The ISL72814SEH and ISL73814SEH are radiation hardened high-voltage, high-current, driver circuit ICs fabricated using the Renesas proprietary PR40 Silicon-on-Insulator (SOI) process technology to mitigate single-event effects. The devices integrate 16 driver channels that feature a high-voltage (42V), high-current (700mA) open-emitter PNP output stage. To further reduce solution size, the ISL72814SEH and ISL73814SEH integrate a 4-bit, 16-channel decoder with Enable. This conveniently allows you to select 1 of 16 available driver channels or disable all channels. The inputs to the decoder are TTL and CMOS compatible, allowing an easy interface to FPGAs and microprocessors. The ISL7x814SEH devices operate across the military temperature range from -55 °C to +125 °C and are available in a 28 lead hermetically sealed Ceramic Dual Flatpack (CDFP) package or die.

特性

  • Electrically screened to DLA SMD 5962-18221
  • Integrated 4-bit to 16-channel decoder
  • High current outputs: 700mA
  • High voltage outputs: 42V
  • Ultra-low saturation voltage: 1.35V maximum at 500mA
  • Internal clamping diodes for inductive loads
  • Wide operating VCC supply range 3V to 13.2V
  • Full military temperature range operation
    • TA = -55 °C to +125 °C
    • TJ = -55 °C to +150 °C
  • Radiation acceptance testing - ISL72814SEH
    • HDR (50-300rad(Si)/s): 100krad(Si)
    • LDR (0.01rad(Si)/s): 75krad(Si)
  • Radiation acceptance testing - ISL73814SEH - LDR (0.01rad(Si)/s): 75krad(Si)
  • SEE hardness (see SEE report for details) - No SEB/SEL LETTH, VCH = 34V: 86MeV•cm2/mg

description文档

文档标题 language 类型 文档格式 文件大小 日期
数据手册与勘误表
star ISL72814SEH, ISL73814SEH Datasheet Rev.1.00 数据手册 PDF 787 KB
应用指南 & 白皮书
Reduce Size, Weight and Power of Telecommunication Payload and Satellite Command/Telemetry Subsystems 日本語 白皮书 PDF 340 KB
Wafer by Wafer Low Dose Rate Acceptance White Paper 白皮书 PDF 533 KB
AN9867: End of Life Derating: A Necessity or Overkill 应用文档 PDF 338 KB
其他
Intersil Space Products Brochure 手册 PDF 3.16 MB
Standard Microcircuit Drawing 5962-18221 (ISL72814SEH, ISL73814SEH) 其他 0 KB
ISL72814SEH, ISL73814SEH Total Dose Test Report 报告 PDF 357 KB
ISL7x814SEH SEE Test Report 报告 PDF 574 KB

file_download下载

文档标题 language 类型 文档格式 文件大小 日期
模型
ISL72814SEH PSPICE Model Model - Other ZIP 86 KB

memory开发板与套件

器件号 文档标题 类型 Company
ISL72814SEHEV1Z Radiation Hardened, High-Voltage, High-Current, 16-Channel Driver Circuit with Integrated Decoder Evaluation Board 评估 Renesas

print新闻及更多资源

类型 日期 升序排列
Low Dose Rate Acceptance Testing 基本页面 2020年3月26日
Standard Data Package 基本页面 2020年3月20日
Rad Hard SMD Test Flow 基本页面 2020年3月20日
Rad Hard Test Reports 基本页面 2020年3月20日