The HS-565BEH is a fast, radiation hardened 12-bit current output, digital-to-analog converter. This part replaced the HS-565ARH, which is no longer available. The monolithic chip include a precision voltage reference, thin-film R-2R ladder, reference control amplifier, and twelve high-speed bipolar current switches. The Intersil Dielectric Isolation process provides latch-up free operation while minimizing stray capacitance and leakage currents, to produce an excellent combination of speed and accuracy. Also, ground currents are minimized to produce a low and constant current through the ground terminal, which reduces error due to code-dependent ground currents. The HS-565BEH die are laser trimmed for a maximum integral nonlinearity error of ±0. 25 LSB at +25 °C. In addition, the low noise buried zener reference is trimmed both for absolute value and minimum temperature coefficient. Specifications for Rad Hard QML devices are controlled by the Defense Supply Center in Columbus (DSCC). The SMD numbers listed here must be used when ordering. Detailed Electrical Specifications for these devices are contained in SMD 5962-96755.

特性

  • Electrically screened to SMD # 5962-96755
  • QML qualified per MIL-PRF-38535 requirements
  • Total dose: 100krad (Si) (Max)
  • DAC and reference on a single chip
  • Pin compatible with AD-565A and HI-565A
  • Very high speed: Settles to 0.50 LSB in 500ns Max
  • Monotonicity guaranteed over temperature
  • 0.50 LSB Max nonlinearity guaranteed over temperature
  • Low gain drift (Max., DAC plus reference): 50ppm/°C
  • ±0.75 LSB accuracy guaranteed over temperature (±0.125 LSB Typical at +25 °C)

应用

  • High-speed A/D converters
  • Precision instrumentation
  • Signal reconstruction

tune产品选择

器件号 Part Status Pkg. Type Carrier Type MOQ DLA SMD Buy Sample
Active 100 5962R9675503V9A
Availability
Active SBDIP Tube 1 5962R9675503VJC
Availability
Active CFP Tray 1 5962R9675503VXC
Availability

description文档

文档标题 language 类型 文档格式 文件大小 日期
数据手册与勘误表
star HS-565BRH, HS-565BEH Datasheet 数据手册 PDF 514 KB
应用指南 & 白皮书
Wafer by Wafer Low Dose Rate Acceptance White Paper 白皮书 PDF 533 KB
AN9867: End of Life Derating: A Necessity or Overkill 应用文档 PDF 338 KB
AN9654: Use of Life Tested Parts 应用文档 PDF 224 KB
其他
Intersil Space Products Brochure 手册 PDF 3.14 MB
PIN19011 - Price Increase for the Listed Renesas Electronics America (REA) Radiation Hardened Space Products Price Increase Notice PDF 360 KB
Standard Microcircuit Drawing 5962-96755 (HS-565ARH, HS-565BEH, HS-565BRH) 其他 0 KB
Intersil Commercial Lab Services 手册 PDF 364 KB
HS-565BRH Total Dose Test Report 报告 PDF 276 KB

print新闻及更多资源

类型 日期 升序排列
Low Dose Rate Acceptance Testing 基本页面 2020年3月25日
Standard Data Package 基本页面 2020年3月19日
Rad Hard SMD Test Flow 基本页面 2020年3月19日
Rad Hard Test Reports 基本页面 2020年3月19日