Failure Mechanism Based Stress Test Qualification for Discrete Semiconductors in Automotive Applications
AEC-Q101 is a failure mechanism based stress test qualification for discrete semiconductors in automotive applications. The Automotive Electronics Council (AEC) is based in the United States and was originally established by three major automotive manufacturers for the purpose of establishing common part-qualification and quality-system standards. AEC-Q101 is an industry standard specification that outlines the recommended new product and major change qualification requirements and procedures for discrete semiconductors in automotive applications.
Renesas offers AEC-Q101 qualified products for automotive applications. Not all Renesas products are designed nor intended for use in automotive applications. Products that are qualified for and meet AEC-Q101 requirements are clearly designated in their datasheet.