The ISL70517SEH is a high performance, differential input, single-ended output instrumentation amplifier designed for precision analog-to-digital applications. It can operate over a supply range of 8V (±4V) to 36V (±18V) and features a differential input voltage range up to ±30V. The output stage has rail-to-rail output drive capability optimized for ADC driver applications. The output stage is powered by separate supplies. This feature enables the output to be driven by the same low voltage supplies powering the ADC, thereby providing protection from high voltage signals and low voltage digital circuits. Its versatility makes it suitable for a variety of general purpose applications. Additional features not found in other instrumentation amplifiers enable high levels of DC precision and excellent AC performance. The gain of the ISL70517SEH can be programmed from 0. 1 to 10, 000 via two external resistors, RIN and RFB. The gain accuracy is determined by the matching of RIN and RFB. The gain resistors have Kelvin sensing, which removes gain error due to PC trace resistance. The input and output stages have individual power supply pins, which enable input signals riding on a high, common-mode voltage to be level-shifted to a low voltage device, such as an A/D converter. The rail-to-rail output stage can be powered from the same supplies as the ADC, which preserves the ADC maximum input dynamic range and eliminates ADC input overdrive. The ISL70517SEH is offered in a 24 Ld ceramic flatpack package with an operating temperature range of -55°C to +125°C.

特長

  • Rail-to-rail single-ended output ADC driver
  • Low input offset: 30μV
  • Input bias current: 0.2nA
  • Excellent CMRR and PSRR: 120dB
  • Wide operating voltage range: ±4V to ±18V
  • Closed loop -3dB BW 0.3MHz (AV = 1k) to 5.5MHz (AV = 0.1)
  • Operating temperature range: -55°C to +125°C
  • Electrically screened to DLA 5962-15246
  • Acceptance tested to 75krad(Si) (LDR) wafer-by-wafer
  • Radiation tolerance
  • Low dose rate (0.01rad(Si)/s): 75krad(Si)
  • SEB LETTH (VS = ±18V): 60MeV•cm2/mg

製品選択

製品名 Part Status Pkg. Type Carrier Type MOQ 購入/サンプル
Active CFP Tray 1
Availability
Active CFP Tray 1
Availability
Active 100
Availability

ドキュメント&ダウンロード

タイトル language 分類 形式 サイズ 日付
データシート
ISL70517SEH Datasheet データシート PDF 1.41 MB
ユーザーガイド、マニュアル
ISL70517SEHEV1Z User Guide マニュアル PDF 501 KB
アプリケーションノート、ホワイトペーパー
Examining a New In-Amp Architecture for Communication Satellites ホワイトペーパー PDF 684 KB
Wafer by Wafer Low Dose Rate Acceptance White Paper ホワイトペーパー PDF 533 KB
AN9867: End of Life Derating: A Necessity or Overkill アプリケーションノート PDF 338 KB
ダウンロード
isl70517seh-spice モデル ZIP 6 KB
ISL70517SEHEV1Z Design Files 設計ファイル ZIP 393 KB
その他資料
Intersil Space Products Brochure カタログ PDF 3.14 MB
ISL70517SEH, ISL70617SEH Neutron Test Report レポート PDF 432 KB
Standard Microcircuit Drawing 5962-15246 (ISL70517SEH, ISL70617SEH) その他資料 0 KB
ISL70517SEH Total Dose Test Report レポート PDF 523 KB
Intersil Commercial Lab Services カタログ PDF 364 KB
ISL70617SEH, ISL70517SEH SEE Test Report レポート PDF 630 KB

ボード&キット

製品名 タイトル 分類 Company
ISL70517SEHEV1Z 36V Radiation Hardened Precision Instrumentation Amplifier Evaluation Board 評価 Renesas
ISL70617SEHEV1Z 36V Radiation Hardened Precision Instrumentation Amplifier Evaluation Board 評価 Renesas

ニュース&各種リソース

分類 日付 昇順で並び替え
Low Dose Rate Acceptance Testing 基本ページ 2020年3月25日
Radiation Tolerant Plastic-Package ICs 基本ページ 2020年3月20日
Standard Data Package 基本ページ 2020年3月19日
Rad Hard SMD Test Flow 基本ページ 2020年3月19日
Rad Hard Test Reports 基本ページ 2020年3月19日