The Intersil HCTS164MS is a radiation hardened 8-bit serial-in/parallel-out shift register with asynchronous reset. The HCTS164MS utilizes advanced CMOS/SOS technology to achieve high-speed operation. This device is a member of the radiation hardened, high-speed, CMOS/SOS logic family.


  • 3 micron radiation hardened CMOS SOS
  • Total dose 200K RAD (Si)
  • Dose rate survivability >1012 RAD (Si)/s (20ns pulse)
  • Dose rate upset >1010 RAD (Si)/s (20ns pulse)
  • Single event ray upset rate <2 x 10-9 errors/bit day (Typ)
  • LET threshold >100 MEV-cm2/mg
  • Latch-up free under any conditions
  • Military temperature range: -55 °C to +125 °C
  • Significant power reduction compared to LSTTL ICs
  • DC operating voltage range: 4.5V to 5.5V
  • Input logic levels
  • VIL = 0.8 VCC (Max)
  • VIH = VCC/2 (Min)
  • Input current levels Ii = 5µA at VOL, VOH


タイトル language 分類 形式 サイズ 日付
star HCTS164MS Datasheet
PDF 434 KB
AN9867: End of Life Derating: A Necessity or Overkill
PDF 338 KB
Intersil Space Products Brochure
PDF 3.16 MB
Intersil Commercial Lab Services
PDF 364 KB
Standard Microcircuit Drawing 5962-95663 (HCS164MS, HCTS164MS)
0 KB
PIN19011 - Price Increase for the Listed Renesas Electronics America (REA) Radiation Hardened Space Products
Price Increase Notice
PDF 360 KB
PA11003 - Packing Method Change for Intersil TO-xx Metal Can and Flat Pack Packaged Products
Product Advisory
PDF 499 KB
PCN10123 - Alternate Die Attach Material for Assembly of Intersil Hermetic Packaged Products - Intersil Palm Bay, FL. (ISP)
PDF 230 KB
Wafer by Wafer Low Dose Rate Acceptance White Paper
PDF 533 KB



分類 日付 昇順で並び替え
Low Dose Rate Acceptance Testing 基本ページ 2020年3月26日
Standard Data Package 基本ページ 2020年3月20日
Rad Hard SMD Test Flow 基本ページ 2020年3月20日
Rad Hard Test Reports 基本ページ 2020年3月20日