The Intersil HCTS164MS is a radiation hardened 8-bit serial-in/parallel-out shift register with asynchronous reset. The HCTS164MS utilizes advanced CMOS/SOS technology to achieve high-speed operation. This device is a member of the radiation hardened, high-speed, CMOS/SOS logic family.

特性

  • 3 micron radiation hardened CMOS SOS
  • Total dose 200K RAD (Si)
  • Dose rate survivability >1012 RAD (Si)/s (20ns pulse)
  • Dose rate upset >1010 RAD (Si)/s (20ns pulse)
  • Single event ray upset rate <2 x 10-9 errors/bit day (Typ)
  • LET threshold >100 MEV-cm2/mg
  • Latch-up free under any conditions
  • Military temperature range: -55 °C to +125 °C
  • Significant power reduction compared to LSTTL ICs
  • DC operating voltage range: 4.5V to 5.5V
  • Input logic levels
  • VIL = 0.8 VCC (Max)
  • VIH = VCC/2 (Min)
  • Input current levels Ii = 5µA at VOL, VOH

description文档

文档标题 language 类型 文档格式 文件大小 日期
star HCTS164MS Datasheet 数据手册 PDF 434 KB
AN9867: End of Life Derating: A Necessity or Overkill 应用文档 PDF 338 KB
Intersil Space Products Brochure 手册 PDF 3.16 MB
Intersil Commercial Lab Services 手册 PDF 364 KB
Standard Microcircuit Drawing 5962-95663 (HCS164MS, HCTS164MS) 其他 0 KB
PIN19011 - Price Increase for the Listed Renesas Electronics America (REA) Radiation Hardened Space Products Price Increase Notice PDF 360 KB
PA11003 - Packing Method Change for Intersil TO-xx Metal Can and Flat Pack Packaged Products Product Advisory PDF 499 KB
PCN10123 - Alternate Die Attach Material for Assembly of Intersil Hermetic Packaged Products - Intersil Palm Bay, FL. (ISP) 产品变更通告 PDF 230 KB
Wafer by Wafer Low Dose Rate Acceptance White Paper 白皮书 PDF 533 KB

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类型 日期 升序排列
Low Dose Rate Acceptance Testing 基本页面 2020年3月26日
Standard Data Package 基本页面 2020年3月20日
Rad Hard SMD Test Flow 基本页面 2020年3月20日
Rad Hard Test Reports 基本页面 2020年3月20日