The Intersil HCS154MS is a Radiation Hardened 4 to 16 line Decoder/Demultiplexer with two enable inputs. A high on either enable input forces the output to a high state. The Demultiplexing function is performed by using the four input lines A0 to A3 to select the desired output states. The HCS154MS utilizes advanced CMOS/SOS technology to achieve high-speed operation. This device is a member of radiation hardened, high-speed, CMOS/SOS Logic Family. The HCS154MS is supplied in a 24 lead Ceramic flatpack (K suffix) or a SBDIP Package (D suffix).

特性

  • 3 Micron Radiation Hardened SOS CMOS
  • Total Dose 200k RAD (Si)
  • SEP Effective LET No Upsets: >100 MEV-cm2/mg
  • Single Event Upset (SEU) Immunity < 2 x 10-9 Errors/Bit-Day (Typ)
  • Dose Rate Survivability: >1 x 1012 Rads (Si)/s
  • Dose Rate Upset >1010 RAD(Si)/s 20ns Pulse
  • Cosmic Ray Upset Immunity < 2 x 10-9 Errors/Gate Day (Typ)
  • Latch-Up Free Under Any Conditions
  • Military Temperature Range: -55°C to +125°C
  • Significant Power Reduction Compared to LSTTL ICs
  • DC Operating Voltage Range: 4.5V to 5.5V
  • Input Logic Levels
  • VIL = 30% of VCC Max
  • VIH = 70% of VCC Min
  • Input Current Levels Ii ≤ 5µA at VOL, VOH

产品选择

下单器件型号 Part Status Pkg. Type Carrier Type Buy Sample
HCS154DMSR
Active SBDIP Tube
Availability
HCS154KMSR
Active CFP Tray
Availability

文档和下载

文档标题 其他语言 类型 文档格式 文件大小 日期
数据手册与勘误表
HCS154MS Datasheet 数据手册 PDF 569 KB
应用指南 &白皮书
Wafer by Wafer Low Dose Rate Acceptance White Paper 白皮书 PDF 533 KB
AN9867: End of Life Derating: A Necessity or Overkill 应用文档 PDF 338 KB
PCN / PDN
PCN10123 - Alternate Die Attach Material for Assembly of Intersil Hermetic Packaged Products - Intersil Palm Bay, FL. (ISP) 产品变更通告 PDF 230 KB
其他
Intersil Space Products Brochure 手册 PDF 3.14 MB
Standard Microcircuit Drawing 5962-95729 (HCS154MS) 其他 0 KB
Intersil Commercial Lab Services 手册 PDF 364 KB

新闻及更多资源

类型 日期 升序排列
Low Dose Rate Acceptance Testing 基本页面 2020年3月25日
Radiation Tolerant Plastic-Package ICs 基本页面 2020年3月20日
Standard Data Package 基本页面 2020年3月19日
Rad Hard SMD Test Flow 基本页面 2020年3月19日
Rad Hard Test Reports 基本页面 2020年3月19日