ISL70023SEH

100V, 60A Enhancement Mode GaN Power Transistor

Product Status: Mass Production

OVERVIEW

The ISL70023SEH and ISL73023SEH are 100V N-channel enhancement mode GaN power transistors. These GaN FETs have been characterized for destructive Single Event Effects (SEE) and tested for Total Ionizing Dose (TID) radiation up to 100krad(Si) High Dose Rate (HDR) and 75krad(Si) Low Dose Rate (LDR). Applications for these devices include commercial aerospace, medical, and nuclear power generation.

GaN’s exceptionally high electron mobility and low temperature coefficient allows for very low rDS(ON) , while its lateral device structure and majority carrier diode provide exceptionally low QG and zero QRR . The end result is a device that can operate at a higher switching frequency with more efficiency while reducing the overall solution size.

By combining the exceptional performance of the GaN FET in a hermetically sealed Surface Mount Device (SMD) package with manufacturing in a MIL-PRF-38535 like flow results in best-in-class power transistors that are ideally suited for high reliability applications.

KEY FEATURES

  • Very low rDS(ON) 5mΩ (typical)
  • Ultra low total gate charge 14nC (typical)
  • SEE tolerance (VDS = 100V, VGS = 0V)
  • Characterized at LET 86MeV•cm2/mg
  • Radiation hardness assurance testing (lot-by-lot)
  • High dose rate (50-300rad(Si)/s): 100krad(Si)
  • Low dose rate (0.01rad(Si)/s): 75krad(Si)
  • Ultra small hermetically sealed 4 Ld Surface Mount Device (SMD) package
  • Package area: 42mm2
  • Full military-temperature range operation
  • TA = -55°C to +125°C
  • TJ = -55°C to +150°C

PARAMETRICS

Parameters
ISL70023SEH
Basic Information
Production Status
Mass Production
Class
Mod-Class V, /PROTO
High Dose Rate (HDR) krad (Si)
100
Low Dose Rate (ELDRS) krad (Si)
75
SEL (MeV/mg/cm2)
86
Qualification Level
Modified Class V
Temperature Range
-55 to +125

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