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Features

  • 240mOhm, 700V GaN Device in PQFN 5x6 performance package
  • JEDEC-qualified GaN technology
  • Dynamic RDS(on)eff production tested
  • Robust design, defined by:
    • 800V transient over-voltage capability
    • Operation with E-mode Gate drivers without the need for Zener protection
    • 2kV HBM ESD rating
  • Low QRR
  • Reduced crossover loss
  • Achieves increased efficiency in both hard-switched and soft-switched circuits, enabling:
    • Increased power density
    • Reduced system size and weight
    • Overall reduction in system cost

Description

The TP70H300G4JSGB 700V 240mΩ Gallium Nitride (GaN) FET, housed in a 5x6 PQFN performance package, is a normally-off device built on Renesas' Gen IV SuperGaN® platform. It integrates a high-voltage GaN HEMT with an optimized low-voltage silicon MOSFET, achieving over 2kV HBM ESD rating, to deliver superior performance, standard drive compatibility, ease of adoption, and enhanced reliability.

Parameters

Attributes Value
Qualification Level Standard
Vds min (V) 700
V(TR)DSS max (V) 800
RDSON (Typ) (mΩ) 240
RDSON (max) (mΩ) 312
Vth typ (V) 2
Id max @ 25°C (A) 8
Qg typ (nC) 5.4
Qoss (nC) 17
Ron * Qoss (FOM) 4080
Ciss (Typical) (pF) 487
Coss (Typical) (pF) 16.3
trr (Typical) (nS) 29
Mounting Type Surface Mount
Temp. Range (°C) -55 to +150°C

Package Options

Pkg. Type
PQFN56

Applications

  • Consumer
  • Power adapters
  • Low power SMPS
  • Lighting
  • POE Power

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