The ISL28134SOICEVAL1Z evaluation board is designed to evaluate the performance of the ISL28134 low noise chopper stabilized op amp. The evaluation board contains the circuitry needed to evaluate the high performance of the ISL28134 amplifier. The ISL28134 chopper stabilized rail-to-rail input/output (RRIO) amplifier features a low 2.5µV maximum VOS and 15nV/°C drift over-temperature. The amplifier has no 1/f noise corner down to 0.1Hz with a 1kHz voltage noise density of 10nV/√Hz. The high open loop gain of 174dB allows a high gain single-stage DC amplifier that can operate from a 3V single cell battery while consuming 700µA of current. The ISL28134SOICEVAL1Z evaluation board can be configured as a precision high-gain (G = 1,000V/V) differential amplifier to demonstrate the level of performance possible with this amplifier.
- Rail-to-rail inputs and outputs
- No 1/f noise corner down to 0.1Hz
- Low offset voltage: 2.5μV, max
- Superb offset drift: 15nV/°C, max
- Single supply: 2.25V to 6.0V
- Dual supply: ±1.125V to ±3.0V
- Low ICC: 675μA, typ.
- Wide bandwidth: 3.5MHz
- Operating temperature range
- Industrial: -40 °C to +85 °C
- Full industrial: -40 °C to +125 °C
- Medical instrumentation
- Sensor gain amps
- Precision low drift, low frequency ADC drivers
- Precision voltage reference buffers
- Thermopile, thermocouple, and other temperature sensors front-end amplifiers
- Inertial sensors
- Process control systems
- Weight scales and strain gauge sensors
Disclaimer: THIS MATERIAL IS PROVIDED “AS-IS” FOR EVALUATION PURPOSES ONLY. RENESAS ELECTRONICS CORPORATION AND ITS SUBSIDIARIES (collectively, “Renesas”) DISCLAIM ALL WARRANTIES, INCLUDING WITHOUT LIMITATION, FITNESS FOR A PARTICULAR PURPOSE AND MERCHANTABILITY. Renesas provides evaluation platforms and design proposals to help our customers to develop products. However, factors beyond Renesas' control, including without limitation, component variations, temperature changes and PCB layout, could significantly affect the product performance. It is the user’s responsibility to verify the actual circuit performance.