The ISL75051ASEH and ISL73051ASEH are radiation hardened low-voltage, high-current, single-output LDOs specified for up to 3.0A of continuous output current. These devices operate across an input voltage range of 2.2V to 6.0V and can provide output voltages of 0.8V to 5.0V adjustable, based on the resistor divider setting. Dropout voltages as low as 65mV can be achieved using the device. The OCP pin allows the short-circuit output current limit threshold to be programmed by a resistor from the OCP pin to GND. The OCP setting range is 0.5A minimum to 8.5A maximum. The resistor sets the constant current threshold for the output under fault conditions. The thermal shutdown disables the output if the device temperature exceeds the specified value. It subsequently enters an ON/OFF cycle until the fault is removed. The ENABLE feature allows the part to be placed into a low current shutdown mode that typically draws about 10µA. These devices are optimized for fast transient response and Single Event Effects (SEE). This reduces the magnitude of Single Event Transients (SET) seen on the output. Additional protection diodes and filters are not needed. These devices are stable with tantalum capacitors as low as 47µF and provide excellent regulation all the way from no load to full load. Programmable soft-start allows the user to program the inrush current by using the decoupling capacitor value on the BYP pin.


  • DLA SMD 5962-11212
  • Output current up to 3.0A at TJ = +150°C
  • Output accuracy ±1.5% over MIL temperature range
  • Ultra low dropout:
    • 65mV (typical) dropout at 1.0A
    • 225mV (typical) dropout at 3.0A
  • SET mitigation with no added filtering/diodes
  • Input supply range: 2.2V to 6.0V
  • Fast load transient response
  • Shutdown current of 10µA (typical)
  • Output adjustable using external resistors
  • PSRR 66dB (typical) at 1kHz
  • Enable and PGood features
  • Programmable soft-start/inrush current limiting
  • Over-temp shutdown and programmable OCP limits
  • Stable with 47µF min tantalum capacitor
  • Radiation hardness (ISL75051ASEH only)
    • High dose rate (50 - 300rad(Si)/s): 100krad(Si)
    • Low dose rate (≤0.01rad(Si)/s): 50krad(Si)
  • Radiation hardness (ISL73051ASEH only)
    • Low dose rate (≤0.01rad(Si)/s): 50krad(Si)


文档标题 language 类型 文档格式 文件大小 日期
star ISL75051ASEH, ISL73051ASEH Datasheet 数据手册 PDF 1.18 MB
ISL75051ASEHEV1Z User Guide 手册 - 开发工具 PDF 809 KB
应用指南 & 白皮书
Wafer by Wafer Low Dose Rate Acceptance White Paper 白皮书 PDF 533 KB
AN9867: End of Life Derating: A Necessity or Overkill 应用文档 PDF 338 KB
PCN18008 - Part Marking Change for the Listed QML Products 产品变更通告 PDF 846 KB
Intersil Space Products Brochure 手册 PDF 3.16 MB
ISL75051SEH, ISL75051ASEH and ISL73051ASEH Neutron Test Report 报告 PDF 328 KB
PIN19011 - Price Increase for the Listed Renesas Electronics America (REA) Radiation Hardened Space Products Price Increase Notice PDF 360 KB
Standard Microcircuit Drawing 5962-11212 (ISL75051SEH, ISL75051SRH, ISL75051ASEH, ISL73051ASEH) 其他 0 KB
ISL75051ASEH and ISL73051ASEH Total Dose Test Report 报告 PDF 874 KB
ISL75051ASEH, ISL73051ASEH SEE Test Report 报告 PDF 790 KB
Intersil Commercial Lab Services 手册 PDF 364 KB
ISL75051SEH, ISL75051ASEH and ISL73051ASEH Neutron Test Report with Boeing 报告 PDF 308 KB
TB499: PCB Thermal Land Design for Ceramic Packages with Bottom Metal or Heat Sinks 技术摘要 PDF 410 KB


文档标题 language 类型 文档格式 文件大小 日期
ISL75051ASEH and ISL73051ASEH ROCP Calculator Software & Tools - Other XLSX 97 KB
ISL75051SRH-ISL73051ASEH PSPICE Model Model - Other ZIP 7 KB
ISL75051ASEHEV1Z Design Files PCB设计文档 ZIP 1.11 MB


器件号 文档标题 类型 Company
ISL75051ASEHEV1Z 3A, Radiation Hardened, Positive, Ultra-Low Dropout Regulator Evaluation Board 评估 Renesas
ISLRTG4DEMO1Z Renesas Radiation Hardened Power Solution for RTG4 FPGA 演示 Renesas


类型 日期 升序排列
Low Dose Rate Acceptance Testing 基本页面 2020年3月26日
Standard Data Package 基本页面 2020年3月20日
Rad Hard SMD Test Flow 基本页面 2020年3月20日
Rad Hard Test Reports 基本页面 2020年3月20日