniently allows you to select 1 of 16 available driver channels or disable all channels. The inputs to the decoder are TTL and CMOS compatible, allowing an easy interface to FPGAs and microprocessors.

The ISL7x814SEH devices operate across the military temperature range from -55 °C to +125 °C and are available in a 28-lead hermetically sealed ceramic dual flatpack (CDFP) package or die.

特性

  • Toggle switches for easy control of logic pins
  • LED circuitry for quick functional testing
  • Convenient test points and connections for test equipment
  • Banana jacks for power and ground connections and turret connectors for CH0 - CH15 channel connections

应用

  • RF waveguide and coaxial switches
  • Relays
  • Line drivers
  • Logic buffers
  • Lamp drivers

description文档

文档标题 language 类型 文档格式 文件大小 日期
数据手册与勘误表
ISL72814SEH, ISL73814SEH Datasheet Rev.1.00 数据手册 PDF 787 KB
使用指南与说明
star ISL72814SEHEV1Z User's Manual Rev.1.00 手册 - 开发工具 PDF 681 KB
其他
ISL72814SEH, ISL73814SEH Total Dose Test Report 报告 PDF 357 KB
ISL7x814SEH SEE Test Report 报告 PDF 574 KB

file_download下载

文档标题 language 类型 文档格式 文件大小 日期
模型
ISL72814SEH PSPICE Model Model - Other ZIP 86 KB
Hardware
ISL72814SEHEV1Z Design Files PCB设计文档 ZIP 388 KB

print新闻及更多资源

类型 日期 升序排列
Low Dose Rate Acceptance Testing 基本页面 2020年3月26日
Standard Data Package 基本页面 2020年3月20日
Rad Hard SMD Test Flow 基本页面 2020年3月20日
Rad Hard Test Reports 基本页面 2020年3月20日