The ISL70517SEH is a high performance, differential input, single-ended output instrumentation amplifier designed for precision analog-to-digital applications. It can operate over a supply range of 8V (±4V) to 36V (±18V) and features a differential input voltage range up to ±30V. The output stage has rail-to-rail output drive capability optimized for ADC driver applications. The output stage is powered by separate supplies. This feature enables the output to be driven by the same low voltage supplies powering the ADC, thereby providing protection from high voltage signals and low voltage digital circuits. Its versatility makes it suitable for a variety of general purpose applications. Additional features not found in other instrumentation amplifiers enable high levels of DC precision and excellent AC performance. The gain of the ISL70517SEH can be programmed from 0. 1 to 10, 000 via two external resistors, RIN and RFB. The gain accuracy is determined by the matching of RIN and RFB. The gain resistors have Kelvin sensing, which removes gain error due to PC trace resistance. The input and output stages have individual power supply pins, which enable input signals riding on a high, common-mode voltage to be level-shifted to a low voltage device, such as an A/D converter. The rail-to-rail output stage can be powered from the same supplies as the ADC, which preserves the ADC maximum input dynamic range and eliminates ADC input overdrive. The ISL70517SEH is offered in a 24 Ld ceramic flatpack package with an operating temperature range of -55°C to +125°C.

特性

  • Rail-to-rail single-ended output ADC driver
  • Low input offset: 30μV
  • Input bias current: 0.2nA
  • Excellent CMRR and PSRR: 120dB
  • Wide operating voltage range: ±4V to ±18V
  • Closed loop -3dB BW 0.3MHz (AV = 1k) to 5.5MHz (AV = 0.1)
  • Operating temperature range: -55°C to +125°C
  • Electrically screened to DLA 5962-15246
  • Acceptance tested to 75krad(Si) (LDR) wafer-by-wafer
  • Radiation tolerance
  • Low dose rate (0.01rad(Si)/s): 75krad(Si)
  • SEB LETTH (VS = ±18V): 60MeV•cm2/mg

产品选择

器件号 Part Status Pkg. Type Carrier Type MOQ Buy Sample
Active CFP Tray 1
Availability
Active CFP Tray 1
Availability
Active 100
Availability

文档和下载

文档标题 language 类型 文档格式 文件大小 日期
数据手册与勘误表
ISL70517SEH Datasheet 数据手册 PDF 1.41 MB
使用指南与说明
ISL70517SEHEV1Z User Guide 手册 PDF 501 KB
应用指南 &白皮书
Examining a New In-Amp Architecture for Communication Satellites 白皮书 PDF 684 KB
Wafer by Wafer Low Dose Rate Acceptance White Paper 白皮书 PDF 533 KB
AN9867: End of Life Derating: A Necessity or Overkill 应用文档 PDF 338 KB
下载
isl70517seh-spice 模型 ZIP 6 KB
ISL70517SEHEV1Z Design Files Design File ZIP 393 KB
其他
Intersil Space Products Brochure 手册 PDF 3.14 MB
ISL70517SEH, ISL70617SEH Neutron Test Report 报告 PDF 432 KB
Standard Microcircuit Drawing 5962-15246 (ISL70517SEH, ISL70617SEH) 其他 0 KB
ISL70517SEH Total Dose Test Report 报告 PDF 523 KB
Intersil Commercial Lab Services 手册 PDF 364 KB
ISL70617SEH, ISL70517SEH SEE Test Report 报告 PDF 630 KB

开发板与套件

器件号 文档标题 类型 Company
ISL70517SEHEV1Z 36V Radiation Hardened Precision Instrumentation Amplifier Evaluation Board 评估 Renesas
ISL70617SEHEV1Z 36V Radiation Hardened Precision Instrumentation Amplifier Evaluation Board 评估 Renesas

新闻及更多资源

类型 日期 升序排列
Low Dose Rate Acceptance Testing 基本页面 2020年3月25日
Radiation Tolerant Plastic-Package ICs 基本页面 2020年3月20日
Standard Data Package 基本页面 2020年3月19日
Rad Hard SMD Test Flow 基本页面 2020年3月19日
Rad Hard Test Reports 基本页面 2020年3月19日